線光度計 的英文怎麼說

中文拼音 [xiànguāngdùjì]
線光度計 英文
x ray photometer
  • 線 : 名詞1 （用絲、棉、金屬等製成的細長的東西） thread; string; wire 2 [數學] （一個點任意移動所構成的...
  • 光 : Ⅰ名詞1 （照耀在物體上、使人能看見物體的一種物質） light; ray 2 （景物） scenery 3 （光彩; 榮譽） ...
  • 度 : 度動詞[書面語] （推測; 估計） surmise; estimate
  • 計 : Ⅰ動詞1 （計算） count; compute; calculate; number 2 （設想; 打算） plan; plot Ⅱ名詞1 （測量或計算...
  1. Two months later in april 1997, oxford chemicals purchased its main manufacturing facility in bayswater and incorporated both an extensive laboratory and quality control facility with high - tech infra - red chemical analysis equipment as well as a small dyehouse with a spectrophotometer colour matching facility

    兩個月以後即1997年四月，牛津化工又在貝瓦特地區買下主要生產設備，其中包括紅外線化學分析儀器設備和分光關度計這些顏色匹配設備，使一個完善的化工實驗室和質量控制系統有機的結合起來。
  2. Traveling cranes, drying furnaces, transformer wiring facilities, transformer automatic inspection machines, pressure meters, insulation resistance meters, ac dc stabilized power sources, memory high coder brightness meters, light meters, film thickness meters, noise meters, hand thermometers

    起重機，乾燥爐，變壓器卷線設備，變壓器自動檢查機，耐壓計，絕緣電阻計，交流直流穩定性電源，內存快速編碼器亮度計，光度計，膜厚計，噪音計，手指尖溫度計
  3. The laser radar sub - system determines the heights of the tsp according to the slant height and the oblique angle measured by the laser range finder and the electronic theodolite simultaneously. by lucubrating the motion law of tsp, we decided to compute decent velocities with least - squares procedure & two ranks curve fitting

    地面激光雷達跟蹤測量分系統根據測量到的斜距離和俯仰角確定末敏彈傘彈系統的高度，在深入研究末敏彈穩態掃描過程的運動規律后，通過最小二乘法的二階分段曲線擬合，計算出落速。
  4. Ultraviolet photometer for monitoring of water pollution

    水質污染監測用紫外線光度計
  5. Chapter 5. based on the measured refractive index distribution curve, according as the theoretical model of light transmission in the grin medium, using quadrivalent runger - kutta method to carry out the light tracking, by this means the mainly imaging character index of the micro - lens such as foci, longitudinal and transverse spherical aberrations aberration etc is calculated. i

    第五章從測量所得折射率分佈曲線出發，根據梯度介質球內光線傳輸的理論模型，用四階runger - kutta方法進行光線追跡，計算了此種梯度球的縱橫向球差等光學特性，給出所製作梯度折射率微球透鏡成像性能的評價。
  6. Surface states and the topmost surface atoms of the batio3 thin films have been analyzed by x - ray photoelectron spectroscopy ( xps ) and angle - resolved x - ray photoelectron spectroscopy ( arxps ). the results show that the as - grown batio3 thin films have an enriched - bao nonstoichiometric surface layer which can be removed by ar + ion sputtering, and the atomic ratio of ba to ti decreases with increasing the depth of ar + ion sputtering

    用x射線光電子能譜技術（ xps ）和角分辨x射線光電子能譜技術（ arxps ）研究了薄膜的表面化學態以及最頂層原子種類和分佈狀況，結果顯示在熱處理過程中薄膜表面形成一層富含bao的非計量鈦氧化物層，並且鋇-鈦原子濃度比隨著探測深度的增大而逐漸減小。
  7. Di - on electric one of the beijing hi - new - tech enterprise develop and manufacture lots of equipment like sf6 dewpoint meter dp100, cable fault location system cfl6000 and more. di - on electric supply the most advanced technology and equipment on such as gis surge arrestor on line monitoring, resistance measuring, ac dc metrology, thermal - temperature bridge, power transformer diagnostic and testing, cable diagnostic and fault location, sf6and oil moisture measuring, oil treatment and testing, optic fiber temperature monitoring, circuit breaker testing, relay testing and more

    迪揚電氣在gis和避雷器的帶電測試與故障診斷分析，電力電纜的故障定位與局放檢測，變壓器電抗器的各種測試診斷與溫度監測， sf6的水分測量與回收，絕緣油的測試分析與濾油處理，紅外測溫與光纖在線測溫，以及各種電阻測試與計量，溫度計量與電能計量等方面擁有世界一流的技術與成熟的儀器設備。
  8. The paper introduces a method of design and realization that is based on the single chip computer 8051, which adopts straight line grating sensor and realizes the three - coordinate high accuracy system of dynamic check and displacement measurement of nc machine

    摘要介紹了一種以單片機8051為核心，採用直線光柵位移傳感器，實現數控機床三坐標位移高精度動態檢測系統的設計方法。
  9. The components, microstructure, luminousness, thickness and surface topography of the films were analysised via xrd, uv ? vis, xps, ellipsometric examination and stm. the photocatalytic properties of these fims are characterized by the decomposition rate of methylene blue or rhodamine b. the effect of sputtering power, temperature, o2 mass flow, bias, w - doping and sputtering time on photocatalytic properties are discussed

    採用x射線衍射儀、紫外-可見光分光光度計、 x光電子能譜儀、薄膜厚度測試儀及掃描探針顯微鏡等測試手段，研究分析了薄膜的組分、結構、透光率、膜厚和表面形貌等。
  10. All my samples with good orientation are prepared by rf sputtering. then we invest surface morphology and crystal structure, optical and electrical properties of zno films by afm, xrd, hall testing, ultraviolet - visible spectrum photometer and xps et al. zno films are fabricated on gaas substrate

    本文用射頻反應磁控濺射制備了高度c軸擇優取向的zno薄膜，採用原子力顯微鏡（ afm ） 、 x射線（ xrd ） 、 hall測試儀、紫外?可見分光光度計和x光電子能譜等分析測試手段，研究了樣品的表面形貌、晶體結構、光學和電學性能等。
  11. 2 studying of the properties of cbn thin films afm showed that cbn thin film delaminated from substrate obviously. basing xps, we calculate the nib ratio to be 0. 90 that is closing to unity, and the thickness of hbn layer on cbn layer that is about 0. 80 nm

    根據x射線光電子能譜，計算得到立方氮化硼薄膜中的n和b的原子數比為0 . 90 ，接近理想化學配比1 ；立方氮化硼薄膜頂層的六角氮化硼的厚度約為0 . 80nm 。
  12. Standard practice for describing and measuring performance of ultraviolet, visible, and near - infrared spectrophotometers

    說明和測量紫外線，可見和近紅外線分光光度計的性能的標準操作規程
  13. Air quality. determination of ozone in ambient air. ultraviolet photometric method

    空氣質量.環境空氣中臭氧含量的測定.紫外線光度計法
  14. The transmission spectra and reflectance spectra of the pc shift systematically with the spheres size, providing evidence of photonic crystal effects. photoluminescence measurements show efficient emission of the zno photonic crystals in the uv as well as a defect emission band at longer wavelength

    利用透射光譜及反射光譜研究了影響zno光子晶體的光子禁帶的工藝參數;利用x射線衍射儀分析了zno光子晶體的結晶和取向性能;利用熒光分光光度計，研究了不同前處理溫度下的zno光子晶體的光致發光譜。
  15. Standard practice for measuring practical spectral bandwidth of ultraviolet - visible spectrophotometers

    紫外線-可見分光光度計的實用光譜帶寬的測量
  16. Standard practice for monitoring the calibration of ultraviolet - visible spectrophotometers whose spectral slit width does not exceed 2 nm

    光譜狹縫寬度不超過2nm的紫外線-可見光分光光度計的校準監測的標準實施規程
  17. In this thesis we have expatiated on the methods of the c60 thin films preparation, and the process with vacuum evaporation. the effect, which was caused by different gas pressures and other element doped, on surface morphology, structure and optical properties of c60 films have been studied by using scanning electron microscopy ( sem ), ultraviolet visible optical absorption spectroscopy ( uv / vis ) ( type : uv - 240 ), ellipsometer and x - ray diffraction

    本論文闡述了用真空蒸鍍法制備c60薄膜的方法和過程，研究了在不同氣氛下生長和摻雜對c60薄膜的表面形貌、結構和光吸收特性的影響；用xl30fge型掃描電鏡對c60薄膜表面形貌進行觀察；用uv - 240型紫外可見光雙光束分光光度計進行紫外、可見光吸收測量；用橢偏儀對薄膜進行厚度和折射率測量；用x射線衍射對薄膜結構進行分析。
  18. Linearization - the on - board spectrophotometer supplies color and density data to the external rip ' s color management software

    線性-對董事會分光光度計用品顏色和密度數據給外部扯裂的色彩管理軟體。
  19. Furthermore, the plasma optical emission spectra ( oes ) of the ionization of the working gases were analyzed in situ using a pr - 650 spectroscope

    此外，本文使用pr ? 650光譜光度計，對p室的等離子體輝光光譜（ oes ）進行了在線監測。
  20. The microstructures and physics properties of the sbn films were characterized by xrd, afm, sims, raman scattering, and spectrophotometer, electrical induced birefringence etc. the effects of growth parameters on the quality of sbn films were discussed, such as substrates, annealing temperature, and precursor solution, bufferlayer ( ksbn, mgo )

    用x射線衍射儀（ xrd ） 、原子力顯微鏡（ afm ） 、二次離子質譜（ sims ） 、受激拉曼散射、分光光度計、電致雙折射（自建系統）等方法對sbn薄膜的結構性能和物理性能進行了表徵。
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