掠射角 的英文怎麼說
中文拼音 [lüèshèjiǎo]
掠射角
英文
[物理學] glancing angle; grazing angle掠射角技術 glancing- angle technique-
In the theoretical description of grazing emission fluorescence, the mode of fluorescence intensity emitted from layered materials dependence of grazing angle is established by applying asymptotic approximations to double fourier integrals, and the theoretic calculation formula of fluorescence intensity from a thin layer is derived. by the derived expressions, the theoretic simulation curves of several thin layers on si substrate are calculated. in the experimental setup, the requirement of construction of the setup and some important parameters are brought forward
最後，利用平穩位相方法建立了掠出射情況下薄層樣品產生的熒光強度和掠出射角的對應關系數學模型，推導了薄層樣品熒光強度理論計算公式，並以此為依據模擬計算得出了cr 、 fe 、 ti和ni等幾種以si作基底的單層薄膜樣品的熒光強度隨掠出射角變化的理論曲線。This demonstrates the feasibility of using grazing emission x - ray fluorescence spectroscopy as a method of studying the thin layer ' s characteristics, such as composition and thickiness etc. with the intimately combining of theoretical, set - up and experimental research, the study on the analysis techniques of grazing emission x - ray fluorescence is developed, and the first set of grazing emission x - ray fluorescence setup is established. at the same time, the angular dependence of the fluorescence intensity with different thickness layer is measured. all the work in this thesis provides the basis for the further researches
本論文採用理論、裝置和實驗研究密切結合的方式，開展了掠射x射線熒光分析技術研究工作，在國內建立了首臺掠出射x射線熒光光譜分析裝置，並對不同厚度單層和雙層薄膜樣品在掠出射條件下產生的熒光光強與掠射角的對應博士學位論文:掠射x射線熒光分析技術研究關系進行了實驗測定。The surface morphologies of thin films were observed by using scan electron microscope ( sem ) and atomic force microscope ( afm ). based on grazing incidence x - ray diffraction ( gixrd ) equipment, we find that residual stress exist in magnetron sputtering plct film, in addition, the ferroelectric properties of plct thin films were measured by radiant premier lc type multifunctional ferroelectric properties test system
利用廣角x射線衍射技術對不同濺射工藝下plct薄膜的相結構進行了研究;採用掃描電子顯微鏡（ sem ）和原子力顯微鏡（ afm ）分別觀察了薄膜的表面形貌;利用掠入射x射線衍射（ gixrd ）測量了薄膜的殘余應力。The phase structure of different cu - fe thin films were studied by using grazing incidence x - ray analysis ( gixa ). the texture and residual stress of different cu - fe thin films were measured by scan of x - ray diffraction ( xrd ) and 2 scan with different. the thicknesses of different thin films were characterized by means of small angle x - ray scattering ( saxs ) technique. by using atomic force microscope ( afm ) measured surface roughness of thin films. the component of different thin film was characterized by energy disperse spectrum ( eds ) and x - ray fluorescence ( xrf ). the magnetic properties of cu - fe thin films were measured by means of vibrating sample magnetometer ( vsm ). in addition, the giant magnetoresistance ( gmr ) effects of different films were also measured. the original resistance of the film fabricated by a direction - current magnetron sputtering system is directly affected by bias voltage
利用掠入射x射線分析（ gixa ）技術對不同cu - fe薄膜的相結構進行了研究;利用xrd掃描及不同角度的2掃描對薄膜進行了結晶織構及殘余應力分析;運用小角x射線散射（ saxs ）技術測量了薄膜的厚度;採用原子力顯微鏡（ afm ）觀察了薄膜的表面形貌;運用能量損失譜（ eds ）及x射線熒光光譜（ xrf ）對薄膜進行了成分標定;使用振動樣品磁強計測量了不同cu - fe過飽和固溶體薄膜的磁性能;最後利用自製的磁阻性能測試設備測量了真空磁場熱處理前後不同薄膜的巨磁阻值。In experiment, the alignment and calibration to the monochromator were described firstly. then, a gas - flow proportional counter and the multi - channel analyzer ( mca ) are calibrated by the radio isotope source 55fe, and the dead time, counting rate plateau and x - ray linearity have been measured
最後利用同步輻射光源做激發源，在掠出射方式下研究了si片上不同厚度單層cr膜和雙層fe v膜樣品產生的熒光光強和掠出射角的對應關系。The experimental results demonstrate that the intensity of grazing emission x - ray fluorescence becomes more intensive with the higher anode voltage of x - ray tube or the bigger grazing emission angle, which provide a possibility for accelerating the process of grazing emission x - ray fluorescence analysis
實驗結果表明，掠出射x射線熒光強度隨x射線管陽極高壓的增大而增大；隨掠出射角的增大而增大。這為提高掠出射x射線熒光分析的速度提供了可能。分享友人