角膜散光計 的英文怎麼說
中文拼音 [jiǎomósǎnguāngjì]
角膜散光計
英文
keratometer- 角 : 角Ⅰ名詞1 （牛、羊、 鹿等頭上長出的堅硬的東西） horn 2 （古時軍中吹的樂器） bugle; horn 3 （形狀像...
- 膜 : 名詞1. [生物學] （像薄皮的組織） membrane 2. （像膜的薄皮） film; thin coating
- 散 : 散動詞1. （由聚集而分離） break up; disperse 2. （散布） distribute; disseminate; give out 3. （排除） dispel; let out
- 光 : Ⅰ名詞1 （照耀在物體上、使人能看見物體的一種物質） light; ray 2 （景物） scenery 3 （光彩; 榮譽） ...
- 計 : Ⅰ動詞1 （計算） count; compute; calculate; number 2 （設想; 打算） plan; plot Ⅱ名詞1 （測量或計算...
- 角膜 : [生理學] conea; cornea角膜白斑 keratoleukoma; walleye; albugo; leucoma; leukoma; 角膜薄翳 achlys;...
- 散光 : [醫學] astigmatism; astigmia散光燈 flood; floodlight; 散光光度計 light scattering photometer; 散...
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Corneal surfaces in eyes with regular astigmatism are thought to be toroidal surfaces. based on mathematical models for corneal surfaces before and after treatment, a corneal ablation model is given for such refractive errors as spherical myopia, compound myopic astigmatism, and simple myopic astigmatism. a similar corneal ablation model is also given for such refractive errors as hyperopia, compound hyperopic astigmatism, and simple hyperopic astigmatism
採用超環面（ toroidalsurface ）建立起規則散光下的角膜曲面模型方程;定量研究了手術光學區屈光不正兩種通用的矯正模型，一種模型適用於單純近視、復性近視散光、單純近視散光的矯正，另一種模型適用於單純遠視、復性遠視散光、單純遠視散光的矯正;另外，作為影響手術效果的重要因素，提出了一種用於光學區直徑和過渡區寬度均可調節時過渡區角膜切削量的計算模型。The phase structure of different cu - fe thin films were studied by using grazing incidence x - ray analysis ( gixa ). the texture and residual stress of different cu - fe thin films were measured by scan of x - ray diffraction ( xrd ) and 2 scan with different. the thicknesses of different thin films were characterized by means of small angle x - ray scattering ( saxs ) technique. by using atomic force microscope ( afm ) measured surface roughness of thin films. the component of different thin film was characterized by energy disperse spectrum ( eds ) and x - ray fluorescence ( xrf ). the magnetic properties of cu - fe thin films were measured by means of vibrating sample magnetometer ( vsm ). in addition, the giant magnetoresistance ( gmr ) effects of different films were also measured. the original resistance of the film fabricated by a direction - current magnetron sputtering system is directly affected by bias voltage
利用掠入射x射線分析（ gixa ）技術對不同cu - fe薄膜的相結構進行了研究;利用xrd掃描及不同角度的2掃描對薄膜進行了結晶織構及殘余應力分析;運用小角x射線散射（ saxs ）技術測量了薄膜的厚度;採用原子力顯微鏡（ afm ）觀察了薄膜的表面形貌;運用能量損失譜（ eds ）及x射線熒光光譜（ xrf ）對薄膜進行了成分標定;使用振動樣品磁強計測量了不同cu - fe過飽和固溶體薄膜的磁性能;最後利用自製的磁阻性能測試設備測量了真空磁場熱處理前後不同薄膜的巨磁阻值。
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