atom force microscope 中文意思是什麼
atom force microscope
解釋
原子力顯微鏡- atom : n. 1. 原子。2. 微粒；微量。
- force : n 1 力，勢。2 體力，氣力，精力，魄力。3 暴力，壓力；兵力，武力。4 〈pl 〉 部隊，軍隊，兵力。5 勢...
- microscope : n 顯微鏡。 a binocular microscope 雙目顯微鏡。 an electron microscope 電子顯微鏡。 a field ion em...
-
Atom force microscope
原子力顯微鏡 -
( 2 ) the images of aam were characterized by scanning electron microscope ( sem ), transmission electron microscope ( tem ) and atom force microscope ( afm ). the results indicated that pores in the as - prepared aam templates owned nearly the same diameter, parallel arrangement, huge density and formed nano - pore arrays
（ 2 ）用sem 、 afm和tem等分析方法對aam的形貌進行了表徵，結果表明：制得的aam中含有大小均勻一致、排列規整、密度較大的納米孔陣列，為模板-電沉積法制備cdse納米線陣列奠定了良好的基礎。 -
The properties of thin films have been investigated with modern analysis technique, such as afm ( atom force microscopy ), sem ( scanning electron microscope ), xrd ( x - ray diffraction ) and rocking curve ( - scan ). and the properties of ybco thin film and its substrate and deposition temperature have been analysed, comparing with lao substrate ' s crystallization quality, ybco thin film properties, such as morphology and degree of grain alignment, was concluded to correlate with the crystal orientation uniform of lao substrate as revealed by xrd
本文結合afm 、 sem研究ybco薄膜的表面形貌， xrd 、 fwhm分析薄膜的結晶情況，並結合成膜溫度和基片的質量進行一系列結構與性能的對比研究，發現laalo3 （ lao ）基片的質量對ybco薄膜的結構完整性有很大影響，不僅影響了薄膜的c軸取向性，而且影響了ybco的超導性能。
分享友人