焊封 的英文怎麼說

中文拼音 [hànfēng]
焊封 英文
solder(ing) seal
  • : 動詞(用熔化的金屬修補金屬器物或使金屬工件連接起來) weld; solder
  1. 6. suitable for the site for welding airproof vessel

    6 .適合於接密容器的場合
  2. Symbol and notation for brazing, soldering and sealing

    焊封接的代號及標注方法
  3. At. detail specification for cold welded seal quartz crystal units for oscillator applications - dk enclosure, 6. 0 to 25 mhz frequency range - fundamental thickness - shear mode, at - cut, for operation over wide temperature ranges non - temperature controlled - full assessment level

    振蕩器用冷石英晶體振子詳細規范. dp外殼6 . 0至25mhz頻率范圍.寬溫范圍
  4. At. detail specification for cold welded seal quartz crystal units for oscillator applications - dn, dq and dp enclosures, 17 to 75 mhz frequency range - third overtone thickness - shear mode, at - cut, for operation over narrow temperature ranges temperature controlled - full assessment level

    振蕩器用冷石英晶體振子詳細規范. dn dq和dp外殼17至75mhz頻率范圍.窄溫范圍
  5. At. detail specification for cold welded seal quartz crystal units for oscillator applications - dn, dq and dp enclosures, 50 to 125 mhz frequency range - fifth overtone thickness - shear mode, at - cut, for operation over wide temperature ranges non - temperature controlled - full assessment level

    振蕩器用冷石英晶體振子詳細規范. dn dq和dp外殼50至125mhz頻率規范.寬溫范圍
  6. At. detail specification for cold welded seal quartz crystal units for oscillator applications - dn, dq and dp enclosures, 50 to 125 mhz frequency range - fifth overtone thickness - shear mode, at - cut, for operation over narrow temperature ranges temperature controlled - full assessment level

    經質量評定的振蕩器用冷焊封石英晶體振子詳細規范. dn dq和dp外殼, 50至125mhz頻率規范.窄溫范圍
  7. At. detail specification for cold welded seal quartz crystal units for oscillator applications - dn, 47 u 2, dq and dp enclosures, 17 to 75 mhz frequency range - third overtone thickness - shear mode, at - cut, for operation over wide temperature ranges non - temperature controlled - full assessment level

    振蕩器用冷石英晶體振子詳細規范. dn 47u 2 dq和dp外殼17至75mhz頻率范圍.寬溫范圍
  8. At. detail specification for cold welded seal quartz crystal units for oscillator applications - dn, dq and dp enclosures, 0. 8 to 20 mhz and 3. 0 to 30 mhz frequency ranges - fundamental thickness - shear mode, at - cut, for operation over narrow temperature ranges temperature controlled - full assessment level

    振蕩器用冷石英晶體振子詳細規范. dn dq和dp外殼0 . 8至20mhz和3 . 0到30mhz頻率范圍.窄溫范圍
  9. The cracking with these two types of underfill might become unstable and lead to catastrophic failure at the end. the critical length was about 12m for the assembly with no - flow underfill and 20m for the package with capillary - flow underfill at 20 ?

    模擬表明,山固化溫度冷卻到室溫時,所研究的倒裝焊封裝在填充不流動膠時晶元斷裂臨界裂紋長度為12pm ,而填充傳統底充膠時為20hm 。
  10. ( 2 ) design of the implantating device : some quantity of 316l stainless steel, perform forging and thermal rolling, drawing filament ( diameter 0. 4mm and 0. 23mm respectively ), enlacing and jointing, after that assembling the products into guiding filum, a technical examination was carried out to appraise their physical capability. the second part : experimental study : animal experiments were used to screen and observe its validity and security : under general anesthesia, tracheotomy was performed on the healthy dog, the bronchus was localized using x - ray fluoroscopy fibrobronchoscope and with the help of the implanting equipment, several niti alloy occludes were implanted into the target bronchus of the dogs through the biopsy channel in the fibrobronchoscope

    ( 2 )推送器的研製:取316l不銹鋼熱軋,分別拉製成不同直徑的不銹鋼絲分別用作製作內芯、外環及車制螺絲,再經纏繞、接、裝配成推送器。對上述兩者進行技術鑒定。第二部分:支氣管堵器的實驗研究:四種形狀的堵器分四組(上述四種堵器各12隻)進行動物實驗,分別觀察其安全性與有效性。
  11. Flux entrapped in the joints is the principal cause of low strength or failure.

    裂縫中存有藥是強度不足或斷裂的主要原因。
  12. According to the m1l - std - 883c standard of thermal cycle loading, the delamination propagation rates at the interface between chip and underfill were studied experimentally by using c - mode scanning acoustic microscope ( c - sam ) for two types of flip chip packages with different states of solder joint

    採用mil - std - 883c標準,通過溫度循環實驗,使用高頻超聲顯微鏡( c - sam )無損檢測技術,測量了在不同點狀態下, b型和d型兩種實際倒裝焊封裝晶元與底充膠界面分層裂縫傳播速率。
  13. Light gauge metal containers - round vent - hole cans with soldered ends for milk and milk products - capacities and related diameters

    薄壁金屬容器.裝牛奶和牛奶製品用帶焊封埠的圓形通氣孔罐.容積和相關尺寸
  14. The minimal usage means the usage in the welding sealed iron container, if in the humidity or inner liner plastic bag sealed package wooden container, should use double

    注:最少使用量指在焊封鐵容器內的使用量,凡是在潮濕環境和採用木箱內襯塑料袋裝的包裝,應採用加倍的量。
  15. Notice : the minimal usage means the usage in the welding sealed iron container, if in the humidity or inner liner plastic bag sealed package wooden container, should use double

    注:最少使用量指在焊封鐵容器內的使用量,凡是在潮濕環境和採用木箱內襯塑料袋裝的包裝,應採用加倍的量。
  16. To our knowledge, for real flip chip packaging under the thermal loading, the paris equation obtained from experiment da / dn and simulation g is firstly reported here, and will be useful practically

    本文在熱循環加載條件下對實際倒裝焊封裝給出實驗da / dn和模擬g關系的paris方程,屬首次報導。
  17. 2. the delamination at the interface is one of typical failure mode for electronic packaging. in order to get more understanding of the propagation behaviour of [ he delamination, a series of finite element simulations related were done

    為了對界面分層及其傳播行為進行深入研究,本文對b型和d型兩種實驗倒裝焊封裝,在熱循環加載下,進行了有限元模擬。
  18. Then, the half - empirical paris equation, which can be used as a design base of flip chip package reliability, have been determined from the crack propagation rates da / dn measured and the energy release rates g simulated

    然後由實驗測得界面裂縫擴展速率和有限元模擬給出的能量釋放率,擬合得到可作為倒裝焊封裝可靠性設計依據的paris半經驗方程。
  19. The report of determination for interface delamination propagation rate of real flip chip packages is hardly found up to now

    目前,測定實際倒裝焊封裝界面分層傳播速率報道尚少見。
  20. The reliability of flip chip package was studied in this work by both experimental measurements and finite element simulations

    本文針對倒裝焊封裝可靠性問題進行了實驗和數值模擬兩方面的研究。
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