測定波長范圍 的英文怎麼說

中文拼音 [cèdìngbōzhǎngfànwéi]
測定波長范圍 英文
total range of wavelength
  • 測 : 動詞1. （測量） survey; fathom; measure 2. （測度; 推測） conjecture; infer
  • 定 : Ⅰ形容詞1 （平靜; 穩定） calm; stable 2 （已經確定的; 不改變的） fixed; settled; established Ⅱ動詞...
  • 波 : Ⅰ名詞1 （波浪） wave 2 [物理學] （振動傳播的過程） wave 3 （意外變化） an unexpected turn of even...
  • 長 : 長Ⅰ形容詞1 （年紀較大） older; elder; senior 2 （排行最大） eldest; oldest Ⅱ名詞（領導人） chief;...
  • 范 : 名詞1 [書面語] （模子） pattern; mould; matrix 2 （模範; 榜樣） model; example 3 （范圍） boundar...
  • 圍 : Ⅰ動詞1 （四周攔擋起來 使裡外不通; 環繞） enclose; surround; corral 2 （繞; 裹） wrap Ⅱ名詞1 （四...
  • 測定 : determine; determination; setting-out; admeasurement; assignment; assay; finding
  • 波長 : [物理學] wavelength波長標準 [光學] wavelength standards; 波長測量 wavelength measurement; 波長常...
  • 范圍 : scope; limits; extent; boundary; confines; range; range dimension; spectrum
  1. Gaas / algaas quantum well photodetectors ( qwips ) are new type devices and progressed rapidly in recent 20 years. qwips utilizing intersubband absorption between gallium arsenide ( gaas ) well and aluminum gallium arsenide ( alxga1 _ xas ) barriers were perfected. therefore, the ability to accurately control the band structure and hence the spectral response, as well as both established technology for growing and processing gaas optical devices and commercially available large area vlsi gaas ic ' s, makes gaas / algaas qwips attractive devices for use in very large focal plane arrays ( fpas ), especially available in the range of long wavelength 8 - 12 urn

    Gaas algaas量子阱紅外探測器（ qwips ）是近二十年來迅速發展起來的一種新型紅外探測器，它成功地利用了gaas勢阱和al _ xga _ （ 1 - x ） as勢壘之間的子帶間吸收，使之具有能帶結構可精確設計從而獲得指定光譜響應的特點，加之成熟的材料生長技術、器件工藝，以及商業上可獲得大面積的vlsigaas集成電路，使得gaas algaasqwips尤其適宜製作8 12 m長波范圍的大面陣探測器。
  2. Ultraviolet absorption detector, photodiode array detector ( dad ), fluorescence detector, and electrochemical detector are optional detectors, response value of which is relative to not only quality of the object under test, but also structure of the compound ; refractive index detector and evaporative light - scattering detector are universal detector, responding to structure of all compounds ; evaporative light - scattering detector is quality - type detector, whose responding value only relates to quality of the object under test for compounds with similiar structures ; photodiode array detector ( dad ) can, at the same time, record absorption spectra of the object under test in a prescribed wave scope, consequently, it can be used in spectrum control and inspection of purity of chromatographic peaks of the object under test

    紫外、二極體陣列、熒光、電化學檢測器為選擇性檢測器，其響應值不僅與待測物的質量有關，還與化合物的結構有關；示差折光檢測器和蒸發光散射檢測器為通用型檢測器，對所有的化合物結構均有響應；蒸發光散射檢測器屬質量型檢測器，對結構類似的化合物，其響應值幾乎僅與待測物的質量有關；二極體陣列檢測器可以同時記錄待測物在規定波長范圍內的吸收光譜，故可用於待測物的光譜管制和色譜峰純度的檢查。
  3. Biology, etc. owing to many merits has not yet been used to measure parameters of gratings. the paper researches on the subject in view of current lack of it. the main tasks of the paper include : analyzing ellipsometric characteristics of gratings in detail with vector diffraction theory and ellipsometrics ; devising a reflective quarter wave plate at normal incidence according to some ellipsometric characteristics ; making use of normal simplex algorithm during ellipsometric inversion of gratings parameters, inversing ellipsometric parameters with gaussian noise of different standard deviations to simulate actually measured values with examples of isotropic metallic and anisotropic step gratings and testing that ellipsometry about gratings parameters is feasible with the range of certain precision ; discussing choice of incidence angle at length

    本論文的主要工作包括：結合光柵的矢量衍射理論和薄膜的橢偏理論，詳細分析了光柵的橢偏特性；並且根據一些橢偏特性設計出一款正入射反射型單波長1 4波片；在光柵參數的橢偏反演中，引入正單純形法作為反演演算法，分別以各向同性的正弦形金屬光柵和各向異性的階梯型光柵為例，在標準橢偏值的基礎上加入不同偏差的高斯噪聲來模擬實際的橢偏測量值進行反演，在一定精度范圍內得出滿意的光柵參數，說明光柵參數的橢偏測量是可行的；還就入射角的選取問題進行了一定的探討。
  4. It is found that all the thin films have a preferential c - axis orientation. with increase of al doping, the peak position of the ( 002 ) plane is shifted to the low 2 value

    同時， zno通過摻雜，對其帶隙進行調整，使探測器的吸收截止邊按需求被控制在特定的波長范圍內，將成為zno基紫外探測器研究中新的熱點。
  5. Measurement and characterization of surface texture is an important aspect of precision metrology. historically this has involved partitioning a profile into different wavelength regimes referred to as roughness, waviness and form followed by numerical quantization. parameters computed are then inspected for tolerance compliance to ensure a part performs its intended function. this approach is satisfactory when the specification has been carefully determined and the process is stable. however, when the manufacturing process is under development or when instability or modifications to the process invalidate specifications, there is a need to study surface finish parameters in relation to functional performance or process measures. in this context, the problem of surface texture classification and recognition are discussed. advanced techniques developed for this purpose along with applications are presented. also, the techniques discussed here will be useful across large bandwidth, from the characterization of nano scale to traditional micro scale surfaces

    表面結構的測量與特徵描述是精密計量技術的一個重要方面，傳統上包括將輪廓情況根據不同的波長范圍劃分為粗糙度、波紋度和形狀及后續的數字量化.按算得的參數檢查它是否為公差允許，以保證零件執行其指定的功能.當技術特性已經經過仔細確定，並且其過程穩定時，該方法是令人滿意的;但是，當製造過程正在進行中或過程的不穩定、過程變化使技術特性失效時，就需要研究和功能表現及過程評定相關的表面參數.討論了表面結構的分類與識別問題.同時闡述了為此目的而開發的先進技術及其應用.所研究的技術對從納米尺度到傳統的微米尺度的較大帶寬范圍內的表面特徵描述都是有效的
  6. Methods : its experimentative conditions, including detected wavelength, fluid medium, disposal of special specimens, linear range of methods, minimum contents, precision, accuracy, currecy and application, have been investigated

    方法：對測定方法中涉及到的檢測波長、流動相、操作方法以及方法的線性范圍和最低檢出量、精密度和準確度等方面進行實驗研究。
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