atomic scattering 中文意思是什麼

atomic scattering 解釋
核擴散
  • atomic : adj. 1. 原子的。2. 極微的。3. 強大的。
  • scattering : adj. 1. 分散在不同方向的，分散在不同范圍的。2. 廣泛擴散的。3. （選票）數量分散的，不集中的。n. 1. 散亂。2. 在媒介質中的散播。3. 【物理學】散射。adv. -ly
  1. Therefore, in principle the scattering may be predicted from measurements of the surface profile. in this paper the author also discussed nonspecular scattering for mo / si multlayer coated primary and secondary mirrors of the measured schwarzschlid optics based on power spectral density of these mirrors measured by both optical profilometer ( wyko ) and atomic force microscopy ( afm )

    因此，我們可以通過檢測多層膜反射鏡基底的粗糙度來表徵多層膜反射鏡非鏡面散射對光學系統性能的影響，亦即通過檢測多層膜反射鏡基底的粗糙度調整拋光工藝參數，獲得低散射的多層膜反射鏡。
  2. In the focal plane of z = 0, the smaller the dss of the fhb, the higher the optical potential, and the greater the corresponding optimal detuning 8, which are beneficial to atomic lens because it cannot only be profitable to obtain an atomic lens with a higher resolution, but also helpful to reduce the spontaneous emission and photon scattering effects of atoms in the fhb

    在焦平面上，聚焦中空光束的dss越小，光學勢越大，相應的最佳失諧量越大，這對原子透鏡的性能越有利。因為這不僅容易得到高解析度的原子透鏡，而且還可以減少在聚焦中空光束中原子的自發輻射和光子散射效應。
  3. The phase structure of different cu - fe thin films were studied by using grazing incidence x - ray analysis ( gixa ). the texture and residual stress of different cu - fe thin films were measured by scan of x - ray diffraction ( xrd ) and 2 scan with different. the thicknesses of different thin films were characterized by means of small angle x - ray scattering ( saxs ) technique. by using atomic force microscope ( afm ) measured surface roughness of thin films. the component of different thin film was characterized by energy disperse spectrum ( eds ) and x - ray fluorescence ( xrf ). the magnetic properties of cu - fe thin films were measured by means of vibrating sample magnetometer ( vsm ). in addition, the giant magnetoresistance ( gmr ) effects of different films were also measured. the original resistance of the film fabricated by a direction - current magnetron sputtering system is directly affected by bias voltage

    利用掠入射x射線分析（ gixa ）技術對不同cu - fe薄膜的相結構進行了研究;利用xrd掃描及不同角度的2掃描對薄膜進行了結晶織構及殘余應力分析;運用小角x射線散射（ saxs ）技術測量了薄膜的厚度;採用原子力顯微鏡（ afm ）觀察了薄膜的表面形貌;運用能量損失譜（ eds ）及x射線熒光光譜（ xrf ）對薄膜進行了成分標定;使用振動樣品磁強計測量了不同cu - fe過飽和固溶體薄膜的磁性能;最後利用自製的磁阻性能測試設備測量了真空磁場熱處理前後不同薄膜的巨磁阻值。
  4. Resonance scattering spectroscopic study of silver atomic clusters

    銀原子團簇的共振散射光譜研究
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