真橢圓性 的英文怎麼說

中文拼音 [zhēntuǒyuánxìng]
真橢圓性 英文
proper ellipticity
  • 真 : Ⅰ形容詞（真實） true; genuine; real Ⅱ副詞1 （的確; 實在） really; truly; indeed 2 （清楚確實） cl...
  • 橢 : Ⅰ形容詞（卵形） oval-shapedⅡ名詞[書面語] （長圓形的容器） elliptic vessel
  • 性 : Ⅰ名詞1 （性格） nature; character; disposition 2 （性能; 性質） property; quality 3 （性別） sex ...
  • 橢圓 : [數學] oval; oval shaped; ellipse; ellipsoid橢圓規 ellipsograph; [圖] elliptic trammel; 橢圓軌道 ...
  1. A elliptic curve digital signature and authentication algorithm of independent knowledge property right is designed and implemented on computer in this theme. data integrality and user authenticity is ensured

    本課題中設計了一種擁有自主知識產權的橢圓曲線數字簽名和驗證演算法，並在微機上進行了實現，確保了數據的完整性和用戶身份真實性。
  2. In chapter two, we consider the finite volume element methods for nonlinear parabolic problems optimal order error estimates in the h1, l2norms and w1, almost optimal error estimates in l are demonstrated. moreover superconvergence in the error between the approximate solution and the generalized elliptic projection of the exact solution is also shown

    第二章考慮非線性拋物方程的初值問題的體積有限元法，並證明了h ~ 1 ， l _ 2和w ~ （ 1 ， ）誤差估計以及l _最優誤差估計，而且還得到了近似解和真解的廣義橢圓投影間的超收斂估計。
  3. The best process for high quality tio _ ( 2 ) thin film deposited on k9 glass by reb is studied by using orthogonal test method, the se results indicate that the best process for tio _ ( 2 ) thin film deposition is the substrate temperature of 300, the total gas press in the chamber of 2 x 10 ~ 2pa and the deposition rate of 0. 2 nm - s - 1, of which the substrate temperature has influence on the optical properties of the deposited films notably

    文中首先以tio _ 2薄膜的折射率和消光系數為研究對象，採用l9正交試驗法研究了在k9玻璃上制備高光學質量tio _ 2薄膜的最佳工藝條件。橢圓偏振儀的測試結果表明，制備tio _ 2薄膜的最佳工藝條件為：基片溫度300 ，工作真空2 10 ~ （ - 2 ） pa ，沉積速率0 . 2nm ? s ~ （ - 1 ） ，其中基片溫度對薄膜光學常數的影響最大，該結果具有較好的可重現性。
  4. In this study, on the base of the present status and future development of semiconductor materials for solar cells, we have carried out the work to compose film structures of si - based materials by theoretical analysis and experimental methods, which have potential application in modules of solar cells. the processing, features of microstructure and optical properties of the designed si - based thin films have been studied in detail by employing methods of xrd, sem, afm, tem, raman, ftir, uv - vis, pl, and ellipsometry spectroscopy ( se )

    本文在全面總結目前太陽電池材料的研究現狀和其未來發展趨勢的基礎上，系統地從理論和實驗兩方面對應用在太陽電池板上的si基薄膜材料的結構進行了設計，用超高真空磁控濺射儀研究了其制備工藝，用了xrd 、 sem 、 afm 、 tem 、 raman 、 ftir 、 uv - vis 、 pl和橢圓偏光儀（ se ）等分析手段研究了薄膜的相結構、微觀組織特徵和其所具有的光性能。
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