ion microscope 中文意思是什麼

ion microscope 解釋
場離子顯微鏡
  • ion : n. 【物理學】離子。 positive [negative] ion正[負]離子。
  • microscope : n 顯微鏡。 a binocular microscope 雙目顯微鏡。 an electron microscope 電子顯微鏡。 a field ion em...
  1. Field ion emission microscope

    場離子發射顯微鏡
  2. Field ion microscope abbr. fim

    場致離子顯微鏡
  3. Scanning ion microscope

    掃描離子顯微鏡
  4. The gettering processes usually are estimated by gettering of au to nanocavity in silicon. in this paper, the characteristics of nanocavity gettering mechanism, diffusion and distributing of aurum and ion implantation in silicon were described. in this work, many bumps on the polishing surface of the silicon, after a he + impantation in and subsequently a hot - treatment, were observed using atomic force microscope ( afm )

    我們注意到，在研究氫、氦離子注入誘生微孔的吸除作用時多以對金雜質的吸除效果來對吸除工藝進行評估，因此本文對微孔吸除機理、金在硅中的擴散和分佈以及半導體中離子注入的特點進行了描述。
  5. The mechanical property, light transmittance of ion exchange strengthened solar cell cover glass and the effect of ion beam bombardment on its properties are investigated by dynamic mechanical analyser ( dma ), microscope, sem, uv / visible spectrophotometer and micro hardness instrument respectively

    摘要系統研究了太陽能電池蓋片玻璃經離于交換增強（化學鋼化）后的機械性能、透光率以及離子束轟擊對蓋片性能的影響。
  6. We give some useful analyses and the computer simulations for the ion etching process. compared with the atomic force microscope ( afm ) scanning photograph of the etching surface, the theoretical results prove that these simulation analyses assure the precision required by this problem, so these mathematical models are reasonable and correct. the analysis method in this paper is useful to analyze etching process, and it can also afford some valuable reference to etching technology

    在本論文我們主要利用這個數學模型，對使用離子束刻蝕製作單臺階光柵的臺階與溝槽部分的表面面形隨時間的演變過程分別進行了計算機模擬分析，並通過把理論結果與在實驗中得到的刻蝕表面在原子力顯微鏡（ afm ）下拍攝的照片進行比較，結果說明這種模擬分析能夠保證對該問題分析所要求的精度，從而也證明了理論模型的合理性和正確性。
  7. The present development of field emission characteristics of single walled carbon nanotubes ( swnts ) and zinc oxide nanowires at home and abroad was introduced, their field emission characteristics were studied with field emission microscope ( fem ) and field ion microscope ( fim ). several problems about electric field in the field emission have been simulated with finite element method

    本文介紹了單壁碳納米管和氧化鋅納米線場發射的國內外發展概況，用場發射場離子綜合測試儀研究了它們的場發射特性，並用有限元法模擬了場發射中與電場有關的幾個問題。
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