atom probe 中文意思是什麼
atom probe
解釋
原子探測器。-
Given the voronoi diagram of atoms based on the euclidean distance from the atom surfaces, the proposed algorithm first computes a - beta - shape with an appropriate probe
由於一個氨基酸由一組原子組成，一種蛋白質可以由表示為原子的一組三維剛性球來建模。 -
In the present research, scanning electron microscope ( sem ), laser raman spectroscopy ( lrs ), x - ray photoelectron spectroscopy ( xrs ), x - ray diffraction ( xrd ) and electron probe micro analysis ( epma ) were utilized to investigate the difference in micro - structure and elements distribution between domestic and foreign pdcs. combined with analysis on current manufacturing process, the mechanism for the difference was discussed. scanning electron microscope ( sem ), laser granularity analysis, atom emission spectroscopy ( aes ) and plasma emission spectroscopy ( icpaes ) are also utilized to investigate the grain shape and impurities of key material - diamond power
本課題採用掃描電鏡、拉曼光譜、光電子能譜、 x -射線衍射分析、電子探針等方法分析了國內外聚晶金剛石-硬質合金復合片在微觀組織結構、元素成分分佈方面的差異，結合對現有燒結工藝的分析，研討了造成這些差異的機理；採用掃描電子顯微鏡、激光粒度分析、原子發射光譜、等離子發射光譜等方法對關鍵原材料-金剛石微粉的晶形、雜質含量進行了比較分析測試。 -
Spm ( scanning probe microscope ) is an international surface analytic instrument rising up in recent years, and the distinguishability can reach nanometer level even atom level but this instrument is so exact and expensive, and it is very difficult for most beginners
掃描探針顯微鏡（ scanningprobemicroscope ， spm ）是國際上近年發展起來的表面分析儀器，它們的解析度可達到納米級甚至是原子級。 -
Fabrication of nanostructures based on spm as an extension to spm imaging, referred to as scanning probe nanofabrication ( spn ) is an emerging technique undertaken at labs in the past ten years that comprises manipulation of atom or molecule in a bottom - up paradigm and scanning probe lithography ( spl ) in a top - down paradigm. in chapter one, in the light of decentralized experimental data in this respect, the author, classify in an analytic approach the literature concerned as electrical spl, mechanical spl, thermal spl, and optical spl in terms of different mechanisms of interplay between a probe and a surface of a sample, after describing the most important of this type of microscopy, i. e., scanning tunneling microscopy and atomic force microscopy
由於這項技術的實驗數據比較分散，因此，作者在論文的第一章里首先介紹了掃描探針顯微鏡的兩個最重要的類型，即掃描隧道顯微鏡和掃描原子力顯微鏡的工作原理；然後根據加工方式的不同把它分為自下而上的掃描探針原子（分子）操縱與自上而下的掃描探針刻蝕兩大類；而根據掃描探針與樣品的不同作用機理，對掃描探針刻蝕加工又進行了歸納與綜述，對其特殊的加工方法作了原理性的介紹，並分析了目前存在的共性問題與應用前景。
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