rms roughness 中文意思是什麼
rms roughness
解釋
均方根粗糙度-
The roughness of wyko and afm measuring are 0. 73nm and 0. 56nm in rms value respectively, in both primary and secondary mirrors, and will severity reduce the schwarzschlid optics throughput and the contrast of the image
73urn ） sm ， wyko檢測結果）波紋度和高頻段的0 56urn （ ms ， afm撿測結果將嚴重影響schwarzschild微縮投影物鏡的成像對比度和傳輸效率。 -
Ito substrate with an smooth surface of 0. 2nm rms roughness measured by afm was obtained by the developed pre - cleaning processing procedure. mbe growth of znsxse1 - x thin films on ito coated glass substrates were carried out using zns and se sources. the xrd 9 / 29 spectra resulted from these films indicated that the as - grown polycrystalline znsxse1 - x thin films had a preferred orientation along the ( 111 ) planes
採用分子束外延技術在ito導電玻璃上低溫沉積了zns _ xse _ （ 1 - x ）多晶薄膜，詳細研究了薄膜制備的工藝參數，在最佳沉積條件下，制備獲得了晶型為立方閃鋅礦，並具有（ 111 ）面高度定向生長結構的柱狀zns _ xse _ （ 1 - x ）多晶薄膜，其rms表面粗糙度最小可達1 . 2nm 。 -
2 ) radar incidence angle and surface roughness correction : to make radar incidence correction and eliminate the surface roughness effects, a wide range of surface parameters ( soil moisture, surface rms height, correlation length, incidence angle ) was input to the ibm model to simulate the effect of surface roughness and radar incidence angle on the sensitivity of soil moisture to the radar backscattering coefficient. a simple model was established to simulate the effects of incidence angle and surface roughness. 3 ) establishment of soil moisture change inversion model : according to a modified ibm model simulation results, the bare surface backscattering coefficients can be expressed as a funtion of the dielectric component for a given surface roughness when the surface slope greater than 2. 0, which is valid for most nature surface : in above equation, r0 is the surface reflectivity at normal incidence
本研究中，首先利用基於微波輻射傳輸方程的微波植被模型和積分方程（ iem ）模型模擬了各種地表土壤水分含量情況下，植被覆蓋、地表粗糙度（包括地表均方根高度和相關長度） 、雷達入射角對c波段（頻率4 . 7ghz ）水平極化（ hh ）雷達後向散射系數的影響，在此基礎上，建立模型消除了植被覆蓋、地表粗糙度、及雷達入射角對雷達後向散射的影響，利用多時相50m解析度radarsatscansar雷達後向散射系數圖像反演得到了地表土壤水分變化模式信息。 -
The root mean square roughness ( rms ) of sto thin film was 0. 77nm in the range of 10 m. the step - flow growth mode of sto thin film was achieved
實現了sto薄膜的準二維層狀模式生長，在10 m范圍內， sto薄膜的表面粗糙度rms為0 . 77nm 。
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