縮率不勻 的英文怎麼說

中文拼音 [suōyún]
縮率不勻 英文
uneven shrinkage
  • : 縮構詞成分。
  • : 率名詞(比值) rate; ratio; proportion
  • : 名詞[書面語] (剁物所用的木墩) a block of wood
  • : Ⅰ形容詞(均勻) even Ⅱ動詞1. (使均勻) even up; divide evenly 2. (分出一部分) spare
  1. The model is tested by a typical die - cavity roughing, and shortening machining time and balancing cutting - load can be attained

    通過典型模具型腔的粗加工試驗驗證,證明該進給優化策略僅可以短加工時間,而且可以使加工載荷均
  2. Simulated results showed that the position and the evolution process of necks are influenced by tensile strain rates. uniform deformation covers only a small fraction of the total deformation. however, at the steady - like flow stage, restrictions and accommodations between scattered localizations promote large uniform deformation

    數值結果表明,頸的位置及發展過程受拉伸應變速影響,完全均變形在總變形中實際占份量較小,而似穩流動階段的分散性的相互牽制與協調,使敏感材料得以在接近均的狀態下經受大的變形。
  3. So in one hand it requires the wafer ' s diameter to be more large in order to enhance the productivity, and on the other hand it puts forward more strict requirement about the crystal perfection and electricity character. especially the electronic character and the equality of micro - area in the crystal wafer has become the key factor to determine whether the device can be made on it or not. so the resistivity measurement of micro - area become one most important procedure in the chip machining. to ensure the produce quality of chip and the perfect performance of final production, the four - probe testing technology need to be deeply studied

    圖形日益微細化,電路尺寸小,目前ic製造以8英寸、 0 . 13 m為主,預計在2007年左右將以12英寸、 65nm為主,這一方面要求圓片直徑斷增大以提高生產,另一方面對晶體的完美性、機械及電特性也提出了更為嚴格的要求。特別是微區的電學特性及其均性已經成為決定將來器件性能優劣的關鍵因素。因此,微區電阻的測試成為晶元加工之中的重要工序。
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