measuring microscopy 中文意思是什麼
measuring microscopy
解釋
測量顯微鏡- measuring : n. ,adj. 測量（的），測量用（的）。 remote measuring 遙測。
- microscopy : n. 顯微鏡學；顯微鏡使用術。
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The examples to diagnose transformer faults with measuring element method by electro microscopy, infrared thermograph and icp plasma emission spectrum are introduced
摘要介紹了應用掃描電鏡測量元素法、紅外成像分析法、等離子發射光譜法檢測大型變壓器故障的實例。 -
Transmitted - light differential interference contrast microscopy system for measuring transparent surface topographies
可定量測量的透射式微分干涉顯微系統 -
In this paper, we introduce the function of the confocal laser scanning microscopy in the studies of protein crystal growth kinetics, such as measuring the numbers of crystal, reconstruction 3 - d image to acquire the information of crystal growth process
本文介紹了其在定量測量晶體的個數，重組三維圖像以獲得晶體生長的過程信息及測定晶體生長臺階動態變化等方面的應用。 -
A new type of thin film laps based on chalcogenide glass - sensitive materials was developed by means of silicon planar technology and thermal evaporation technique. the physical layer structure and the stoichiometric composition of the deposited glass materials have been investigated using transmission electron microscopy. depending on the conventional " two - electrodes " measuring set - up, these novel thin film sensors possess certain sensitivity towards heavy metals of seawater
在laps的原理和應用基礎上，我們還進行了基於laps （光尋址電位傳感器）的微結構重金屬離子傳感器的研究：包括laps的結構優化設計、 laps器件的微結構加工和工藝、針對被檢測的重金屬離子，採用硫屬玻璃等固態敏感材料，完成敏感薄膜分子合成的優化設計及與laps的界面結合的特性研究等，並將測量結果和體傳感器進行比較分析。 -
In this thesis, scanning force microscopy ( sfm ) was used to study the nanoscale electric phenomena of the surface and interface properties of ferroelectric thin films. the experimental setup was calibrated by measuring potential distribution of the working resistance of integrated chip
在實驗儀器的驗證方面，選用集成電路晶元測試單元中的埋置條形電阻作為檢測對象，在電阻兩端外加直流偏壓后檢測電阻的電勢分佈，在已知電阻上電勢分佈的前提下，驗證了開爾文力顯微鏡檢測微區表面電勢的可靠性。 -
For image inspection, measuring instrument, microscopy
影像檢測量測儀器 -
Standard practice for measuring and reporting probe tip shape in scanning probe microscopy
掃描探測顯微鏡探頭測量和報告的標準實施規程 -
In order to facilitate the advancement of micro - fabrication and micromachine technologies, development of measurement methods for both profile and dimension of micro - components are essential. one of the methods available for this is a small three - dimensional profile measurement apparatus with micro - probes. for such an apparatus, the probes must be fabricated with optimal shape for individual part measurement. in this research, micro - electrical discharge machining ( micro - edm ) which has extremely small machining force and is applicable for fabrication of various types of probes, is used for probe manufacturing. various types of probes which are installed to the small three dimensional profile measuring apparatus based on principle of scanning tunneling microscopy ( stm ) are fabricated by the proposed method. the probes fabricated have been successfully used for the measurement of several micro - parts and the results show the effectiveness of the proposed method
為了推動微加工和微機械技術的進步，微型零件輪廓和尺度測量方法的發展非常重要.可行方法之一就是使用帶微探頭的小型三維輪廓測量儀.這種儀器的探頭必須針對某個零件的測量，按照最佳外形製造.微放電加工有著極小加工力，可用於各種探頭的製造，本研究中用它進行探頭加工.用這種方法製造了多種探頭，將其裝在基於掃瞄隧道顯微技術（ stm ）的小型三維輪廓測量儀上.所製造的探頭已被成功地用於各種微元件測量，結果表明此方法可行
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