sem micrograph 中文意思是什麼
sem micrograph
解釋
掃描電子顯微鏡照相術- sem : SEM ＝scanning electron microscope 掃描電子顯微鏡。
- micrograph : n. 微寫器；【物理學】微動擴大測定器；顯微（鏡）制圖[照相、照片]。
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The chemical composition and microstructures of the insulating thin films prepared by different methods were analyzed by x - ray diffraction ( xrd ) and scanning electron micrograph ( sem ) ; other properties such as electric resistance, the breakdown field strength and dielectric properties were evaluated using high resistance meter, voltage resistance meter and precision impedance analyzer respectively
採用x射線衍射儀（ xrd ）對表面絕緣薄膜的物相組成進行了分析，掃描電子顯微鏡（ sem ）對表面絕緣薄膜的微觀結構進行了研究，並用絕緣電阻測試儀、耐壓測試儀和精密阻抗分析儀分別對絕緣膜進行絕緣電阻率、擊穿場強和介電性能的測試。 -
The dependence of oxygen precipitation and induced - defects in heavily as - doped silicon on heat treatment process was studied by annealing and ig process, chemical etching, scanning electron micrograph ( sem ) and transmission electron microscopy ( tem ). a developed ig technique was suggested and the mechanism of the influence of as on oxygen precipitation formation in heavily as - doped silicon was discussed
本文通過化學腐蝕、光學顯微鏡、掃描電鏡（ sem ） 、透射電境（ tem ）等分析技術，對重摻砷硅單晶在單步退火工藝和內吸雜退火工藝中氧沉澱及誘生缺陷的形態，形核與熱處理溫度、時間的關系等進行了研究。 -
The fabrication parameters were preliminarily optimized. the morphology and composition of the samples of the diamond film for different b / c ratios was investigated by scanning electron micrograph ( sem ) and raman scattering spectroscopy ( raman ). the content of different levels of b dopant in the diamond film was tested by secondary ion mass spectrometry ( sims )
闡述了摻硼金剛石膜的制備工藝，研究了摻硼金剛石膜成核和生長的影響因素，初步優化了沉積摻硼金剛石膜工藝參數，同時對摻硼金剛石膜進行了掃描分析、拉曼分析、二次離子質譜分析和電阻率測試。 -
Finally build the foundation to prepare the composites of structure and m - type ferrite with structure and function properties. the constituent phases, microstructure and crystal dimension and crystal coalescence, mechanical properties, magnetic properties of the composites were investigated by means of x - ray diffraction ( xrd ), scanning electron micrograp h ( sem ) and transmission electron micrograph ( tem ), mechanical testing instrument, vibrating sample magnetometer ( vsm ) respectively
採用xrd技術鑒定復合材料的物相，利用sem ， tem來分析srfe12o19及其復合材料的結構形貌，顆粒大小及結合情況，使用伺服材料實驗機、洛氏硬度計及振動樣品磁強計（ vsm ）測試了復合陶瓷的抗彎強度、硬度及其磁性能，並探討它們之間關系。 -
We made good use of the industrial computed tomography ( ict ), scanning electronic micrograph ( sem ) and imaging analysis assemble to investigate the inner and surface fine structures of the cathode in quality and quantity
3 ）採用ct微焦點系統等檢測手段對陰極基底的內部和表面微觀結構進行了定量和定性的分析，有望成為控制陰極基底的質量重要手段。
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