open circuit test 中文意思是什麼

open circuit test 解釋
斷路試驗
  • open : adj 1 開著的，開放的；可進入的，可分享的 （to）; 無蓋的，敞口的；敞開的；展開的；開的；開闊的，開...
  • circuit : n 1 （某一范圍的）周邊一圈；巡迴，周遊；巡迴路線[區域]；迂路。2 巡迴審判（區）；巡迴律師會。3 【...
  • test : n 1 檢驗，檢查；考查；測驗；考試；考驗。2 檢驗用品；試金石；【化學】試藥；（判斷的）標準。3 【化...
  1. According to the system technology require, adopting singlechip realize open loop digital control of hdclsm ; using v / f conversion and complex key - control method realize digital setting of system parameter, such as velocity ; using micro - stepping control insure the motor running more smoothly ; adopting debasing speed control method to eliminate the mechanical impact of distance termination effectively ; at the same time, analyzing main power circuits drive circuit and protect circuit of system, completing hardware design and facture and software programming and debugging ; at last, making a whole test in hybrid rotary step motor. the experiment result indicates that this control system reaches the qualities required and run smoothly also

    根據系統技術要求，採用單片機實現了混合式直流直線步進電動機的開環數字控制；利用v f變換和復合鍵控方法實現了系統轉速等參數的數字設定；利用細分控制技術保證了電機運行的平穩性，並進行了波形分析和理論研究；採用單片機軟體降速控制策略解決直線步進電機行程末端的機械沖擊問題；同時對主功率電路、驅動電路和系統保護電路進行了分析，完成了硬體設計、製作和軟體編程、調試，最後在混合式旋轉步進電動機上進行了全面測試。
  2. So here introduces a new method - the combination of boundary scan with deltascan, in which deltascan is applied to do short and open test in ict, so that the number of vectors used to test circuit short and open in boundary can be eliminated. all vector test, including boundary scan test, need to create test vectors

    任何邏輯元件的矢量測試，包括邊界掃描測試，都必須先生成測試矢量，然後用這些測試矢量作為輸入端的激勵信號，因此測試矢量是矢量測試的基礎，測試矢量生成方法的難易程度和測試矢量數目是邊界掃描技術能否在實際中應用的關鍵。
  3. Standard guide for design of flat, straight - line test structures for detecting metallization open - circuit or resistance - increase failure due to electromigration metric

    檢測由電遷移造成的噴鍍金屬開路或阻力增加失效率用的平板直線試驗結構設計的標準指南
  4. Test methods for communication cable - attenuation coefficient test - open and short circuit method

    通信電纜試驗方法衰減常數試驗開短路法
  5. Ir - ta - ti metal oxide coated titanium anodes of variable composition were prepared by thermal decomposition. their micro morphorogies and electrochemical properties were characterized by scanning electron microscope, open circuit potential, cyclic voltammetry, consumption rate measurements and accelerated life test. the sem results indicated that all coatings were of a porous and cracked - mud microstructure influenced greatly by the composition of coatings. the electrochemical measurements showed that the ir - ta - ti ternary oxide - coated anodes exhibited excellent electrochemical activity and electrochemical stability in both acidic media and seawater which were affected by the composition and microstructure of the coatings. owing to good corrosion resistance and low consumption rate in seawater, metal oxde coated anodes belong to insoluble material, and can be potentially applid in impressed current cathodic protection systems as an anode

    採用熱分解方法在鈦基體上制備銥鉭鈦金屬氧化物陽極，用掃描電鏡對陽極塗層顯微形貌進行分析，通過強化電解壽命試驗、開路電位測試、消耗率試驗及循環伏安曲線研究了金屬氧化物陽極的電化學性能. sem分析結果表明銥鉭鈦金屬氧化物陽極塗層呈現多孔多裂紋形貌結構.隨陽極塗層組成不同，塗層顯微形貌表現出很大差異，這種差異直接影響陽極電化學性能.電化學性能試驗結果表明銥鉭鈦金屬氧化物陽極在酸性介質和海水中具有良好的電化學穩定性和電化學活性.此外，銥鉭鈦金屬氧化物陽極在海水中的消耗率很低，屬于不溶性的陽極材料，作為外加電流陰極保護用輔助陽極具有廣泛的應用前景
  6. For the convenience of test, varied circuit chip defects caused by the production process are abstracted as all kinds of models. at present the commonly used fault models mainly consist of stuck - at fault, stuck - open fault, bridge fault, store fault, delay fault, etc. testing methods based on voltage testing mainly aim at stuck - at fault model and have also obtained satisfactory result in research for many years. bridge fault is tested easily by quiescent power supply current ( iddq ) testing method. in regard to stuck - open fault that is difficult to testd by quiescent power supply current ( iddq ) and voltage testing, it can is tested by the dynamic current ( iddt ) testing

    為了便於測試，我們將生產過程中集成電路出現的多種多樣的缺陷抽象為各種模型。目前常用的故障模型主要有:固定故障，開路故障，橋接故障，存儲故障，時滯故障等。電壓測試主要針對固定型故障模型，多年的研究也取得了令人滿意的結果; cmos電路中的橋接故障則宜用穩態電流測試方法（ iddq ）測試;對于電壓和穩態電流難以測試的開路故障，可以使用瞬態電流測試（ iddt ）的方法進行測試。
  7. Elements of electrical and optical connection - test methods - electrical elements - measurement of open circuit impedance of couplers

    電氣和光學連接元件.試驗方法.電氣元件.耦合器開路阻抗的測量
  8. Aerospace series - elements of electrical and optical connection - test methods - part 701 : electrical elements - measurement of open circuit impedance of couplers

    航空航天系列.電氣及光學連接元件.試驗方法.第701部分:電氣元件.耦合器開路阻抗的測量
  9. Aerospace series - elements of electrical and optical connection ; test methods - part 701 : electrical elements ; measurement of open circuit impedance of couplers ; german and english version en 2591 - 701 : 2001

    航空航天系列.光電連接件.試驗方法.第701部分:電氣元
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