晶圓測試的英文怎麼說

中文拼音 [jīngyuánshì]
晶圓測試英文
wafer probing

  • : Ⅰ形容詞(光亮) brilliant; glittering Ⅱ名詞1. (水晶) quartz; (rock) crystal 2. (晶體) any crystalline substance
  • : 動詞1. (測量) survey; fathom; measure 2. (測度; 推測) conjecture; infer
  • : 名詞(古代占卜用的器具) astrolabe
  • 晶圓: mpw
  • 測試: test; testing; checkout; measurement

※中文詞彙晶圓測試在字典百科國語字典中的解釋。

  1. So in one hand it requires the wafer ' s diameter to be more large in order to enhance the productivity, and on the other hand it puts forward more strict requirement about the crystal perfection and electricity character. especially the electronic character and the equality of micro - area in the crystal wafer has become the key factor to determine whether the device can be made on it or not. so the resistivity measurement of micro - area become one most important procedure in the chip machining. to ensure the produce quality of chip and the perfect performance of final production, the four - probe testing technology need to be deeply studied

    圖形日益微細化,電路尺寸不斷縮小,目前ic製造以8英寸、 0 . 13 m為主,預計在2007年左右將以12英寸、 65nm為主,這一方面要求片直徑不斷增大以提高生產率,另一方面對體的完美性、機械及電特性也提出了更為嚴格的要求。特別是微區的電學特性及其均勻性已經成為決定將來器件性能優劣的關鍵因素。因此,微區電阻率的成為元加工之中的重要工序。
  2. In this thesis, scanning force microscopy ( sfm ) was used to study the nanoscale electric phenomena of the surface and interface properties of ferroelectric thin films. the experimental setup was calibrated by measuring potential distribution of the working resistance of integrated chip

    在實驗儀器的驗證方面,選用集成電路單元中的埋置條形電阻作為檢對象,在電阻兩端外加直流偏壓后檢電阻的電勢分佈,在已知電阻上電勢分佈的前提下,驗證了開爾文力顯微鏡檢微區表面電勢的可靠性。
  3. Based on that, the author simulated most of the sub - block circuits and whole chip circuit by applying eda tools hspice. the simulation results indicate that the ic has achieved the expectation,

    理論分析、模擬結果和數據表明,在典型情況下,該電路的電流控制精度相對誤差和匹配相對誤差可以控制在0 . 5 %以內,達到了預定設計目標。
  4. Bluetooth headset main chip testing f

    藍牙耳機主
  5. We aslo get the theory of verification test and design debug discussed, and then, some work on the verification test of this integrated circuits have been done. for the sake of finding out the reason of noise occurring in circuit of oscillator, we probe into causation of technics and mechanism

    論文最後基於理論,針對元流片后的部分結果,對振蕩出現的噪聲問題給出了初步分析,並結合投片工藝探討了工藝原因與產生機理。
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