晶圓測試 的英文怎麼說
中文拼音 [jīngyuáncèshì]
晶圓測試
英文
wafer probing-
One of the most important advancements recently for electroglas has been in gaining greater control over the z direction of the wafer prober, which affects the accuracy and impact force of touchdowns on wafers and enables their customers to effectively test even the most recent types of delicate devices
其中伊智公司最近最重要的一個進步就是：實現了對于晶圓探針臺z方向的更大程度的控制，這直接影響到探針接觸晶圓的精確性和沖擊力，為客戶提供了高效率的測試；即使是最新型的精細器件。Measurement challenges for on - wafer rf - soc test
晶圓上測試射頻系統級晶元的挑戰So in one hand it requires the wafer ' s diameter to be more large in order to enhance the productivity, and on the other hand it puts forward more strict requirement about the crystal perfection and electricity character. especially the electronic character and the equality of micro - area in the crystal wafer has become the key factor to determine whether the device can be made on it or not. so the resistivity measurement of micro - area become one most important procedure in the chip machining. to ensure the produce quality of chip and the perfect performance of final production, the four - probe testing technology need to be deeply studied
圖形日益微細化，電路尺寸不斷縮小，目前ic製造以8英寸、 0 . 13 m為主，預計在2007年左右將以12英寸、 65nm為主，這一方面要求圓片直徑不斷增大以提高生產率，另一方面對晶體的完美性、機械及電特性也提出了更為嚴格的要求。特別是微區的電學特性及其均勻性已經成為決定將來器件性能優劣的關鍵因素。因此，微區電阻率的測試成為晶元加工之中的重要工序。More than ic manufacturing, smic provides customers with a seamless flow of support with services that include design support, mask making, and wafer probing
除提供晶元生產，中芯國際還為客戶提供全方位的一站式服務，包括輔助設計、光掩膜版製造以及硅圓片上測試。Particle counting - wafers that are used to test tools for particle contamination
顆粒計算-用來測試晶圓片顆粒污染的測試工具。These special optical properties make clc possess of great potential application such as testing and analyzing, using as broadband reflective polarizer or circular polarization filters and field - display and so on. the most of applications are relevant to the choice reflection property. this property depends on molecules arrangement of its planar structure
膽甾相液晶的這些獨特的光學特性就決定了它有著很大的潛在應用價值如:測試分析、寬帶反射式偏振片、圓偏振濾光片及場致顯示等，這些應用均與膽甾相液晶的平面排列態的選擇反射特性有著很大的關系，而其選擇反射特性主要取決于液晶分子的排列狀態。Wafer test probe test
晶圓測試探針測試If we can eliminate the bad chips in advance of the testing stage, then the non - meaningful waste can also be decreased in the later process
若能及早將不良的晶元在晶圓測試階段即予以剔除，便能減少後段加工工序中不必要的浪費。With yulon ' s reputation and financial power, worldwide fab and assembly house ' s support, anachip is devoted to provide total ic solutions to serve our customers, and expect to reach a great operational result together
藉由裕隆集團在企業界的聲望及財務奧援，與世界各地晶圓廠及封裝測試廠的配合，易亨電子將致力於提供客戶完整的集成電路方案，共同創造更亮麗的營運成果。The technology used in the hbt production process is extremely complex ; advanced wireless semiconductor is one of only three companies in the world that possess this technology the other two are both located in the us. unlike the situation with other silicon chip products, japanese and korean manufacturers have yet to master hbt technology
德信科技成立於2001年，主要從事ic設計，並導入生產，生產過程中除晶圓代工和封裝測試是委外處理外，其餘皆由德信科技掌握，包括行銷。The equal - grain - area - circle diameter and the roundness were defined to scale the form factor and quantified the degree of the grain ' s globalization. metallographic analysis, xrd, tem and edax were expired to observe the evolution of the microstructure, the changing of the phase and the changing of the component
定量測試晶粒的等積圓直徑和球化度等形貌參數，比較形變組織的半固態球化效果，採用金相分析、 xrd 、 tem 、 edax等方法觀測組織演變過程特點，並考察第二相及微區成分的變化。Mechanical test wafer - a silicon wafer used for testing purposes
機械測試晶圓片-用於測試的晶圓片。While expensive eda tools are required for ic design, other types of equipment are also needed for other parts of the cycle, such as wafer fabrication, packaging, wafer bumping, testing, etc. currently, most hong kong ic design companies have to rely on overseas companies to perform these tasks
集成電路設計工作須要利用昂貴的電子設計自動化工具，但周期內其他環節如晶圓加工、封裝、晶圓凸塊製造、測試等，卻需要其他類型的儀器。目前香港大部分集成電路設計公司均要依賴海外公司進行有關工作。Wafer burn - in system
晶圓老化測試系統Therefore, the traditional testing of packaging format has been not enough, and it moves up to the wafer level
因此，傳統使用封裝形式的測試已不敷需求，漸漸往上游回溯至晶圓層級，被晶圓形式所取代。Premium wafer - a wafer that can be used for particle counting, measuring pattern resolution in the photolithography process, and metal contamination monitoring
測試晶圓片-影印過程中用於顆粒計算、測量溶解度和檢測金屬污染的晶圓片。Because of this, nearly every major semiconductor manufacturer in the world relies on electroglas ‘ wafer probing technologies to help them maximize the overall efficiency of their wafer and device testing processes
正因為如此，幾乎全世界所有的半導體主要生產商都依靠伊智公司的晶圓探針技術來幫助他們全面提升晶圓和器件測試過程的效率。分享友人