specimen grating 中文意思是什麼
specimen grating
解釋
試件柵-
If alternate diffracted orders are blocked out ( still assuming the grating as our specimen ), the number of lines in grating would appear doubled ( a spurious resolution )
假如交替地遮擋衍射級（仍假設為光柵標本） ，線性光柵的數量會成雙數（偽解析度） 。 -
If you were to block out the outermost diffracted orders by placing an opaque mask at the rear of the objective, you could reduce the resolution of the lines of the grating, or any other detailed object, or " destroy " the resolution altogether so that the specimen would not be visible
假如用不透明的遮擋物在物鏡后焦面擋住外圈衍射級的光線，線形柵格圖像的解析度將下降，這樣完全地破壞了解析度，標本的細節就無法看見。 -
In order to study the thermal performance and residual stress of microelectronic subassembly, in this paper, a newly optical interferometry method for 3 - d displacement measurement is developed based on wavefront interference theory. in which the moire interferometry provide the in - plane displacement, but the system is different from the conventional interferometry, the system applies the double diffraction of the specimen grating, the in - plane displacement sensitivity is a factor of 2 higher than that of the conventional moire interferometer. twyman / green interferometry method for out - of - plane displacement measurement is adapted, the advantages of the optical set - up are structure novelty, and the fringe patterns of the displacement fields shown high contrast and spatial resolution
為了詳細研究試件的熱變形特徵以及殘余應力的影響作用，本文在波前干涉理論的基礎上，設計了一新型三維光學測試系統，該系統的平面位移測試基於雲紋干涉方法，但採用與普通雲紋干涉不同的光路系統，利用試件光柵和平面反射鏡組形成的兩次衍射，使平面位移干涉條紋倍增，測量靈敏度是普通雲紋干涉的2倍，系統的離面位移場測試採用泰曼格林干涉光路。
分享友人