晶圓探測 的英文怎麼說

中文拼音 [jīngyuántàncè]
晶圓探測 英文
wafer probing
  • 晶 : Ⅰ形容詞（光亮） brilliant; glittering Ⅱ名詞1. （水晶） quartz; （rock） crystal 2. （晶體） any crystalline substance
  • 探 : Ⅰ動詞1 （試圖發現） try to find out; explore; sound 2 （看望） call on; visit; see 3 （向前伸出）...
  • 測 : 動詞1. （測量） survey; fathom; measure 2. （測度; 推測） conjecture; infer
  • 晶圓 : mpw
  • 探測 : survey; search; sound; probe; sounding; detection; acquisition; reconnaissance; localization; fin...
  1. One of the most important advancements recently for electroglas has been in gaining greater control over the z direction of the wafer prober, which affects the accuracy and impact force of touchdowns on wafers and enables their customers to effectively test even the most recent types of delicate devices

    其中伊智公司最近最重要的一個進步就是：實現了對于晶圓探針臺z方向的更大程度的控制，這直接影響到探針接觸晶圓的精確性和沖擊力，為客戶提供了高效率的測試；即使是最新型的精細器件。
  2. In this paper we expatiate the importance of using the x - ray to detect the laser - produced plasmas and developing the two - channel elliptical crystal spectrometer ( tcecs ) in the 620 ~ 6200 - ev x - ray region

    本文闡述了利用x射線譜進行激光等離子體診斷和國家863軍口主題研製用於探測0 . 2 ~ 2nm波長范圍的x射線譜的雙通道橢圓彎晶譜儀的重大意義。
  3. Firstly, we discuss the basic theory of the x - ray diffraction for crystal and the crystal spectrometer in detecting x - ray. utilizing the outstanding merits of the focus - bend - crystal spectrometer. tcecs ' s resolving power is enhanced greatly by introducing the elliptical crystal

    本論文首先討論了x射線受晶體衍射的基本理論以及晶體譜儀在x射線探測中的應用，利用聚焦型彎晶譜儀在進行x射線探測中應用的突出優點，加以改進，採用橢圓彎晶結構，大大提高了譜儀的解析度。
  4. Secondly, according to the basic theory of the general spectrometer, in this paper we discuss the fundamental, the compositions and the characters of tcecs. we analyze the main influencing factors for resolving power, such as the dispersion of the x - ray on the detection circle, spectra location error and the aperture width etc. and we put out the ways to resolving the problems

    接下來，本文根據經典光譜儀器的基本理論，著重討論了雙通道橢圓彎晶譜儀的基本原理，及其基本組成和基本特性，並從x射線波長在探測圓上的彌散度、光度參數與探測角之間的關系、狹縫寬度等方面對譜儀的精度和解析度的影響作了一定的分析，並提出了解決問題的辦法。
  5. Wafer test probe test

    晶圓測試探針測試
  6. Because of this, nearly every major semiconductor manufacturer in the world relies on electroglas ‘ wafer probing technologies to help them maximize the overall efficiency of their wafer and device testing processes

    正因為如此，幾乎全世界所有的半導體主要生產商都依靠伊智公司的晶圓探針技術來幫助他們全面提升晶圓和器件測試過程的效率。
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