scanning tunneling microscopy 中文意思是什麼
scanning tunneling microscopy
解釋
掃描隧道型顯微鏡學- scanning : n. 1. 細看，細察，審視。2. 【電視】掃描，掃掠,搜索。
- tunneling : 管道傳送，隧道，管道傳輸
- microscopy : n. 顯微鏡學；顯微鏡使用術。
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Adsorption ; scanning tunneling microscopy ; graphite ; tryptophane
表面吸附掃描隧道顯微鏡石墨色氨酸 -
Adsorption of tryptophane on graphite investigated by scanning tunneling microscopy
色氨酸分子在石墨表面吸附的掃描隧道顯微鏡研究 -
The adsorption behaviours of tryptophane on graphite hopg have been investigated under low vacuum conditions at room temperature using scanning tunneling microscopy
用掃描隧道顯微鏡stm研究了室溫下色氨酸分子l - tryptophane在石墨hopg表面的吸附行為。 -
Guide to scanner and tip related artifacts in scanning tunneling microscopy and atomic force microscopy
掃描隧道顯微鏡學和原子力顯微鏡學中掃描器和與觸點相關物品的指南 -
Detection of the metal atom inside a fullerene cage by scanning tunneling microscopy
富勒烯包合物內的金屬原子 -
Adsorption of ddme on hopg investigated by scanning tunneling microscopy
Ddme分子在石墨hopg表面吸附 -
The aim of this thesis is to develop a high - powered, applied and simple stm, which will help the scanning tunneling microscopy expediently and effectively used in various scientific areas
本課題旨在研究一種高性能、實用化、簡易型的stm ，使掃描隧道顯微技術能夠更簡單、方便、有效地應用到各個科學領域。 -
In order to facilitate the advancement of micro - fabrication and micromachine technologies, development of measurement methods for both profile and dimension of micro - components are essential. one of the methods available for this is a small three - dimensional profile measurement apparatus with micro - probes. for such an apparatus, the probes must be fabricated with optimal shape for individual part measurement. in this research, micro - electrical discharge machining ( micro - edm ) which has extremely small machining force and is applicable for fabrication of various types of probes, is used for probe manufacturing. various types of probes which are installed to the small three dimensional profile measuring apparatus based on principle of scanning tunneling microscopy ( stm ) are fabricated by the proposed method. the probes fabricated have been successfully used for the measurement of several micro - parts and the results show the effectiveness of the proposed method
為了推動微加工和微機械技術的進步，微型零件輪廓和尺度測量方法的發展非常重要.可行方法之一就是使用帶微探頭的小型三維輪廓測量儀.這種儀器的探頭必須針對某個零件的測量，按照最佳外形製造.微放電加工有著極小加工力，可用於各種探頭的製造，本研究中用它進行探頭加工.用這種方法製造了多種探頭，將其裝在基於掃瞄隧道顯微技術（ stm ）的小型三維輪廓測量儀上.所製造的探頭已被成功地用於各種微元件測量，結果表明此方法可行 -
Scanning tunneling microscopy
掃描隧道型顯微鏡學 -
Moir patterns on hopg were studied with scanning tunneling microscopy ( stm )
利用掃描隧道顯微鏡研究石墨表面的大尺度周期性圖樣。 -
Test method for determination of surface roughness by scanning tunneling microscopy for gas distribution system components
用掃描隧道顯微術法測定氣體分配系統元件的表面粗糙度的測試方法 -
The samples were characterized by x - ray diffraction ( xrd ), optical spectroscopy, transmission electron microscopy ( tem ) and scanning tunneling microscopy ( stm ). as a result, a self - assembled monolayer ( sam ) of msa on the surface of fee au particles was directly observed in atomic level
在此基礎上，對金納米粒子和其自組織結晶體進行了一系列的x射線衍射儀（ xrd ） 、透射式電子顯微鏡（ tem ） 、光吸收譜和掃描隧道顯微鏡（ stm ）的檢測和分析。 -
Research interests : surface science ; semi - conductor physics, scanning tunneling microscopy, surface atomic and molecular dynamics ; mechanism of epitaxial growth
研究興趣：表面科學、半導體物理、掃描穿隧顯微術、表面原子、分子動態學、磊晶成長機制。 -
Fabrication of nanostructures based on spm as an extension to spm imaging, referred to as scanning probe nanofabrication ( spn ) is an emerging technique undertaken at labs in the past ten years that comprises manipulation of atom or molecule in a bottom - up paradigm and scanning probe lithography ( spl ) in a top - down paradigm. in chapter one, in the light of decentralized experimental data in this respect, the author, classify in an analytic approach the literature concerned as electrical spl, mechanical spl, thermal spl, and optical spl in terms of different mechanisms of interplay between a probe and a surface of a sample, after describing the most important of this type of microscopy, i. e., scanning tunneling microscopy and atomic force microscopy
由於這項技術的實驗數據比較分散，因此，作者在論文的第一章里首先介紹了掃描探針顯微鏡的兩個最重要的類型，即掃描隧道顯微鏡和掃描原子力顯微鏡的工作原理；然後根據加工方式的不同把它分為自下而上的掃描探針原子（分子）操縱與自上而下的掃描探針刻蝕兩大類；而根據掃描探針與樣品的不同作用機理，對掃描探針刻蝕加工又進行了歸納與綜述，對其特殊的加工方法作了原理性的介紹，並分析了目前存在的共性問題與應用前景。
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