diffraction contrast theory 中文意思是什麼
diffraction contrast theory
解釋
衍襯理論- diffraction : 分解
- contrast : n 1 對照，對比；（對照中的）差異。2 對立面，對照物；【攝影】反差。3 【修辭學】對照法。vt 使對照，...
- theory : n. 1. 理論，學理，原理。2. 學說，論說 （opp. hypothesis）。3. 推測，揣度。4. 〈口語〉見解，意見。
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The main works and contributions achieved in this dissertation are concluded as follows : 1. based on the scalar diffraction theory, the mathematical model of optical configuration of transmissive grating interferometer is established. it indicats that moir interference fringes is affected by many parameters, such as grating pitch, light wavelength, light beam size and incidence angle, etc. the variation that the width, intensity, orientation and contrast of moir interference fringes along with every parameter is numerically analyzed
主要的研究內容和所取得的成果可歸納如下: 1 .基於標量衍射理論，建立了透射式光柵干涉儀光路的數學模型，分析了透射式光柵干涉儀的莫爾干涉條紋與光柵柵距、光柵開口比、光波波長、光斑尺寸、光束入射角等多個參數的關系。 -
In order to study the thermal performance and residual stress of microelectronic subassembly, in this paper, a newly optical interferometry method for 3 - d displacement measurement is developed based on wavefront interference theory. in which the moire interferometry provide the in - plane displacement, but the system is different from the conventional interferometry, the system applies the double diffraction of the specimen grating, the in - plane displacement sensitivity is a factor of 2 higher than that of the conventional moire interferometer. twyman / green interferometry method for out - of - plane displacement measurement is adapted, the advantages of the optical set - up are structure novelty, and the fringe patterns of the displacement fields shown high contrast and spatial resolution
為了詳細研究試件的熱變形特徵以及殘余應力的影響作用，本文在波前干涉理論的基礎上，設計了一新型三維光學測試系統，該系統的平面位移測試基於雲紋干涉方法，但採用與普通雲紋干涉不同的光路系統，利用試件光柵和平面反射鏡組形成的兩次衍射，使平面位移干涉條紋倍增，測量靈敏度是普通雲紋干涉的2倍，系統的離面位移場測試採用泰曼格林干涉光路。 -
To carry out this analysis it is necessary for the experimentalist to have a working knowledge of the background theory of both image contrast and electron diffraction, since these fields form the basis for the interpretation of electron micrographs
要進行這種分析，試驗者必須同時擁有圖象對比和電子衍射的理論背景下的工作經驗，因為這些領域形成了電子毀損的解釋基礎。
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