scanning electron microprobe 中文意思是什麼
scanning electron microprobe
解釋
掃描電子探針- scanning : n. 1. 細看，細察，審視。2. 【電視】掃描，掃掠,搜索。
- electron : n. 【物理學】電子。 the electron beam 電子束。 the electron theory 電子（學）說。
- microprobe : n. 微探針〈一種使用細聚焦電子束的儀器〉。
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Scanning electron microprobe
掃描電子探針 -
Supported financially by the national natural science foundation of china, employing the testing techniques such as optical metallography analysis, scanning electron microscope ( sem ), electron microprobe scanning microscope ( emsm ), transmission electron microscope ( tem ), x - ray diffraction ( xrd ) and mechanical performance measurements ( including micro - yield strength mys ) etc., this research has worked comprehensively and deeply on a very important issue ? the micro - yielding behavior and mechanism of beryllium material for inertial guidance instruments and optical mirrors ? which has been paid more attention to by designers since the 8th even the 7th five - year plan
在國家自然科學基金資助下，本研究採用光學金相顯微鏡，掃描電鏡（ sem ） 、電子探針（ emsm ） 、透射電鏡（ tem ） 、 x射線衍射（ xrd ） 、力學性能（包括微屈服強度_ （ mys ） ）等測試技術，較詳盡和深入地研究了「七五」 、 「八五」計劃期間用戶一直希望解決的慣性導航和光學鏡體鈹材一個十分重要的問題：微屈服行為及機理。
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