profilometer 中文意思是什麼

profilometer 解釋
n. 名詞 【機械工程】輪廓曲線儀；表面光度儀；縱斷面測繪器 （＝profilograph）。

  1. Profilometer - a tool that is used for measuring surface topography

    表面形貌劑-一種用來測量晶圓片表面形貌的工具。
  2. A new profilometer with a dual - frequency laser for measuring the surface roughness with 1 ? nm

    級表面粗糙度的雙頻激光測量系統
  3. Test method for thickness of fine ceramic thin films - film thickness by contact probe profilometer

    精細陶瓷薄膜厚度的試驗方法.用接觸探針式表面光度計法測定薄膜厚度
  4. Advanced technical ceramics. methods of test for ceramic coatings. determination of coating thickness by contact probe profilometer

    高技術陶瓷.陶瓷塗層的試驗方法.通過接觸探頭輪廓測定儀測定塗層厚度
  5. Tests relating to pavements. evenness tests. part 3 : determination of longitudinal evennes indexes calculated from profilometer data

    路面試驗.滑度試驗.第3部分:通過表面光度儀數據計算縱向平滑度指數
  6. Advanced technical ceramics - methods of test for ceramic coatings - part 1 : determination of coating thickness by contact probe profilometer ; german version en 1071 - 1 : 2003

    高級工業陶瓷.陶瓷覆層的試驗方法.第1部分:用接觸式
  7. Compared with sputter crater depth results measured with surface profilometer, the converted depth results obtained by gd - oes were accurate and credible

    輝光光譜定量轉化所得深度結果與表面形貌儀剛定相應濺射坑的深度結果對比發現，本方法定量轉化深度結果準確可靠。
  8. In the present dissertation, friction - induced noises emitted by a flat specimen rubbing against another flat specimen or a ball specimen under reciprocating sliding are studied. the detailed observation of the scars is conducted by means of a scanning electrical microscope ( sem ), laser scanning microscope ( lsm ), optical microscope and profilometer. the dynamic state variables are analyzed in detail using the discrete wavelet transform

    使用電子掃描顯微鏡（ sem ） 、激光掃描顯微鏡（ lsm ） 、光學顯微鏡和表面輪廓測量儀等設備對摩擦噪聲發生的區域進行了詳細的觀察和分析，運用小波變換技術對摩擦噪聲狀態下的動力學變量進行了深層次的研究，應用matlab simulink語言對摩擦系統進行了振動動力學模擬，系統地研究了摩擦噪聲的形成機理。
  9. Therefore, in principle the scattering may be predicted from measurements of the surface profile. in this paper the author also discussed nonspecular scattering for mo / si multlayer coated primary and secondary mirrors of the measured schwarzschlid optics based on power spectral density of these mirrors measured by both optical profilometer ( wyko ) and atomic force microscopy ( afm )

    因此，我們可以通過檢測多層膜反射鏡基底的粗糙度來表徵多層膜反射鏡非鏡面散射對光學系統性能的影響，亦即通過檢測多層膜反射鏡基底的粗糙度調整拋光工藝參數，獲得低散射的多層膜反射鏡。
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