electron diffractometer 中文意思是什麼
electron diffractometer
解釋
電子衍射譜儀- electron : n. 【物理學】電子。 the electron beam 電子束。 the electron theory 電子（學）說。
- diffractometer : 繞射儀
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High electron energy diffractometer hee
高能電子衍射儀 -
Using scanning electron microscopy, x - ray powder diffractometer, isis energy - dispersive spectroscopy and leica guantitative optical microscopy, the microstructure, composition profiles of cdmnznte ingots were analyzed, a and 3 phases are formed at the tip
採用掃描電鏡、 x射線粉末衍射儀、 isis能譜儀和leica定量金相分析儀研究了cdmninte晶錠中相的結構，形貌和組分分佈。 -
Low electron energy diffractometer lee
低能電子衍射儀 -
Utilizing the scanning electron microscope, x - ray diffractometer, type 9310 microporosity analyzer, the microstructure and chemical composition of mudston, and its macro - variation of physical and mechanical character are measured and analysed, the mechanism of mudstone degradation and softening in water is systematically studied in this paper
以掃描電子顯微鏡、 x射線衍射儀、 9310型微孔結構分析儀等先進的設備為測試手段，從泥巖的微觀結構及物質組成等方面入手進行研究，結合泥巖遇水后宏觀物理-力學性質的變化規律，全面闡述了泥巖遇水的崩解軟化機理。 -
Chapter 4 preparation of tio2 nano - films and its surface structural morphology tio2 nano - films were successfully fabricated by a sol - gel process on glass substrate. the morphology and microstructure of films were investigated via atomic force microscope ( afm ), x - ray diffractometer ( xrd ) and transmission electron microscopy ( tem )
凝膠法制備了tio _ 2納米溶膠，在不同的處理方式下以刮片法制幾種無機納米材料的制備、表徵與應用備了兩種ti仇多孔納米薄膜，並利用afm ， tem ， xrd等測試方法對膜表面結構及物理化學特性進行了表徵。
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