電子器件測試 的英文怎麼說
中文拼音 [diànziqìjiàncèshì]
電子器件測試
英文
electron device testing- 電 : Ⅰ名詞1 (有電荷存在和電荷變化的現象) electricity 2 (電報) telegram; cable Ⅱ動詞1 (觸電) give...
- 子 : 子Ⅰ名詞1 (兒子) son 2 (人的通稱) person 3 (古代特指有學問的男人) ancient title of respect f...
- 器 : 名詞1. (器具) implement; utensil; ware 2. (器官) organ 3. (度量; 才能) capacity; talent 4. (姓氏) a surname
- 件 : Ⅰ量詞(用於個體事物) piece; article; item Ⅱ名詞1. (指可以一一計算的事物) 2. (文件) letter; correspondence; paper; document
- 測 : 動詞1. (測量) survey; fathom; measure 2. (測度; 推測) conjecture; infer
- 試 : 名詞(古代占卜用的器具) astrolabe
- 電子 : [物理學] [電學] electron
- 測試 : test; testing; checkout; measurement
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In this dissertation, by virtue of self - developed test system, the studies on the optical and electric properties of oled of little molecule with different material, configuration manufactured with different processes have been presented. concepts of chromatics and the mechanism of carrier transportation in the semiconductor device have been applied here to qualitatively analysis and interpret the result of measurement. some interesting conclusions have been given which will be helpful in the further optimization of the performances of oled
在oled研究過程中,對器件性能的表徵工作起到十分重要的作用,本文利用自主開發的測試平臺(包括軟體、硬體的搭建) ,對不同材料、結構、工藝的小分子oled器件進行了光學、電學性能的測試和評估,並依照色度學、半導體電輸運等理論成功的對測試結果作出了定性分析,揭示了制約器件工作性能的相關因素,為器件性能的進一步優化奠定了基礎、指明了方向。In this paper, we study an alternative approach by numerical calculation. at first, we introduce the fundamental principles and the basic components of the electron linear. second, we introduce a way of coupler testing - - three frequency method. and present a example of coupler testing. third, we use numerical calculation method to simulate several accelerator structures. the hfss code and mafia code is used to simulate a three - cavity accelerator structure. the two results are compared
因此,尋找好的方法來設計加速結構耦合腔很重要。本文首先介紹了電子直線加速器的各相關基本理論和其基本組成部件。接著,介紹了現階段耦合腔測試中常用的一種方法? ?三頻法,並給出了測量加速器耦合腔的實例。Test methods for determining hermeticity of electron devices with a helium mass spectrometer leak detector
用氦質譜儀檢漏器測定電子元件密封性的試驗方法Test methods for microbiological monitoring of water used for processing electron and microelectronic devices by direct pressure tap sampling valve and by the presterilized plastic bag method
用直接加壓分接抽樣閥和用預先消毒塑料包法對電子和微電子器件加工用水微生物監測的測試方法The high precision single electron devices testing system with precision temperature controller, electronic characteristic testing and high magnetic field has been established
建立了高精度單電子器件測試系統。系統具有良好的溫度控制、精確的電學特性測量和可加高強度磁場等性能。Functional test : the electrical testing of an assembled electronic device with simulated function generated by the test hardware and software
功能測試:通過測試硬體和軟體對組裝電子器件進行的摸擬功能電測試。This paper presents a method of test, estimation and predication of some state parameters of the power unit in power and electric equipment, these parameters can be temperature, voltage, current and so on ; when attaining the values of these parameters at the next state, whether the power unit will go into the malfunction or not can be knew, according to the result, some measures can be made ; by controlling the values of correlative parameters, the unit could be maintained in its optimal running status ; so the damage to the power unit can be prevented, the running quality of the driving system can be guarantied, and the optimized control level of the system can be improved
本論文提出了一種利用預測估計的方法,對電力電子設備中的功率器件的某些主要狀態參量(如:溫度、電壓和電流)進行測試、估計並預測,從而得出未來的運行狀態;然後據此判斷該功率器件是否已進入故障范圍,以便提前採取措施,通過對相關參數的調整來保證功率器件始終工作在最佳狀態;這樣,既避免了功率器件損壞的發生,又避免了驅動系統故障狀態的出現,明顯地提高了系統優化控制的水平。Tld standard practice for application of thermoluminescence - dosimetry systems for determining absorbed dose in radiation - hardness testing of electronic devices
電子器件輻射硬化試驗中測量吸收劑量用的熱致發光劑量測量It has broad application prospect in the following fields such as microelectronics, photoelectronic devices, large screen flat panel display, field emitter array, acoustic surface wave device, photon crystal, light waveguide array, holographic honeycomb lens and micro - optical element array, micro - structure manufacture, fabrication of large area grating and grid of high resolution, photoresist performance testing, profile measurement and metrology, etc. the paper only involves the primary research of interferometric lithography
在微電子、光電子器件、大屏幕平板顯示器、場發射器陣列、表面聲波器件、光子晶體、光波導陣列、全息透鏡和微光學元件陣列、微結構製造,高分辨、大面積光柵和網格製造,在抗蝕劑性能測試、面形測量和計量等領域,干涉光刻技術都具有廣闊的應用前景。If your web application involves sending e - mail messages, you must have access to the iis smpt virtual server to test e - mail because the asp. net development server cannot forward e - mail messages or invoke a server that does
如果您的web應用程序涉及發送電子郵件,則必須具有iis smpt虛擬服務器的訪問權以測試電子郵件,因為asp . net development server不能轉發電子郵件或調用可以轉發郵件的服務器。Otherwise, using the ta buffer layer can effectively reduce the surface roughness. in addition, measured by our measurement system, the polycrystalline the film has similar negative magnetoresistance effect to single - crystalline film, so it is potential to be applied in spintronic devices
通過磁電子輸運測試系統研究制備的薄膜還發現多晶fe _ 3o _ 4具有同單晶fe _ 3o _ 4類似的負磁電阻特性,因此有望將多晶fe _ 3o _ 4薄膜應用到自旋電子器件中。According to the working condition of electronic element, a testing system established to test the temperature variety of the electronic element surface on several kinds of radiator which designed on different structure under different working condition. on the basic of the experimental results, integrated theoretical model established which include three part : heat simulation copper block, two - phase closed thermosyphon and heat sink
根據電子器件的運行工況,建立了散熱器性能測試系統,並對所設計的不同型式的熱管型電子器件散熱器進行了在不同工況下的性能實驗,比較了在熱流密度、風速、風溫等實驗工況發生改變的情況下各型式的熱管型電子器件散熱器中電子器件表面溫度的變化規律。This paper introduced principle of magnetism - photo optical - fiber electric current measurement system, and designs a digital magnetism - photo optical - fiber electric current meter. with the development of optical - fiber technology and electronic components reliability, the magnetism - photo electric current detection method will be used more widely
論述了磁光式光纖電流測試系統的原理,並設計了一種數字式磁光光纖電流計,該裝置所運用的測量方法是電力系統中高壓大電流測量技術的一個新方向,隨著光纖技術和電子器件可靠性的發展,磁光式電流檢測技術可望得到推廣使用。Standard test methods for measuring pull strength of microelectronic wire bonds
微電子器件金屬絲連接抗拉強度測量的標準試驗方法Passive electronic component parts - test method 14, panel seal test
無源電子元器件.測試方法14 :板的密封試驗The present method for testing aging and breaking - down property of polymer is usually carried out by testing its electrical property. this conventional is of low reliability. this paper has established a new method for testing the aging and breaking - down property of polymer to develop new types of insulating materials by probing the electroluminescence of insulated polymers, which is in the highest flight at home
目前國內普遍採用的檢測絕緣聚合物擊穿性能的方法是測試其電性能,這種方法可靠性較低;本文提出了用探測電致發光來檢測電介質老化、擊穿性能的方法,重點研製了用於探測電致發光的單光子計數器,經測試計數器各部件性能良好,具有經濟實用的特點。Discrete semiconductor devices and integrated circuits part 5 - 3 : optoelectronic devices measuring methods
半導體分立器件和集成電路第5 - 3部分:光電子器件測試方法The integration of wireless acceleration sensor for structural global monitoring, the integration of wireless strain sensor for structural local monitoring, their corresponding network ’ s topological strucuture, the network ’ s communication protocol, saving energy and the network ’ s experiments are studied systemly, the main contents include : 1. for strucutal global monitoring, the electronics components are compared, anlysysed and seleced. on this base, the design modulization method is used for designing and debugging sensing disposal module, micro - processing module, wireless transceiver module and power module, and thus a wireless acceleration sensor node with digital interface is integrated using the above modules
本文在充分研究傳感技術、信號處理技術、無線通信技術的基礎上,針對土木工程結構整體性態監測的無線加速度傳感器集成、結構局部性態監測的無線應變傳感器集成以及相應的無線傳感器網路拓撲結構、網路通信協議、網路能耗處理、網路試驗等問題進行了系統的研究,主要研究內容如下: 1 .針對結構整體性態監測的需要,從設計的小型化、低功耗、低成本、高可靠性角度出發,對相關電子器件進行了比較、分析、選擇;在此基礎上,採用模塊化設計方法,對傳感處理模塊、微處理模塊、無線收發模塊以及能源模塊分別設計、調試,進而集成了基於數字介面的無線加速度傳感器節點。However, this module exposes some questions gradually along with the developed electronics and increasement of practical requirement. the main questions are that the measurement precision and measurement range of frequency could not meet higher and higher practical requirement, some electronic components adopted have stopped production or could not keep up with the era development, poor integration of digital circuits and the comparative level value could not be set with the actual requirement
但隨著電子技術的發展和實際需求的提高,該模塊也暴露出一些問題,主要是測量精度和測量頻率的范圍已不能滿足日益提高的實際要求、所採用的一些電子器件已經停產或者跟不上時代發展的需要、數字電路集成度較差和隔離測試通道中的比較電平值不能隨實際需求進行設置。Altrec automatic life testing and recording of electronic components
自動化電子器件壽命測試與記錄分享友人