放射光譜學 的英文怎麼說

中文拼音 [fàngshèguāngpǔxué]
放射光譜學 英文
emission spectroscopy
  • 放 : releaseset freelet go
  • 射 : Ⅰ動詞1 （用推力或彈力送出） shoot; fire 2 （液體受到壓力迅速擠出） discharge in a jet 3 （放出） ...
  • 光 : Ⅰ名詞1 （照耀在物體上、使人能看見物體的一種物質） light; ray 2 （景物） scenery 3 （光彩; 榮譽） ...
  • 譜 : Ⅰ名詞[書面語]1 （按類別或系統編成的書或冊子等） table; chart; register 2 （指導練習的格式或圖形）...
  • 學 : Ⅰ動詞1 （學習） study; learn 2 （模仿） imitate; mimic Ⅱ名詞1 （學問） learning; knowledge 2 （學...
  • 放射 : radiate; emit; blas; radiation; emission; shooting; shedding; abjection; emanation; effluence
  1. Test method for the radiochemical determination of americium - 241 in soil by alpha spectrometry

    光譜法對土壤中鎇- 241進行放射化學測定的試驗方法
  2. Surface chemical analysis - glow discharge optical emission spectrometry gd - ose - introduction to use

    表面化學分析-輝光放電發射光譜方法通則
  3. Surface chemical analysis - glow discharge optical emission spectrometry gd - oes - introduction to use

    表面化學分析.輝光放電發射光譜.使用介紹
  4. Gd - oes. surface chemical analysis - glow discharge optical emission spectrometry gd - oes - introduction to use

    表面化學分析.輝光放電發射光譜測定法
  5. ( 3 ) the author applied wavelet analysis in the data processing of airborne radioactive survey, and analyzed the effect of wavelet used in spectrum data processing, line data processing and region data processing. the author had proved that the wavelet used in spectrum data processing can gain more true and more ideal information than traditional data processing method, and can accurately identify information which is beyond main energy windows by practice data. the author considered it is effective to extract abnormal information when the wavelet used in line data processing, and it is effective to eliminate the belt of airborne radioactive survey data when the wavelet used in region data processing

    有效的融合了遙感航測信息，提高了工作效率； （ 2 ）根據光學有關物理性質，製作的模擬反射率圖，囊括了tm數據七個波段的信息，使得圖像質量、地物解析度得到了提高； （ 3 ）在航放數據處理過程中引入了小波分析，系統分析了小波在處理單點數據、測線數據、測區數據的應用效果；用試驗數據證明了小波處理單點數據可得到較傳統數據處理方法更為真實、理想的譜數據，能準確的識別主能量窗以外的信息；認為處理線數據，可以提取埋藏於噪音中的異常信息；處理測區數據，對消除航放數據的條帶有一定的效果。
  6. These instruments can be divided into three categories, chromatographic separation methods including gas chromatography, liquid chromatography and ionic chromatography, spectrometric methods including atomic absorption, ultraviolet / visible absorption, infrared spectrometry, atomic emission spectrometry and fluorescence method, and electroanalytical methods including potentiometry, coulometry and voltammetry methods

    如層析法中的氣相層析、液相層析及離子層析，光譜法中的紫外光可見光光譜法、原子吸收光譜法、紅外線光譜法、螢光光譜法、放射光譜法及拉曼光譜法，及電化學方析方法如電位法、庫倫法及伏安法等。
  7. This sort of membrane has excellent physics and chemical properties. farther studies indicates that this film is a kind of hydrogenated carbon films containing amino groups, it posses the network configuration of diamond - like carbon, the amino - group is in the networks

    通過紅外光譜分析，結合其物理性能和化學傳感特性，對射頻輝光放電制備的正丁胺淀積薄膜的化學組成與微觀結構做了初步分析和研究。
  8. The properties of cn thin films such as their morphology, component, crystal structure and the bonding structure and the relation between those properties and the gas - phase reaction parameters were discussed, showing that the deposition of p - c3n4 thin film is the compete result of various reaction processes in the dynamics balance conditions ; the process of cn films depo sition is diagnosed in situ through the optical emission spectra technique, the effects of experimental parameters on the concentration of the precursors and the gas - phase reactions in the plasma have been obtained ; the main reaction precursors for film deposition identified ; the relation between the characteristics of cn thin films and the reaction process in the plasma is analyzed. the cn thin films deposition under different substrate temperatures in high pressure pe - pld shows that the si atom of the substrate has participated the cn films growth process, based on this the growth mode of cn thin films on the si substrate is proposed. the further experiment of cn thin films deposition on si substrate scratched by diamond as well as covered with fe catalyzer has been attempted, which indicates that changing the dynamics conditions of the surface reaction can alter the growth characteristic of the cn thin films and can enhance obviously the films growth rate

    採用pld技術進行了碳氮化合物薄膜沉積，得到了含氮量為21at的cn薄膜；研究了襯底溫度和反應氣體壓強對薄膜結構特性的影響，給出了cn薄膜中n含量較小、 sp ~ 3鍵合結構成分較少和薄膜中僅含有局域cn晶體的原因；引入脈沖輝光放電等離子體增強pld的氣相反應，給出了提高薄膜晶態sp ~ 3鍵合結構成分和薄膜的含n量可行性途徑；應用pe - cvd技術以ch _ 4 + n _ 2為反應氣體並引入輔助氣體h _ 2 ，得到了含n量為56at的晶態cn薄膜；探討了cn薄膜形貌、成分、晶體結構、價鍵狀態等特性及其與氣體壓強和放電電流的關系，證明了- c _ 3n _ 4薄膜沉積為滿足動力學平衡條件的各種反應過程的競爭結果；採用光學發射譜技術對cn薄膜生長過程進行了實時診斷，得到了實驗參量對等離子體中活性粒子相對濃度和氣相反應過程的影響規律，給出了cn薄膜沉積的主要反應前驅物，揭示了cn薄膜特性和等離子體內反應過程之間的聯系；採用高氣壓pe - pld技術研究了不同襯底溫度條件下cn化合物薄膜的結構特性，揭示了si原子對薄膜生長過程的影響，給出了si基表面碳氮薄膜的生長模式；在金剛石研磨和催化劑fe處理的si襯底上進行cn薄膜沉積，證明了通過控制材料表面動力學條件可以改變碳氮薄膜結構特性，並可顯著提高晶態碳氮材料的生長速率。
  9. The variation of the film composition can be monitored by using the method of spectrum analysis during the film deposition ( for the intensity of the persistent line is proportional to the particle density of the element in the vacuum chamber ). the measurement of the transmission spectrum of the film on a transparent substrate can be used to calculate the film parameters, such as refractive index, extinction coefficient and the thickness of the film. therefore, the combination of the two methods would be helpful to on line monitoring the film constituents and the optical paramenters in the preparation of thin films

    在制備薄膜的過程中，利用光譜分析的方法，以放電光譜特徵譜線強度的變化來反映相應物質成分的變化，以連續光譜光源發出的光透射過薄膜的透射率的變化，來反映薄膜的厚度、折射率、吸收系數等光學參數的變化，從而達到在制膜過程中，對薄膜的成分、厚度等參數進行在線監控的目的
  10. Optical amplifiers - test methods - part 5 - 2 : reflectance parameters ; electrical spectrum analyser method

    光學放大器.試驗方法.第5 - 2部分:反射參數.電頻譜分析儀法
  11. Optical amplifiers - test methods - part 5 - 2 : reflectance parameters - electrical spectrum analyser method iec 61290 - 5 - 2 : 2003 ; german version en 61290 - 5 - 2 : 2004

    光學放大器.試驗方法.第5 - 2部分:反射參數.電頻譜分析
  12. Optical fibre amplifiers - basic specification - test methods for reflectance parameters - reflectance tolerance using an electrical spectrum analyser

    光纖放大器.基本規范.反射參數的試驗方法.用電子學光譜分析儀測定反射公差
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