晶元缺陷 的英文怎麼說

中文拼音 [jīngyuánquēxiàn]
晶元缺陷 英文
chip defect
  • 晶 : Ⅰ形容詞（光亮） brilliant; glittering Ⅱ名詞1. （水晶） quartz; （rock） crystal 2. （晶體） any crystalline substance
  • 缺 : Ⅰ動詞1 （缺乏; 短少） be short of; lack 2 （殘缺） be missing; be incomplete 3 （該到而未到） be ...
  • 陷 : Ⅰ名詞1 （陷阱） pitfall; trap2 （缺點） defect; deficiency Ⅱ動詞1 （掉進） get stuck or bogged do...
  • 缺陷 : defect; fault; faultiness; vitium; lesion; flaw; disorder; imperfection; drawback; blemish
  1. Aimed at the flaw of weak anti - slide function in traditional engineering machine, the thesis puts forward a new auto - anti - slide differential gear system controlled by intel 8751 microcontroller, which adopts the fuzzy logic as its control algorism and the best slide ration ( s ) as system ' s control target

    針對傳統工程機械差速系統存在防滑功能不強的缺陷，提出以intel8751單片機為控制晶元，以最佳滑移率s為控制目標，採用模糊邏輯控制為控制演算法的自動防滑差速系統。
  2. Based the eag - i etchant, a new etchant was developed, with which the etch pit pattern on ( 110 ), ( 111 ) and ( 100 ) faces of czt crystals can emerge immediately and effectually. this pager investigated relation between the ( 110 ) faces of cutting from crystals conveniently and accurately by laser reflex method. by the surface treatment, the nuclear radiation detector was fabricated with ( 110 ) of czt crystal and strong 241am responsibility was observed

    在改變e _ （ ag ）腐蝕液的配方的基礎上，研製了新的腐蝕液，可方便、快速、有效的顯示czt不同晶面的缺陷蝕坑形貌;研究了利用激光正反射法和自然解理的不同（ 110 ）面之間的關系，方便、快速、準確的進行定向切割晶體的方法;採用生長的czt單晶體自然解理的（ 110 ）面，經過表面處理，試制了探測器元件，對24lam有較強的響應。
  3. However, the computation of the g. 723. 1 algorithm is very complex and the single chip cannot provide us with many resources due to the limited buget for every chip, so we have many difficulties to put the g. 723. i algorithm into pratical use

    但該演算法存在計算量和數據存儲量大等固有缺陷，而且實際系統一般都必須重點考慮性能價格比因素，這樣的系統不可能像pc機捉供那麼豐富的資源，所以必須尋找一種運算功能強大而且價格又較合理的晶元才能把g
  4. Aim at the dtc ' s blemish mentioned above and the direction of dtc technique development, the dissertation put great emphasis on the work as follows, with an eye to exalt dtc system function : ( 1 ) a new speed - flux observer of an induction motor is proposed to enhance the accuracy of flux observing, which is an adaptive closed - loop flux observer and different from the traditions. a new adaptive speed - observation - way is deduced out according to the popov ' s stability theories ; ( 2 ) to improve the performance of dtc at low speed operation, we have to exalt the accuracy of the stator flux estimation and a new way of bp neural network based on extended pidbp algorithm is given to estimate and tune the stator resistance of an induction motor to increase the accuracy of the stator flux estimation ; ( 3 ) digital signal processor is adopted to realize digital control. an device of direct torque control system is designed for experiment using tms320lf2407 chip produced by ti company ; ( 4 ) bring up a distributed direct torque control system based on sercos bus, sercos stand for serial real time communication system agreement which is most in keeping with synchronous with moderate motor control ; ( 5 ) the basic design frame of the hardware and software of the whole control system is given here and some concrete problem in the experiments is described here in detail

    針對上面提到的直接轉矩控制的缺陷和未來直接轉矩控制技術發展方向，本論文重點做了以下幾個方面的工作，目的在於提高dtc系統的綜合性能： （ 1 ）提出一種新型的速度磁鏈觀測器，新型的速度磁鏈觀測器採用自適應閉環磁鏈觀測器代替傳統的積分器從而提高磁鏈觀測的精度，並且根據popov超穩定性理論推導出轉速的新型自適應收斂律； （ 2 ）改善系統的低速運行性能，主要從提高低速時對定子磁鏈的估計精度入手，提出了一種提高定子磁鏈觀測精度的新思路? ?利用基於bp網路增廣pidbp學習演算法來實時在線地修正定子電阻參數； （ 3 ）採用數字信號處理器dsp實現系統全數字化硬體控制，結合ti公司生產的tms320lf2407晶元，設計了直接轉矩控制系統的實驗裝置； （ 4 ）提出了基於sercos總線網路化分散式的直接轉矩控制系統， sercos （ serialrealtimecommunicationsystem ）是目前最適合同步和協調控制的串列實時通信協議； （ 5 ）基本勾勒出整個控制系統的硬體和軟體設計基本框架，詳細描述一些實驗中的具體的細節問題。
  5. At last, the model of defect size distribution and the model of soft and hard faults caused by defects is given. electromigration effect is still a dominating failure mechanism of interconnect for deep submicron and ultra - deep submicron scale

    然後從實際晶元的缺陷類型中抽象出了丟失物缺陷、冗餘物缺陷以及介質針孔缺陷的幾何模型，給出了缺陷的粒徑分佈模型和由缺陷引起的軟故障和硬故障的模型。
  6. With the development of microelectronic products ( integrated circuit, printed circuit board, etc ) directing to high density, thin separation and low defect ratio, its inspection requirement is higher on aspects of precision, efficiency, universal, and intelligence etc. therefore, this paper researched on the general key techniques in the field of microelectronic products vision inspection, covered the shortage of traditional inspection on aspects of fast and precision locating, image mosaic, and fine defect test, completed theory study on physical dimension and defect inspection of microelectronic products based on machine vision, developed the prototype and used lots of experiments to prove its correctness and feasibility

    隨著微電子產品（集成電路晶元、印刷電路板等）向著高密度、細間距和低缺陷方向發展，對其檢測技術在精密、高效、通用和智能化等方面提出了更高要求。由此，本文對微電子產品視覺檢測中的關鍵技術進行研究，彌補了傳統檢測在精確快速定位、圖像全景組合和精細缺陷檢測等方面的不足，最終完成基於機器視覺的微電子產品外形尺寸和缺陷檢測的理論研究和樣機研製，並進行了大量實驗證明其正確性和可行性，力圖為我國自主創新的微電子產品視覺檢測技術提供理論和實際借鑒。
  7. Advanced fpga technology is introduced to improve the integration of digital circuits, and all digital circuits in the original module are integrated in the fpga chips, which could not only reduce the cost, but also improve the reliability and measurement precision of the circuits. high speed digital signal processor ( dsp ) is selected as the coprocessor instead of scm ; it can receive all kinds of commands sent from vxi, analyze and execute the commands, harmonize each section of the module and process the data. higher - conversion - speed comparator chip is adopted to convert the input signals being measured into square waveform signals which could be identified by fpga chip ; it can expand the measurement range of frequency dramatically

    本文在原有vxi總線四通道計數器模塊的設計基礎上，通過對原模塊缺陷的分析，採用一些新的技術和新的電子器件來重新設計該計數器模塊:採用最新的fpga技術來提高數字電路的集成度，將原模塊中的所有數字電路全部集成在fpga晶元中，這樣不僅能節約成本，還能提高電路的可靠性和測量精度;採用高速的數字信號處理器（ dsp ）取代原有的單片機作為協處理器，來接收vxi發來的各種命令，分析命令、執行命令、協調模塊各部分的工作以及對數據的處理;採用轉換速率更高的比較器晶元將輸入的被測信號轉換為fpga晶元能夠識別的方波信號，能極大提高測量頻率的范圍;採用d / a轉換晶元和隔離運算放大器得到隔離通道所需的比較電平，該比較電平值能夠根據實際需求進行設置，能增強模塊的使用靈活性。
  8. As the density of very large - scale integration ( vlsi ) chips increases, the probability of introducing defects on the chips during the fabrication process also increase

    隨著超大規模集成電路晶元生產技術的發展，單片晶元的集成度越來越高。要想一次生產出沒有任何缺陷的晶元已不太可能。
  9. But it maintai that its current a roach lets it bring a quad - core product to market faster, using existing production techniques and with a lower rate of defects

    但是他們認為，他們現在的措施可以利用現有的生產技術和更低的技術缺陷，讓四核晶元更快的面市。
  10. But it maintains that its current approach lets it bring a quad - core product to market faster, using existing production techniques and with a lower rate of defects

    但是他們認為，他們現在的措施可以利用現有的生產技術和更低的技術缺陷，讓四核晶元更快的面市。
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