退火范圍 的英文怎麼說

中文拼音 [tuìhuǒfànwéi]
退火范圍 英文
annealing range
  • 退 : 動詞1 (向後移動) retreat; draw back; move back 2 (使向後移動) cause to move back; remove; wit...
  • : fire
  • : 名詞1 [書面語] (模子) pattern; mould; matrix 2 (模範; 榜樣) model; example 3 (范圍) boundar...
  • : Ⅰ動詞1 (四周攔擋起來 使裡外不通; 環繞) enclose; surround; corral 2 (繞; 裹) wrap Ⅱ名詞1 (四...
  • 退火 : [冶金學] anneal; annealing; back-out
  • 范圍 : scope; limits; extent; boundary; confines; range; range dimension; spectrum
  1. Besides, scan rate and cycle period also affect the result ; co - deposition of dualistic oxide is a focus of research, as an element in the same group, ir is selected. deposition rate of composition is decreased by the adding of ir composition, and when the proportion of ir exceeded 50 %, composition procession can be ceased. but cooperation of ir and ru oxide can highly increase the specific capacitance of active material ; annealing treatment under a certain temperature can help to change the hydrate ru composition into mixture state ru oxide, accordingly increase the stabilization of active material

    研究表明:電解液的配製過程中,氯化釕濃度、溶液ph值、陳化時間、溶液溫度對電鍍效果均有影響,其中溶液ph值是最主要的影響因素;在儀器的使用條件探索中,理論結合實驗確定了本電鍍液體系循環伏安電勢窗的理想,並發現循環伏安掃描速度和掃描周期對電鍍結果也有較大影響;混合氧化物的共沉澱是目前研究熱點,在此選用與釕同一族的銥作為共沉澱元素,銥的加入會阻礙氧化物的沉積速度,銥的比例超過50 %會使沉積作用停止,但是二元氧化物的協同作用使沉積的活性物質比容量大大提高;一定溫度下退后處理作用會使水合釕化物轉變成混合價態的氧化釕,從而提高活性物質的穩定性。
  2. We measured the samples " electrical properties ( square resistance, square carrier concentration, carrier mobility and hall coefficient ) at room temperature by hall measurement. the experimental results revealed that all the samples are p - type, with increasing the annealing temperature, the carrier mobility increased and the square carrier concentration decreased. these changes in electrical properties are explained by a decrease in the number of mn acceptors because of the forming of mnas phase and the resuming of lattice defects during annealing

    所有樣品均為p型導電類型;發現在650到850溫度內,隨著退溫度的升高,樣品的方塊載流子濃度呈下降趨勢,而載流子遷移率呈上升趨勢;這是由於在退過程中,隨著退溫度的升高,有更多的mn參與mnas相的形成,使得以替位受主形式存在的mn減少,並且晶格缺陷得到恢復所致。
  3. Water steam was used as oxidant, and the optimum water steam partial pressure is between 1 10 - 4 and 5. 5 10 - 4 pa. under the optimum growth parameters, a ceo _ 2 seed layer with highly textured degree was successfully prepared. beside the one step process was experimented in this dissertation, the two step process was proposed and studied to further improve the quality of ceo _ 2 seed layer. in the two step process, about 15 nm thick of ce metal layer was deposited on metallic substrate at the first step, then water steam was introduced in the chamber, and the ceo _ 2 thin films were subsequently deposited with reactive sputtering in the

    總結出沉積ceo _ 2薄膜的優化工藝條件,當沉積溫度為720 - 850 、水蒸汽分壓介於1 10 - 4 - 5 . 5 10 - 4pa之間、退時間40min時,獲得了織構程度良好的ceo _ 2種子層薄膜; 3 .由於一步法制備ceo _ 2種子層中水分壓狹窄,工藝條件難以控制,並且退延長了薄膜的制備時間,因此,本論文又採用了兩步生長法沉積ceo _ 2種子層,即:先在ni - w基帶上沉積一層約15nm的金屬ce薄膜,再通入氧化氣氛(水蒸汽) ,繼續進行薄膜沉積。
  4. In spite of these advantages, we should concentrate on how to extend the representation of modes, how to apply to unstructured grids, etc. and when combining pod and saa, it is necessary to know how to represent the shape and how to control the range of seeking and iteration number

    但在研究的過程中,我們發現正交分解方法也存在如下問題:如何增強基模態的表達能力,如何將該方法應用於非結構網格的計算等。在利用模擬退演算法結合解算器進行翼型反設計時,則需要考慮如何表達幾何外形形狀,怎樣控制搜索以及如何減小搜索次數等實際問題。
  5. The alloys, which were cold - worked followed by recrystallization annealing, display cyclic softening in the range of low strain because the cyclic stress - strain curve lies below the monotonic stress - strain curve, and show cyclic hardening in the range of high strain because the cyclic stress - strain curve lies above the monotonic stress - strain curve

    在低應變,冷加工后經再結晶退處理的錯合金的循環應力一應變曲線位於單調拉伸曲線的下方,表現為循環軟化;在高應變則位於單調拉伸曲線的上方,表現為循環硬化。
  6. Experimental results revealed that the carrier mobility increased with increasing of the annealing temperature, in the range of the annealing temperature from 650 ? to 850 ?, which implied that the crystal lattice structure was damaged by ion implantation and restored after annealing. furthermore, the square carrier concentration decreased, and the square resistance of the samples implanted by mn + and c increased with the raising of annealing temperature. these results indicated that the second phase such as mnga, mnas ferromagnets was formed by more mn + ions with increasing of the ( gaas ) annealing temperature, so the mn + ions which can provide carriers decreased

    由實驗結果可以知道在退溫度為650 850內,樣品的載流子遷移率隨著退溫度的提高呈上升趨勢,說明雜質元素的注入對樣品造成晶格損傷,但退對這些損傷具有修復作用;此外,隨著退溫度的上升,樣品的方塊載流子濃度不斷下降,加c樣品的方塊電阻不斷上升,這都是因為隨著退溫度的提高,摻入的mn ~ +離子不再提供載流子,而是形成了mnga 、 mnas等磁性第二相。
  7. Prepared technical parameters were optimized by l9 ( 34 ) experiment analysis. a unique method for cleaning and drying of substrate - cleaning used by scour, drying used by infrared light was fished out by large numbers of experiment. chemical mechnism of zno thin film prepared by sol - gel technique was discussed by dta for the first time. by the measurements of sem, xrd and uvs, the thin film was analysed. the result proved that the thin film with strongly preferred orientation of c - axis perpendicular to the substrate surface which surface was homogenous, dense and crackfree was the crystalline phase of hexagonal wurtzite. the thin film was composed of plentiful asteroidal crystal which crystal dimension approximately 10 30nm. the average transmittance of thin film in visible region was above 90 %. the results of measurements else also proved that the thickness of single dip - coating was 75 240nm, this films resistivity was found to be 3. 105 102 3. 96 105 ? cm. the thickness and resistivity of thin film influenced by dope - content, withdrawal speed, pre - heat - treatment, anealing were reseached respectively

    利用xrd 、 sem以及uvs光譜儀等分析方法對薄膜進行了研究,結果顯示,所制備的薄膜為六方纖鋅礦型結構,具有高c軸擇優取向性;表面均勻、緻密,薄膜材料由許多星狀晶粒組成,晶粒尺寸大約為10 - 30nm左右;薄膜可見光透過率平均可達90 % ;對薄膜厚度以及電學性能進行了測定后發現:單次鍍膜厚度約為75 - 240nm , al ~ ( 3 + )離子摻雜型氧化鋅薄膜的電阻率在3 . 015 102 - 3 . 96 103 ? cm內;分別研究了摻雜濃度、提拉速度、預燒溫度、退溫度等工藝參數對薄膜厚度和電阻率的影響。
  8. The size variation of annealed nanoparticles was studied with the treatment temperature. the result shows that, for the size of 11nm zns nanoparticles, they grow up dramatically when the treatment temperature exceeding 600, and have been 3 - 5 um when the treatment temperature increasing to 900

    藉助x射線衍射技術和掃描隧道電鏡等實驗手段,系統研究了zns納米晶經過退處理后尺寸隨溫度的變化關系,給出了顆粒尺寸隨處理溫度急劇增大的溫度,從能量的角度解釋了退處理中顆粒長大的原因。
  9. The relationship between sputtering conditions and the depositional speed shows : with working pressure 1. 2 pa, sputtering power 180w, the depositional speed of tio2 thin film is 40nm / h, and increases with the increasing of sputtering power. it can be also founded that the depositional speed is nearly proportional to the working pressure : within the range of 0. 3pa to 1. 6pa, the depositional speed increases linearly with the increase of ar pressure. with the enhancement of the substrate ' s temperature of sputtering or annealing, the resulted thin films show a tendency of decreasing in thickness, and increasing in refractivity

    本實驗是採用磁控濺射方法,在不同的溫度下制備了tio _ 2薄膜,並對薄膜進行了不同溫度和時間的退處理,通過原子力顯微鏡( afm ) 、 x射線衍射( xrd ) 、掃描電鏡( sem )等檢測手段對薄膜的表面形貌和組成結構進行了分析,結果如下: ( 1 )濺射工藝條件與薄膜沉積速度的關系表明:採用1 . 2pa工作氣壓, 180w的射頻功率tio _ 2薄膜的沉積速率為40nm h ,並隨射頻功率的增加而提高,呈近似的線性關系,在0 . 3pa 1 . 6pa氣壓中,氬氣壓強升高沉積速率迅速增加,濺射溫度提高和退處理能使薄膜的厚度減小和折射率提高。
  10. In czochralski silicon crystals ( czsi ) through fast neutron irradiation, formation and conversion of defects were investigated using fourier transform infrared spectroscopy ( ftir ), positron annihilation technology ( pat ) and scanning electron microscope ( sem ). the results showed that fast neutron irradiation induced large quantity of metastable defects which can be the capture centers of positron, positron annihilation average lifetime of samples increased with increasing of irradiation dosage. positron annihilation average lifetime of irradiation samples through dosage up to 1 1018 n. cm - 2 tended to constant

    本文對直拉硅樣品進行了不同劑量的快中子輻照,在硅中引入大量的亞穩態缺陷,研究這些亞穩態缺陷的形成,並在較寬的溫度內對輻照樣品進行了退處理,研究退后亞穩態缺陷的轉化及同硅中氧的相互作用,應用傅立葉變換紅外光譜技術( ftir ) 、正電子湮沒技術( pat )和掃描電鏡( sem )進行了測試。
  11. Hebei galvanized wire factory is a manufacture expert in producing galvanized wire series products including : hot - dipped galvanized iron wire from 0. 19mm to 25. 0mm ; electro galvanized iron wire ranging from 0. 14 to 5. 0mm ; annealed iron wire from 0. 35mm to 4. 0mm ; big coil galvanized iron wire of 2203lb maximum per coil

    本廠已有二十幾年的經營鐵絲的經驗,所涉及產品包括:電鍍鋅絲熱鍍鋅絲軸絲u型絲鐵絲和光亮退絲。工廠配有先進的制絲設備和驗絲體系。
  12. For the plct ( x ) thin films of 46nm thickness annealed at 700 ?, even though the scanning area is 10 ? m, the surface roughness is still below 5 nm

    Sum左右,在經過700 』 c退后,當其掃描為10um時,表面粗噪度仍在sum以下6
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