mapping probe 中文意思是什麼

mapping probe 解釋
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  • mapping : n. 【數學】映像,映射。
  • probe : n 1 【醫學】探針;探示器;取樣器;【物理學】試探電極。2 【醫學】(對傷處等的)針探,探查;刺探;...
  1. Probe into the petri - net based modeling technology and discuss the application of mapping petri net to workflow based on the workflow - net as well as how to improve it on high level petri net technology

    深入探討了基於petri網的工作流建模技術。以工作流網為基礎討論了petri網到工作流的映射,並利用高級petri網技術對工作流網進行改進。
  2. The work on physical mapping of the chromosome of s. nanchangensis ns3226 was initiated. nearly a full set of chromosomal asei - bamhi fragments of s. nanchangensis ns3226 were cloned and used as probe to hybridized against its genomic library. thirty four asei linking cosmids were observed from 162 hybridizing cosmids and 20 of them showed no obvious overlapping each other by bamhi digestion, suggesting distinct identifications

    此外,還開展了南昌鏈黴菌ns3226染色體物理圖譜構建的前期研究工作:基本克隆到了南昌鏈黴菌ns3226染色體上全套的ase - bamh片段,以它們為探針從南昌鏈黴菌ns3226的基因文庫中釣到164個陽性克隆,並從中篩選到34個ase linkingcosmids ,用bamh進行初步的酶譜分析,結果表明其中有20個cosmids的bamh酶譜相互間沒有明顯的重疊性。
  3. Until recently, the advent of the application of lymphatic mapping technique in melanoma and breast cancer during surgery has made the use of the intra - operative gamma probe widespread

    近來由於淋巴偵檢技術應用於外科治療黑色素瘤及乳癌的進展,大幅擴展了手術用加馬偵檢器的應用。
  4. The natures of the probe and formation mechanisms in these techniques are different ; therefore, the images of spm can reflect different properties of sample surface. in this work, related properties of ferroelectric thin film were investigated as followed : the main factors determining the image formation of piezoresponse force microscopy ( pfm ) and scanning nonlinear dielectric microscopy ( sndm ) were studied. to avoid the misreading of the same conductive tip with different state, a new method of polarization distribution mapping with nonconductive tip was proposed, and the result of experiment demonstrated that the polarization distribution of ferroelectric thin films could be characterized well by the new approach

    本工作主要分為以下幾個部分:從研究鐵電薄膜的壓電響應力顯微鏡( pfm )和掃描非線性介電顯微鏡( sndm )成像的影響因素入手,討論了針尖對成像質量的影響;為降低實驗成本、減小導電探針針尖狀態變化對鐵電薄膜微區電性能測試的負面影響,提出了以非導電探針檢測微區極性分佈的方法,並在現有spa - 300hv型spm的實驗平臺上以pfm模式成功實現了新方法對鐵電薄膜極性分佈的表徵。
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