electron scanning beam 中文意思是什麼

electron scanning beam 解釋
掃描電子束
  • electron : n. 【物理學】電子。 the electron beam 電子束。 the electron theory 電子（學）說。
  • scanning : n. 1. 細看，細察，審視。2. 【電視】掃描，掃掠,搜索。
  • beam : n 1 梁，棟梁，桁條；（船的）橫梁。2 船幅；（動物、人的）體幅。3 （秤）桿，杠桿，（織機的）卷軸，...
  1. Ebs electron beam scanning system

    電子束掃描系統
  2. Acoustical holography by electron - beam scanning

    電子束掃描聲全息
  3. According to the principle of a new scanning electron microscope and the mechanism of the interaction between electron beam and solid target, the trajectories of an incident electron in a sample are simulated, a simulation program is compiled using the monte carlo method, and the backscattering coefficients corresponding to different parameters of the sem are obtained

    摘要根據新型分析掃描電子顯微鏡的工作原理及載能電子束和固體相互作用原理，利用蒙特卡羅方法模擬入射電子和靶物質的相互作用過程，編制了蒙特卡羅模擬計算程序，獲得了對應不同電鏡工作參數的入射電子背散射率。
  4. An electron beam, forming a scanning spot on the signal plate, zigzags its way, line by line, across the plate.

    在信號板上形成掃描點的電子束，逐條地曲折掃過信號板。
  5. The microfissuring behaviors in the heat - affected zone ( haz ) of electron beam ( eb ) welded nickel - based superalloy gh 4133 have been studied by using analytical scanning electron microscopy ( sem )

    摘要利用金相分析和掃描電鏡對鎳基高溫合金電子束焊接熱影響區微裂紋行為進行了分析。
  6. The spontaneous polarity was firstly observed by electron - beam bombardment and scanning electron microscope ( stm )

    利用電子束轟擊和掃描成像手段，首此觀察到了電氣石的自發極化導致的電極性。
  7. The interlayer fusion metallurgy technology based on electron beam scanning control

    基於電子束掃描控制的中間層熔煉技術
  8. Molecular beam epitaxy ( mbe ) has been used to grow insb heteroepilayer on gaas ( 001 ) substrate with optimized low temperature buffer layer. the surface morphology and crystal quality of insb epilayers have been investigated by means of atomic force microscope ( afm ), scanning electron microscopy ( sem ) and double crystals x - ray diffraction ( dcxrd )

    本文採用分子束外延（ mbe ）方法在gaas （ 001 ）襯底上優化低溫緩沖層生長條件制備了異質外延insb薄膜，採用原子力顯微鏡（ afm ） 、掃描電鏡（ sem ）與x射線雙晶衍射（ dcxrd ）等方法研究了insb / gaas薄膜的表面形貌與結晶質量。
  9. Although a simply constructed scanning - electron - microscope ( sem ) - based e - beam writer can not be on a par with the commercially available multi - million - dollar e - beam writers, it offers a cost - effective solution for the research and development laboratories

    在新元件研發過程中，往往希望能在短時間內不需光罩就可以作成奈米結構，電子束曝光技術提供了一套很適合這目的的解決方案。
  10. Standard practice for scanning electron microscope beam size characterization

    掃描電子顯微鏡射束尺寸特徵描述標準實施規程
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