atomic force microscope 中文意思是什麼

atomic force microscope 解釋
原子間力顯微鏡
  • atomic : adj. 1. 原子的。2. 極微的。3. 強大的。
  • force : n 1 力，勢。2 體力，氣力，精力，魄力。3 暴力，壓力；兵力，武力。4 〈pl 〉 部隊，軍隊，兵力。5 勢...
  • microscope : n 顯微鏡。 a binocular microscope 雙目顯微鏡。 an electron microscope 電子顯微鏡。 a field ion em...
  1. In this paper, the flow pattern defects ( fpds ) were revealed by secco etchant and their shape, distribution on wafer and tip structure were studied in details by optical microscope and atomic force microscope ( afm ). the relationship between etching time and the tip structure of fpds was also discussed. furthermore, by studying the effect of rapid thermal annealing ( rta ) on the density of fpds in ar, the annihilation mechanism of fpds was discussed in this paper

    本文將cz硅單晶片在secco腐蝕液中擇優腐蝕后，用光學顯微鏡和原子力顯微鏡對流動圖形缺陷（ flowpatterndefects ， fpds ）在矽片中的形態、分佈及其端部的微觀結構進行了仔細地觀察和研究，並討論了腐蝕時間對fpds缺陷端部結構的影響；本文還通過研究ar氣氛下快速退火（ rapidthermalannealing ， rta ）對fpds缺陷密度的影響，初步探討了fpds的消除機理。
  2. Surface microtopography, representation and tracing of nacreous layers of pteria penguin and blister pearl from sanya, hainan province, are studied by using interference microscope and environmental scanning electron microscope and atomic force microscope

    摘要採用干涉顯微鏡、環境掃描電子顯微鏡、原子力顯微鏡對海南三亞企鵝貝及其附殼珍珠的珍珠層表面微形貌進行了研究。
  3. Abstract : molecular deposition ( md ) film, a nano film, is assembled by the interaction of static charge between cationic and anionic compounds. the micro - friction properties of an md film on silica has been studied with atomic force microscope ( afm ). it has been found that the md film has lower coefficient of friction as compared with the original surface of silica. moreover, based on the analyses of the surface force versus distance curves, photographic image, friction force image, and modulated force image, it is concluded that the friction reduction effect of md film on silica is attributed to the surface adhesion reduction and surface micro - modification

    文摘:利用原子力顯微鏡對石英巖表面單層分子沉積膜的微觀摩擦特性進行了研究，發現該分子沉積膜具有一定的減摩性.通過對其表面力-位移曲線、表面形貌像、調制力像和摩擦力像的進一步分析表明，石英巖表面分子沉積膜具有減摩作用的原因在於它能夠降低表面的粘著力並對表面具有微觀修飾作用
  4. Application of atomic force microscope on polymer study

    原子力顯微鏡在材料研究中的應用
  5. The application of atomic force microscope for materials

    原子力顯微鏡在生物醫學中的應用
  6. The application of atomic force microscope in dna research

    原子力顯微鏡在生物學研究中的應用進展
  7. Progress in biological application of atomic force microscope

    原子力顯微鏡在生物醫學研究中的應用
  8. The application of atomic force microscope to clay minerals

    原子力顯微鏡在粘土礦物學研究中的應用
  9. Application progress of atomic force microscope to polymer science

    原子力顯微鏡在高分子領域的應用進展
  10. Improved atomic force microscope imaging in liquid with active probe

    壓電探針應用於原子力顯微鏡液體成像的研究
  11. Afm, atomic force microscope

    原子間力?微鏡
  12. Investigation of the diamond tip wear of an atomic force microscope in micro - machining

    碳納米管原子力顯微鏡針尖的研究
  13. Atomic force microscope, afm

    原子力顯微鏡
  14. Besides, the growth of gasb expitaxy film was monitored by reflection high energy electron diffraction ( rheed ). the rheed images and intesity oscillation are collected by computer system. it showed that the gasb film prepared in 400 was amorphous and it became monocrystalline when the temperature rose to 500. atomic force microscope ( afm ) was applied to analyse the surface morphology of the films which were grown in diffrent growth rates or substrate temperature. the analysis were compared to simulation results. the experiment results indicated it was easy to form clusters when the rate of growth is high or

    此外，本文通過反射式高能電子衍射（ rheed ）監測了gasb外延薄膜的生長，利用rheed強度振蕩的計算機採集系統實現了rheed圖像和rheed強度振蕩的實時監測。實驗發現在400生長的gasb薄膜為非晶態，溫度升高到500薄膜轉變為單晶。利用原子力顯微鏡對不同生長速率和襯底溫度生長的gasb薄膜的表面形貌進行觀察分析，並與模擬結果進行比較。
  15. The substrates modified by polylysine ( polylysine - substrate ), 3 - aminopropyltriethoxylsilane ( apts - substrate ) and 3 ' - glycidoxypropyltrimethoxysilane ( gops - substrate ) were imaged by atomic force microscope ; the microarrays, which were printed by microspotting device or microchannels on the modified substrates, were observed by fluorescence microscope

    摘要應用了多聚賴氨酸以及硅烷化試劑3 -氨丙基三乙氧基硅烷和3 - （ 2 ， 3環氧丙氧）丙基三甲氧基硅烷修飾硼玻璃襯底，並用微點陣點樣儀和微通道在其上印刷微點陣。
  16. The surface morphologies of thin films were observed by using scan electron microscope ( sem ) and atomic force microscope ( afm ). based on grazing incidence x - ray diffraction ( gixrd ) equipment, we find that residual stress exist in magnetron sputtering plct film, in addition, the ferroelectric properties of plct thin films were measured by radiant premier lc type multifunctional ferroelectric properties test system

    利用廣角x射線衍射技術對不同濺射工藝下plct薄膜的相結構進行了研究;採用掃描電子顯微鏡（ sem ）和原子力顯微鏡（ afm ）分別觀察了薄膜的表面形貌;利用掠入射x射線衍射（ gixrd ）測量了薄膜的殘余應力。
  17. The gettering processes usually are estimated by gettering of au to nanocavity in silicon. in this paper, the characteristics of nanocavity gettering mechanism, diffusion and distributing of aurum and ion implantation in silicon were described. in this work, many bumps on the polishing surface of the silicon, after a he + impantation in and subsequently a hot - treatment, were observed using atomic force microscope ( afm )

    我們注意到，在研究氫、氦離子注入誘生微孔的吸除作用時多以對金雜質的吸除效果來對吸除工藝進行評估，因此本文對微孔吸除機理、金在硅中的擴散和分佈以及半導體中離子注入的特點進行了描述。
  18. Determined by dsc. whereafter, the surface micro - morphology of both sides of tini sma thin film deposited on glass was investigated by atomic force microscope ( afm ), and the difference of morphology between the two sides is observed. it has been shown that, in the growing surface of sputtered tini film, the trend of grain to accumulating along the normal direction like a column is clearly observed, and the grain is very loose which resulted in more microcavities, but in the surface facing to glass substrate, grain is so compact that there are hardly microcavities

    通過濺射法，在玻璃襯底上淀積了tini薄膜，並在600進行了真空退火， dsc法測得其馬氏體逆相變峰值溫度為75 ，利用原子力顯微鏡，對玻璃基tini形狀記憶合金薄膜的襯底面與生長面進行了表面微觀形貌分析，發現：生長面晶粒呈現出沿薄膜法線方向柱狀堆積的趨勢，晶粒緻密性差，微孔洞多；而襯底面晶粒緻密，幾乎沒有微孔洞存在。
  19. In examining samples, we measured composition and bonding by chemical analyzer and raman spectrum, and measured surface by atomic force microscope

    在試片的檢測部份，我們利用了化學分析電子儀及拉曼光譜儀分析薄膜之元素組成及其鍵結，並且用原子力顯微鏡觀察其表面形貌。
  20. Application of atomic force microscope in study of microbiologically influenced corrosion

    技術在微生物腐蝕研究中的應用
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