fourier transform infrared (ftir) 中文意思是什麼
fourier transform infrared (ftir)
解釋
紅外線傅立葉變換-
Components, structure and surface morphology of the resulted films were identified by fourier transform infrared ( ftir ) spectroscopy, x - ray diffraction ( xrd ) and scanning electronic microscopy ( sem ). the analyses showed the content of cubic boron nitride in the resultant films on substrates was rather high and crystal particles of c - bn with uniform size, smooth crystal plane and regular shapes ( quadrangle and hexagon ) densely arrayed on the substrate
傅里葉轉換紅外吸收（ ftir ）光譜儀、 x射線衍射（ xrd ）儀和掃描電鏡（ stm ）的測量結果顯示，基底上的bn膜中立方相含量很高，且晶粒大小均勻、排列緻密，晶形呈規則的四角和六角形。 -
We believe the fine mechanical properties of tubular film are related to its fine chain orientation structure by using pole figure investigation and polarized fourier transform infrared ( ftir ) spectra analysis, the modes of orientation for flat and tubular films are obtained. it was found that the cellulose chains of the flat and tubular films have an uniplanar orientation mode with respect to the film surface
通過x衍射織構（極圖）分析和偏振紅外光譜分析建立了平膜和管膜的取向模型：平膜和管膜都有單平面取向；平膜中的分子鏈在膜表面內呈無規取向:管膜中的分子鏈則相對于拉伸方向有明顯擇優取向。 -
124 urinary stones obtained from boer goats, located goats, dogs, feline, pigs, scalper and chicken were analysed by fourier transform infrared ( ftir ) spectroscopy
摘要採用傅立葉變換紅外光譜法分析了124例不同動物的尿結石成分。 -
Either the boron nitride ( bn ) thin films with different cubic phase content were deposited on n - type si ( 111 ) and fused silica substrates by radio frequency ( rf ) sputtering using two - stage deposition process. the films were characterized by fourier transform infrared ( ftir ) spectroscopy. the transmittance te ( ) and reflectance re ( ) were obtained as a function of incident photo wavelengths and the thickness of films was measured by alpha - step. the absorption coefficient was calculated from te ( ) and re ( ). the optical band gap ( eg ) of the films was determined by effective medium form of formula containing eg
本文還研究了立方相含量與光學帶隙的關系，在n型si （ 111 ）片和熔融石英片上沉積出不同體積分數的立方氮化硼薄膜，薄膜的成分由傅立葉紅外吸收譜標識；用紫外-可見分光光度計測量了沉積在石英片上的bn薄膜的透射光譜te （ ）和反射光譜re （ ） ，薄膜的厚度用臺階儀測得。 -
The structure and properties of the emulsion was characterized by fourier transform infrared ( ftir )
採用傅立葉紅外光譜儀對合成的改性聚氨酯乳液進行了結構表徵。 -
Various factors affecting the refractive index and the deposition rate of the deposited films are studied to optimize growth conditions of the films. the microstructures and optical properties of the films are characterized by a prism coupler, a fourier transform infrared spectroscopy ( ftir ) and an atom force microscopy ( afm )
研究了薄膜折射率和淀積速率與工藝參數之間的關系，通過棱鏡耦合儀、傅立葉變換紅外光譜、原子力顯微鏡、掃描電子顯微鏡等測試手段，分析了薄膜的結構和光學特性。 -
X - ray photoelectron spectra ( xps ) and fourier transform infrared ( ftir ) have been used to analyze the deposited ps films
取上層懸液作電泳液，鋁片分別作正、負極， 200v cm電場下電泳20min 。 -
The results of attenuated total reflectance - fourier transform infrared ( atr - ftir ), x - ray photoelectron spectroscopy ( xps ) and contact angle measurement showed that the amphiphilic copolymer could self - segregate on the hydrophobic pdl - la surface
利用衰減全反射傅立葉轉換紅外光譜（ atr - ftir ） 、 x -射線光電子能譜（ xps ）分析以及接觸角測定對改性聚乳酸材料表面進行了表徵。 -
The structures of these prepolymers were characterized by fourier transform infrared ( ftir ) spectra. some influencing factors such as operation fashion, reaction temperature and catalyst on synthetic reactions were studied. through some repeated experiment, the optimum conditions of synthetic reactions were got
對影響合成反應的諸多因素如加料方式、原料配比、反應溫度、催化劑、阻聚劑等方面進行了研究，分別得到了適宜的合成條件，經過大量重復性實驗，驗證了這些合成條件的可靠性。 -
The fourier transform infrared ( ftir ) spectrum is an effective technology for studying the hydrogen content ( ch ) and the silicon - hydrogen bonding configuration ( si - hn ) of hudrogenated amorphous silicon ( a - si : h ) films. in the paper, ch and si - hn of a - si : h films, fabricated at different ratio of h2 / sih4 by microwave electron cyclotron resonance plasma chemical vapor ( wmecr cvd ) method, have been obtained by analyzing their ftir spectra that are treated by baseline fitting and gaussian function fitting. the effects of ratio of h2 / sih4 on ch and si - hn are studied
Fourier紅外透射（ ftir ）譜是研究氫化非晶硅（ a - si : h ）薄膜中氫含量（ c _ h ）及硅-氫鍵合模式（ si - h _ n ）最有效的手段，對于微波等離子體化學氣相沉積（ mwecrcvd ）方法在不同h _ 2 sih _ 4稀釋比下制備出的氫化非晶硅薄膜，我們通過紅外透射光譜的基線擬合、高斯擬合分析，得出了薄膜中的氫含量，硅氫鍵合方式及其組分，並分析了這些參數隨h _ 2 sih _ 4稀釋比變化的規律。 -
The structure properties of a - sinx : h are characterized and analyzed by using ellipsometry, fourier transform infrared ( ftir ) spectroscopy and x - ray photoelectron spectroscopy ( xps ), all the results suggest that the films with the structure of silicon dots / clusters embedding in silicon nitride matrix can be obtained by controlling the hwp - cvd conditions properly
利用橢偏儀，傅立葉紅外吸收譜（ ftir ） ， x射線光電子能譜（ xps ）等技術對a - sin _ x ： h的結構特性進行了表徵與分析，結果表明，採用hwp - cvd技術合理控制實驗條件，可得到鑲嵌在sin _ x中的納米si結構薄膜。 -
In czochralski silicon crystals ( czsi ) through fast neutron irradiation, formation and conversion of defects were investigated using fourier transform infrared spectroscopy ( ftir ), positron annihilation technology ( pat ) and scanning electron microscope ( sem ). the results showed that fast neutron irradiation induced large quantity of metastable defects which can be the capture centers of positron, positron annihilation average lifetime of samples increased with increasing of irradiation dosage. positron annihilation average lifetime of irradiation samples through dosage up to 1 1018 n. cm - 2 tended to constant
本文對直拉硅樣品進行了不同劑量的快中子輻照，在硅中引入大量的亞穩態缺陷，研究這些亞穩態缺陷的形成，並在較寬的溫度范圍內對輻照樣品進行了退火處理，研究退火后亞穩態缺陷的轉化及同硅中氧的相互作用，應用傅立葉變換紅外光譜技術（ ftir ） 、正電子湮沒技術（ pat ）和掃描電鏡（ sem ）進行了測試。 -
Fourier transform infrared ftir
傅立葉變換紅外測試ftir -
A laboratory - scale gasoline injector deposit simulator was developed to simulate deposit formation, and the fourier transform infrared ( ftir ) technique was used to analyze the deposit formation mechanism under various wall temperature
摘要建立了實驗室尺度的沉積物生成模擬裝置，並嘗試以ftir傅里葉轉換紅外線光譜法分析沉積物生成的化學機理，以探討不同壁面溫度下的噴嘴沉積物生成過程。
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