area spectroscopy 中文意思是什麼
area spectroscopy
解釋
面源分光- area : n. 1. 面積；平地；地面。2. 空地；〈英國〉地下室前的空地。3. 地區，地方；〈比喻〉區域；范圍。
- spectroscopy : n. 【物理學】分光術，光譜學。n. -ist
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The structures and characteristics of several graphite samples are measured by means of powder x - ray diffraction ( xrd ), brunauer - emmer - teller ( bet ) surface area measurement, inductively coupled plasma ( icp ) spectroscopy, particle size analysis and electrochemical measurements. the effects of origin, structure, impurity, particle size, specific surface area of carbon materials on the electrochemical characteristics are studied. a synthetic graphite with abundant resources, low cost and favorable performance is determined as the raw material for modification of graphite
採用xrd 、 bet 、 icp 、激光粒徑分析及電化學性能測試等方法，對國內外多種典型石墨樣品的結構與性能進行比較，研究石墨材料的來源、晶體結構、雜質含量、顆粒大小、比表面積等因素對其充放電性能的影響，確定一種性能較好、價格低廉、來源廣泛的普通人造石墨粉作為熱處理與摻雜改性、以及復合結構炭材料研究的原材料。 -
Abstract : positron spectroscopy is a new and sensitive microanalytical probe for characterization of polymer microstructures. we report recent advances in this area, including studies on the free volume properties, structural transition, miscibility of blending polymers, physical aging, doping of functional polymers, interfacial interaction of multiphase polymers, etc
文摘:簡要介紹了近年來正電子譜學在聚合物微結構研究中的主要應用及進展.大量實驗事實表明，正電子譜學是表徵高聚物微結構的極靈敏方法 -
The mechanical parameters at high temperatures - reduction in area ( ra % ) and tensile strength ( o b ) are measured by means of gleeble - 2000 thermal simulating machine. fracture surfaces are analyzed by scanning electron microscopy and optical microscopy. the segregation of sn is also examined by auger electron spectroscopy
通過測定試驗鋼種的高溫力學參數（斷面收縮率ra和抗拉強度_ b ） ，觀察金相顯微組織，分析掃描斷口形貌，測試第二相析出物和俄歇能譜試驗等方法，研究了殘留元素sn及冷卻速率對高溫力學性能的影響。 -
More recent studies show nanowires products with narrow dismeter distribution around 5 - 10mn and lengths ranging from several hundred nanometers to several micrometers can be obtained if the mixture solution of naoh and koh was replaced by koh solution. the nanowires were analyzed by a range of methods including powder x - ray diffraction ( xrd ), high resolution electron microscopy ( hrem ), selected area electron diffraction ( saed ), electron energy loss spectroscopy ( eels ), xrd and hrem image simulations. the structure of nanowires is determinded to be of the type of k2ti6oi3
利用x射線衍射（ xri ） ） 、高分辨電子顯微鏡（ hrtem ） 、選區電子衍射（ saed ） 、電子能量損失譜（ eels ）以及x射線衍射和高分辨像模擬等分析測試手段，初步分析了這種納米線的生長機理，探討了她的結構和光學性能，實驗結果顯示這種納米線具有kzti6o ; 3的結構，紫外一可見光吸收光譜顯示， kzti6ol3納米線禁帶寬度約為3 . 45ev 。
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