probe force 中文意思是什麼
probe force
解釋
尖頭鑷-
Improved atomic force microscope imaging in liquid with active probe
壓電探針應用於原子力顯微鏡液體成像的研究 -
To achieve accurate detection of surface potential, the measurement of the contact potential difference of the zno / si step was also carried out. polarization - related surface properties of ferroelectric thin films were investigated by kelvin probe force microscopy ( kpfm ), leading to the discovery of asymmetric charge writing on the surface of pb ( zr _ ( 0. 55 ) ti _ ( 0. 45 ) ) o _ 3 ( pzt ) thin film
為了優化儀器的檢測靈敏度和穩定性，選用氧化鋅薄膜上的zno / si臺階作為測試對象，檢測了zno / si的接觸電勢差;通過改變儀器系統參數，發現針尖-樣品距離和掃描速度對接觸電勢差的檢測結果影響顯著。 -
This multidimensionality will force us to probe deeper into direct investment in this and the next chapter.
這種多面性將迫使我們在本章及下一章中對直接投資進行更為深入的探討。 -
The composition, structure, and properties of the as prepared composite films have been characterized in detail by uv - vis, ftir, and x - ray photoelectron spectra, ellipsometry, scanning electron microscopy, atomic force microscopy, transmission electron microscopy, fluorescence spectroscopy, and standard four - probe technique
採用uv - vis光譜、 ftir光譜、 x -射線光電子能譜、橢圓光度法、掃描電子顯微鏡、原子力顯微鏡、透射電子顯微鏡、熒光光譜和標準四探針技術對所制備的納米復合膜進行了組成、結構和性能表徵。 -
Being sustainable both on spatial and temporal dimensions, sustainable land use system is a typically complicated system composed by natural, social and economical components, which has special attributes of systematic complication, structural openness, spatio - temporal dynamics and multi - objects. driving force - state - response analysis method is useful to probe into multi - act and dynamics of its components. sustainability assessment is the core to sustainable land use study. in this paper, the authors apply driving force - state - response analysis method to construct assessing indicator system, which can be classified into status quo and response indicators, composed by natural, social, economical and technical aspects. then the authors design assessing process on sustainable land use. at last, the indicator system and process are applied in tangshan region from 1991 to 1999. the results show that the general sustainable degree of land use in the study case has been rising, which is resulted from great economic growth and natural cost
以"驅動力-狀態-響應"模型為基礎，從狀態指標和響應指標兩種類型，自然社會經濟技術四個方面構建了土地利用可持續性評價指標體系和評價過程，並且應用於唐山地區1991 - 1999年土地利用持續性評價，結果發現：雖然近十年來唐山地區土地利用持續性在升高，但它是建立在經濟快速發展和付出生態環境代價基礎上的。 -
The research on flight plan conflict probe ( fpcp ) : in the phase of flight plan preparation, the planning controller of air force used to spend half time of each day to draw the routes on the maps and then probe the conflicts between them, for the flight routes are quite irregular and more possible to cause conflicts with other training flights or civil aviation flights. the fpcp model studied here is one of the innovation applied in mrd2k - jh, it can automatically probe all the potential conflicts between flight plans. this model uses 4 - d conflict probing rules to analyze all the route information of flight plans, the detected conflicts ( route points or segments ) can be useful for assisting the planning controller to amend the conflicted plans and re - probe the conflicts
飛行計劃沖突預調配研究：針對軍航管制工作中飛行計劃機動多變造成飛行沖突多、沖突探測繁、手工調配難的情況，介紹了mrd2k ? jh系統中採用的一項創新之處? ?飛行計劃準備階段自動化的四維沖突探測模型，按照飛行安全間隔對各飛行計劃的所經航線數據進行潛在沖突分析，探測出預沖突航路點或沖突航線段，代替了軍航管制員原來在地圖上手工測畫的重復性勞動，該項功能幫助管制員及時發現飛行計劃之間存在的潛在沖突以方便進行調配再探測，不僅極大提高了工作效率，更避免了人為可能造成的失誤，確保了飛行的安全。 -
2. by using the internal force - decomposability method, a numerical means was applied for the analysis of the test data, so we can probe into the situation of the internal force change on the steel and rpc, based on these, the simplified calculating formula is suggested
2 、採用內力分解分析法，對圓鋼管rpc試件試驗數據進行數值分析，分別探討了圓鋼管rpc在極限荷載狀態下的鋼管和rpc各自的內力變化情況，據此，提出圓鋼管rpc極限承載力的簡化計算公式。 -
The main performances of the afm were in the advanced level around the world. the probe unit of the horizontal afm includes a photo - electronic detection unit with a particular optical - beam - deflection path, a regulating block of the setpoint of imaging force, the xy scanner and z feedback controller, the coarse adjusting and fine adjusting mechanism for the sample approaching to the probe tip. the powerful circuits of preamplifier, as well as the circuits of xy scanner and z feedback controller were developed
成功研製了臥式afm探頭，包括特有的微懸臂偏轉量的臥式光電檢測系統、 afm成像工作點（即原子力的預設置點）的調節機構、 jy }藝掃描與反饋控制器、樣品的粗調與微調機構;自行研製了高性能的psd前置放大電路、 xy掃描控制電路和z向pid反饋控制電路系統;設計了a / d & d / a控制介面，獨立開發了性能完善的afm掃描與控制軟體系統及功能強大的圖像處理軟體系統。 -
Probe into construction and development of air force hospitals after combining services
聯勤后空軍醫院建設的發展思路 -
Firstly, the relationship of atomic force and distance is studied. the scan type of samples and the working mode of probe is confirmed, then pzt is chosen as actuator for micro scan displacement, and optical deflexion method is used to detect the deflexion value of cantilever. after all these work, the system light path design is finished, and its mathematical model is completed
首先，分析了原子力探針系統的中原子力?距離的關系，並確定探針系統的探針的工作模式和樣品的掃描模式，從而選擇壓電陶瓷作為掃描微位移驅動器;採用光學偏轉法檢測微懸臂偏轉量，並選用了psd作為傳感元件，並在此基礎上進行了系統光路設計及其數學模型的建立。 -
A probe into the theory and practice of the opening and utilization of documents in force
現行文件開放利用的理論與實踐思考 -
A probe into the calculation method on coping ' s internal force of pillar pier
柱式橋墩蓋梁內力計算方法探討 -
Together with rohrer, we started brainstorming ways to apply stm or other scanning probe techniques, specifically atomic force microscopy ( afm ), to the world beyond science
我們與羅瑞爾一起開始鉆研如何將stm或其他掃描探針技術，特別是原子力顯微鏡（ afm ） ，應用到純科學以外的世界。 -
In order to facilitate the advancement of micro - fabrication and micromachine technologies, development of measurement methods for both profile and dimension of micro - components are essential. one of the methods available for this is a small three - dimensional profile measurement apparatus with micro - probes. for such an apparatus, the probes must be fabricated with optimal shape for individual part measurement. in this research, micro - electrical discharge machining ( micro - edm ) which has extremely small machining force and is applicable for fabrication of various types of probes, is used for probe manufacturing. various types of probes which are installed to the small three dimensional profile measuring apparatus based on principle of scanning tunneling microscopy ( stm ) are fabricated by the proposed method. the probes fabricated have been successfully used for the measurement of several micro - parts and the results show the effectiveness of the proposed method
為了推動微加工和微機械技術的進步，微型零件輪廓和尺度測量方法的發展非常重要.可行方法之一就是使用帶微探頭的小型三維輪廓測量儀.這種儀器的探頭必須針對某個零件的測量，按照最佳外形製造.微放電加工有著極小加工力，可用於各種探頭的製造，本研究中用它進行探頭加工.用這種方法製造了多種探頭，將其裝在基於掃瞄隧道顯微技術（ stm ）的小型三維輪廓測量儀上.所製造的探頭已被成功地用於各種微元件測量，結果表明此方法可行 -
For robotic nanomanipulation based on an atomic force microscope ( afm ), the working principle of interactive nano forces among the probe, substrate and particle is preliminarily analyzed
摘要針對基於原子力顯微鏡（ afm ）的機器人化納米操作，對探針作用下探針基片微粒之間納觀力的作用規律進行了初步分析。 -
The natures of the probe and formation mechanisms in these techniques are different ; therefore, the images of spm can reflect different properties of sample surface. in this work, related properties of ferroelectric thin film were investigated as followed : the main factors determining the image formation of piezoresponse force microscopy ( pfm ) and scanning nonlinear dielectric microscopy ( sndm ) were studied. to avoid the misreading of the same conductive tip with different state, a new method of polarization distribution mapping with nonconductive tip was proposed, and the result of experiment demonstrated that the polarization distribution of ferroelectric thin films could be characterized well by the new approach
本工作主要分為以下幾個部分:從研究鐵電薄膜的壓電響應力顯微鏡（ pfm ）和掃描非線性介電顯微鏡（ sndm ）成像的影響因素入手，討論了針尖對成像質量的影響;為降低實驗成本、減小導電探針針尖狀態變化對鐵電薄膜微區電性能測試的負面影響，提出了以非導電探針檢測微區極性分佈的方法，並在現有spa - 300hv型spm的實驗平臺上以pfm模式成功實現了新方法對鐵電薄膜極性分佈的表徵。 -
The branches of nano - technology include nano - physics, nano - chemistry, nano - electronics, nano - material science, nano - biology, nano - mechanics and narto - measurements, etc. with the development of nano - technology, scanning probe microscopy ( spm ), especially atomic force microscopy ( afm ), has been the most widely demanded and applied tools for researchers to pursue more ambitious goals, and has actually become the indispensable instruments for nano - scientists and engineers
納米技術正在不斷滲透到現代科學技術的各個領域，形成了許許多多與納米技術相關的新興學科，如納米物理學、納米化學、納米電子學、納米材料學、納米生物學、納米機械學與納米量測學等。掃描隧道顯微鏡（ stm ）與原子力顯微鏡（ afm ）等是納米技術發展的重要基礎，也是納米科技工作者必不可少的研究工具，其中又以afm需求更大，應用領域更為廣泛。 -
The significant characteristics of the new afm include : ( i ) it has a horizontally designed probe unit, and the direction of cantilever ' s weight was perpendicular to the atomic force, thus the effect of cantilever ' s weight on the imaging quality can be effectively avoided ; ( ii ) it owns a particular path of optical beam deflection method for the measurement of cantilever ' s displacement
臥式afm探頭系統的顯著特色是，微懸臂重力與原子力方向相互垂直，有效地避免了重力對微懸臂及成像質量的影響，從而在設計方法上保證了afm的性能。本文在方法上的另一創新是，發展了獨特的微懸臂偏轉量的光束偏轉法檢測系統。 -
On behalf of the steering committee, i welcome representatives from singapore, japan, macau, shanghai and shanzhen, and speakers from hong kong police force, creative star and hong kong polytechnic university to this forum, to share with us their experience in improving taxi services and to probe into new ideas of quality taxi services
我謹代表優質的士服務督導委員會歡迎新加坡、日本、澳門、上海及深圳之的士業人士及監管機構的代表、警務處、聯俊達公司及理工大學參加這次研討會，與我們分享並交流提升的士服務質素的經驗，及探討提供優質的士服務的新思維。 -
Fabrication of nanostructures based on spm as an extension to spm imaging, referred to as scanning probe nanofabrication ( spn ) is an emerging technique undertaken at labs in the past ten years that comprises manipulation of atom or molecule in a bottom - up paradigm and scanning probe lithography ( spl ) in a top - down paradigm. in chapter one, in the light of decentralized experimental data in this respect, the author, classify in an analytic approach the literature concerned as electrical spl, mechanical spl, thermal spl, and optical spl in terms of different mechanisms of interplay between a probe and a surface of a sample, after describing the most important of this type of microscopy, i. e., scanning tunneling microscopy and atomic force microscopy
由於這項技術的實驗數據比較分散，因此，作者在論文的第一章里首先介紹了掃描探針顯微鏡的兩個最重要的類型，即掃描隧道顯微鏡和掃描原子力顯微鏡的工作原理；然後根據加工方式的不同把它分為自下而上的掃描探針原子（分子）操縱與自上而下的掃描探針刻蝕兩大類；而根據掃描探針與樣品的不同作用機理，對掃描探針刻蝕加工又進行了歸納與綜述，對其特殊的加工方法作了原理性的介紹，並分析了目前存在的共性問題與應用前景。
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