burn-in system 中文意思是什麼

burn-in system 解釋
老化測試系統
  • burn : （burnt ，burned burnt burned）vt 1 燒；點（燭、燈等）。2 燒焦，燒壞；燒傷，燙傷；燒死；〈美國〉...
  • in : adv 1 朝里，向內，在內。 A coat with a furry side in有皮裡子的外衣。 Come in please 請進來。 The ...
  • system : n 1 體系，系統；分類法；組織；設備，裝置。2 方式；方法；作業方法。3 制度；主義。4 次序，規律。5 ...
  1. Deva - v series full dynamic diode bridge rectifier burn - in system

    - v系列二極體橋堆全動態老化系統
  2. Elea - vl series dsp ic high temperature dynamic burn - in system

    Elea - vl系列dsp集成電路高溫動態老化系統
  3. An alum is in concert with an economy and culture system ( dl + wl is mainly slash and burn agri - culture, while pf + dl + wl is hoe and plough agri - culture

    旱地+林地型主要是刀耕火種農耕文化，水田+旱地+林地型是鋤犁農耕文化，它們都屬于自給自足的農耕文化類型。
  4. Elet - v series integrated regulator burn - in system

    Elet - v系列三端集成穩壓器老化系統
  5. Our main products are environmental chambers, on - line reliability evaluation system, burn - in system and lcd processing equipment

    經銷產品主要包括各種模擬環境試驗設備、在線快速可靠性測試評估系統、半導體老化篩選設備、液晶熱處理設備。
  6. Rel122 high - temperature solid relay burn - in and test system

    Rel122固體繼電器高溫老煉監測系統
  7. Burn - in prevention system

    內置防衛系統
  8. Devc - v series high temperature capacitors burn - in system

    Devc - v系列電容器高溫老化系統
  9. Eled - v series power module high temperature burn - in system

    Eled - v系列電源模塊高溫老化系統
  10. Eled - vr series power module high temperature burn - in system energy recovery model

    Eled - vr系列電源模塊高溫老化系統能量回收型
  11. Elea - v series ic high temperature dynamic burn - in system

    Elea - v系列集成電路高溫動態老化系統
  12. Devr - v series high - temperature reverse bias burn - in system

    Devr - v系列高溫反偏老化系統
  13. Liquid burn - in system

    液體老化測試系統
  14. Pwd high power transistor burn - in system

    Pwd系列大功率晶體管老化系統
  15. Test burn - in system testing burn - in system

    老化測試評監系統
  16. Elec - v multi - functional burn - in system

    - v多功能綜合老化系統
  17. Typical uses of scanner switching include burn - in testing of components, monitoring time and temperature drift in circuits, and acquiring data on system variables such as temperature, pressure, and flow

    掃描儀切換的典型應用包括器件的老化試驗、電路的時間和溫度漂移監測，以及採集系統的參數數據，例如溫度、壓力和流量。
  18. Elet - v series integrated regulator burn - in system pmwd - v series burn - in system for microwave transistor devices

    Elet - v系列三端集成穩壓器老化系統
  19. Wafer burn - in system

    晶圓老化測試系統
  20. Hardware burn in test function execution. the whole system computer lift test for 24 - 48 - 72. hours, combine software with hardware

    一部電腦在做24 - 48 - 72小時壽命測試時，除了用測試軟體，套裝軟體
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