橢圓偏光 的英文怎麼說

中文拼音 [tuǒyuánpiānguāng]
橢圓偏光 英文
elliptical polarized light
  • : Ⅰ形容詞(卵形) oval-shapedⅡ名詞[書面語] (長圓形的容器) elliptic vessel
  • : Ⅰ形容詞1 (不正; 歪斜) inclined to one side; slanting; leaning 2 (只側重一面) partial; prejudi...
  • : Ⅰ名詞1 (照耀在物體上、使人能看見物體的一種物質) light; ray 2 (景物) scenery 3 (光彩; 榮譽) ...
  • 橢圓 : [數學] oval; oval shaped; ellipse; ellipsoid橢圓規 ellipsograph; [圖] elliptic trammel; 橢圓軌道 ...
  1. For detecting elliptically polarized light and partially polarized light, the detection method is analyzed frow the view of the composite retardation plate theory

    摘要為了檢測部分,從復合波片的理論出發,藉助于數學工具,對檢測方法做了較為詳盡的理論分析。
  2. Linearly polarized light will in consequence become elliptically polarized on total reflection.

    因此,線徑全反射后將變成
  3. All the other wavelengths will emerge as either elliptically or circularly polarized light.

    所有其它波長的將以出射。
  4. When the end of the electric field vector travels in an ellipse, the light is elliptically polarized.

    電場矢量的末端沿一移動的
  5. The results indicate any elliptically polarized light can be compensated to become lineally polarized light throught / 4 wave - plate as long as the fast - axis ( slow - axis ) of / 4 wave - plate and the long - axis ( short - axis ) of elliptically polarized light are in the same orientation, but partially polarized light cann ' t

    結果表明,只要/ 4波片的快(慢)軸與的長(短)軸方位一致,則任何經過/ 4波片后均可以補償為線,而部分經過/ 4波片后仍為部分
  6. In the paper, transmission loss, polarizing and nonlinear characters ( chiefly about srs spectrum ) in highly single mode silicon elliptical optical fiber and circular optical fiber are experimentally and theoretically researched

    本文對石英系單模芯和纖的傳輸損耗特性、特性、非線性特性(主要是srs譜)進行了系統的實驗研究和理論分析,給出了實驗裝置和測試原理。
  7. Polarization characteristics of laser beam, which is one of the important characteristics of high power laser, have a direct effect on output power, damage threshold of optical elements and beam quality etc. the polarization characteristics in the high power coil resonator is analyzed by jones calculus, and draw a conclusion that, in general the eigen - polarization state is elliptical polarization

    束的振特性是高功率激器的一個重要特性之一,直接影響著高功率激器的輸出功率、腔內學元件的損傷以及束質量等。本文首先利用瓊斯矩陣演算法對高功率氧碘激器腔內的振特性進行了分析,並得出結論,諧振腔內的本徵振蕩一般為振。
  8. The deposited cu - mgf2 cermet films were analyzed by xrd, ed, tem, ir, uv, ellipsometry and temperature - varied four - wire technique

    用ir 、 uv及譜技術測量分析樣品從紅外-近紫外波段的透射、吸收及反射譜特性。
  9. This paper analyzes the non - symmetry of elliptic polarization oftwo linear polarized beams, which are perpendicular to each other, caused by their reflecting from a metal mirror. also, it studies the non - linear error created by polarization and how the errors change. the study is very important for improving the measuring accuracy of polarized heterodyne interferometer

    主要分析兩束相互垂直的線經過金屬反射鏡反射后引起的振化的不對稱性,並研究由此產生的非線性誤差的變化規律,這對提高外差干涉儀的測量精度是極為重要的。
  10. Abstract : this paper analyzes the non - symmetry of elliptic polarization oftwo linear polarized beams, which are perpendicular to each other, caused by their reflecting from a metal mirror. also, it studies the non - linear error created by polarization and how the errors change. the study is very important for improving the measuring accuracy of polarized heterodyne interferometer

    文摘:主要分析兩束相互垂直的線經過金屬反射鏡反射后引起的振化的不對稱性,並研究由此產生的非線性誤差的變化規律,這對提高外差干涉儀的測量精度是極為重要的。
  11. The chemical composition, micro - structure and optical properties and its application of tio2 thin films deposited on k9 glass by using reactive electron - beam evaporation ( reb ) are studied through sem, tem, xps, xrd, spectroscopic ellipsometry ( se ) and uv - vis spectrophotometer in the dissertation, and the progresses of nucleation and growth of thin film are discussed from the point of view of dynamics and thermodynamics so that a structure model of tio _ ( 2 ) thin film is brought forward

    本文採用sem 、 tem 、 xps 、 xrd 、振儀( se ) 、 uv - vis分度計等分析手段系統地研究了電子束反應蒸發方法在k9玻璃上制備tio _ 2薄膜的成分、結構和學性能以及tio _ 2薄膜在學多層膜中應用,並開發了膜系設計軟體。文中還從動力學和熱力學角度分析了tio _ 2超薄膜的形核生長過程,得出了tio _ 2薄膜的組織結構模型。
  12. The thickness, extinction and reflection coefficients of the plct ( x ) thin films with variant layers were measured by ellipsometer

    運用振儀測定了不同層數的薄膜厚度、消系數、折射率。
  13. Analysis th to mechanism ellipse polarized light that in the specimen faced happen at the same time reflection refraction and multiplicity light beam interference, proves the principle that laser instrument of measure thickness of specimen with jones vector

    摘要對在樣品表面產生的反射、折射和多束干涉的機制進行了分析,並用瓊斯矢量論證了激測厚儀的原理。
  14. Mathcad applied to testing of the optical constants for thin films with ellipsometer

    Mathcad在振儀測定薄膜學常數中的應用
  15. The method of data processing for directly demonstrating elliptically polarized light experimentally

    直接實驗驗證的數據處理方法
  16. In order to obtain an elliptically polarized light, whose ellipticity angle to be invariable and the elliptical azimuth may continuously change, or the ellipticity angle may continuously change and the elliptical azimuth invariable, the polarization is analyzed based on the matrix optics method when the linearly polarized light transits the / 4 and / 2 wave - plates, which are placed according to the certain azimuth, the reliable data are obtained

    摘要為了獲得率角不變、方位角可連續變化和率角可連續變化、方位角不變的,採用矩陣學方法對按一定方位角擺放的/ 4波片和/ 2波片,在線通過后的振態變化,進行了理論分析和實驗驗證,取得了可靠的數據。
  17. Orientation of the elliplically polarized light ' s main axis

    主軸方向的確定
  18. We compare the theoretical results with the experimental results and discuss the applicability of the three effective medium theories to nanoparticles cermet films

    我們將理論計算結果同用譜儀得到的實驗值進行了比較,討論了三種有效介質理論對不同微結構薄膜體系的適用性。
  19. The best process for high quality tio _ ( 2 ) thin film deposited on k9 glass by reb is studied by using orthogonal test method, the se results indicate that the best process for tio _ ( 2 ) thin film deposition is the substrate temperature of 300, the total gas press in the chamber of 2 x 10 ~ 2pa and the deposition rate of 0. 2 nm - s - 1, of which the substrate temperature has influence on the optical properties of the deposited films notably

    文中首先以tio _ 2薄膜的折射率和消系數為研究對象,採用l9正交試驗法研究了在k9玻璃上制備高學質量tio _ 2薄膜的最佳工藝條件。振儀的測試結果表明,制備tio _ 2薄膜的最佳工藝條件為:基片溫度300 ,工作真空2 10 ~ ( - 2 ) pa ,沉積速率0 . 2nm ? s ~ ( - 1 ) ,其中基片溫度對薄膜學常數的影響最大,該結果具有較好的可重現性。
  20. In this study, on the base of the present status and future development of semiconductor materials for solar cells, we have carried out the work to compose film structures of si - based materials by theoretical analysis and experimental methods, which have potential application in modules of solar cells. the processing, features of microstructure and optical properties of the designed si - based thin films have been studied in detail by employing methods of xrd, sem, afm, tem, raman, ftir, uv - vis, pl, and ellipsometry spectroscopy ( se )

    本文在全面總結目前太陽電池材料的研究現狀和其未來發展趨勢的基礎上,系統地從理論和實驗兩方面對應用在太陽電池板上的si基薄膜材料的結構進行了設計,用超高真空磁控濺射儀研究了其制備工藝,用了xrd 、 sem 、 afm 、 tem 、 raman 、 ftir 、 uv - vis 、 pl和橢圓偏光儀( se )等分析手段研究了薄膜的相結構、微觀組織特徵和其所具有的性能。
分享友人