xps x 中文意思是什麼

xps x 解釋
射線光電光譜學
  • xps : 聚苯乙烯擠塑保溫板
  • x : X2＝ （羅馬數字）10 XX ＝ 20 IX ＝ 9 XV ＝ 15 XL ＝ 40 LX ＝ 60 XC ＝ 90 DXL ＝ 540 MX ＝ 1010 ＝...
  1. Chiral quaternary ammonium salts were synthesized from cinchonine in cinchona alkaloids using chloromethylated polystyrene - polyethylene glycol, diethylene glycol, triethylene glycol and glycol as polymer - supported phase transfer catalysts, finsl products were characterized by ftir, elemental analysis, scanning electron microscopy, x - ray photoelectron spectroscopy ( xps )

    摘要以金雞納生物堿中的辛可寧為原料，氯甲基化聚苯乙烯聚乙二醇、一縮二乙二醇、二縮三乙二醇、乙二醇等為載體合成了幾種聚合物負載的手性季銨鹽，並對它們的結構用紅外光譜、元素分析、掃描電鏡和x射線光電子能譜等測試手段進行了表徵。
  2. The results of x - ray photoelectron spectrum ( xps ) demonstrated the ce ions in pure phase ce : yig ( x < 0. 2 ) were in the state of trivalence. scanning electron microscope ( sem ) analysis showed conglobation of yig and ce : yig particles, whose size were smaller than 1 urn

    Xps的分析結果顯示單相ce ： yig （ x 0 . 2時）中ce離子是以正三價的狀態存在，這與物相分析結果是一致的。
  3. Xps x - ray photoelectron spectroscepy x

    射線光電子分光鏡檢查
  4. Surface states and the topmost surface atoms of the batio3 thin films have been analyzed by x - ray photoelectron spectroscopy ( xps ) and angle - resolved x - ray photoelectron spectroscopy ( arxps ). the results show that the as - grown batio3 thin films have an enriched - bao nonstoichiometric surface layer which can be removed by ar + ion sputtering, and the atomic ratio of ba to ti decreases with increasing the depth of ar + ion sputtering

    用x射線光電子能譜技術（ xps ）和角分辨x射線光電子能譜技術（ arxps ）研究了薄膜的表面化學態以及最頂層原子種類和分佈狀況，結果顯示在熱處理過程中薄膜表面形成一層富含bao的非計量鈦氧化物層，並且鋇-鈦原子濃度比隨著探測深度的增大而逐漸減小。
  5. Ge - sio2thin films were prepared by an rf co - sputtering technique on p - si substrates from a ge - sio2 composite target. the as - deposited films were annealed in the temperature range of 300 - 1000 under nitrogen ambience. the structure of films was evaluated by x - ray diffraction ( xrd ), x - ray photoernission spectroscopy ( xps )

    當溫度較低時（沉積時的基片溫度ts 450 ，后處理退火溫度ta 800時，制備的樣品均為非晶結構，當溫度較高時（ ts 450 ， ta 800 ）薄膜樣品中才出現si的結晶顆粒。
  6. Scanning electron microscope ( sem ) and x - ray photoelectron spectroscopy ( xps ) studies indicated that the additive of cs _ 2 took part in the sei film - forming in the process of battery cycles. the elements of carbon, oxygen and fluorin are the main members in the compounds of sei film. sulfur is also one of the main elements of the sei film when the electrolyte included additive of cs _ 2

    利用掃描電子顯微鏡和x射線光電子能譜研究表明，二硫化碳在電池的循環過程中參與了sei膜的形成， sei膜的組成物質中主要是c 、 o 、 f三種元素，加入二硫化碳后， s元素也成為主要組分， sei膜的主要組成物質有烷基氧鋰、烷基碳酸酯鋰、碳酸鋰、硫酸鹽、聚烯烴及氟化鋰等。
  7. Gas permeability tester and mechanical folding device were developed to study the barrier property and deformation failure behaviors. the surface characterization, chemical structure, optical, mechanical properties of pet coated with dlc have been investigated by x - ray photoelectron spectroscopy ( xps ), contact angle measurement, light transmission analysis, nanoindentation and friction wear tests

    通過x射線光電子譜分析、接觸角測定、光學透過率分析、納米壓痕、摩擦磨損試驗、機械彎折試驗、氣體透過率試驗，對膜層的表面特徵，光學、力學及氣體阻隔性能進行了系統的研究。
  8. The thermal stability of high - k thin film deposited on si substrate has been studied using x - ray photoelectron spectroscopy ( xps )

    通過x射線光電子能譜對沉積在si基底上的high - k薄膜的熱穩定性進行了研究。
  9. By film thickness measured, fourier transformed infrared spectrometer ( ftir ) analysis, x - ray photoelectron spectroscopy ( xps ) analysis and relative irradiance measurement, the effect of microwave input powers on deposition rates, f / c ratios, bonding configurations of ct - c : f films and the radicals in plasma originating from source gases dissociation is analyzed

    由於微波功率的改變會導致等離子體中電子溫度和等離子體密度發生變化，從而造成不同的源氣體分解過程，結果微波功率的升高導致了薄膜沉積速率的提高、 f / c比的降低，同時也導致薄膜中cf和cf _ 3基團密度的降低，而保持cf _ 2基團密度接近常數。
  10. Fourth, the advanced surface analysis technique - x ray photoelectron spectrum is employed to study the adsorption of soluble - starch on the pvdf membrane. then we test by using xps combined with sem the original sample, the fouled sample and the washed sample with rubber sponge balls

    第四，採用x射線光電子能譜（ xps ）技術分析了可溶性澱粉在聚偏氟乙烯膜表面的吸附，並將xps技術與電子顯微鏡技術相結合，對原始樣品、污染樣品和海綿橡膠球清洗樣品進行了測試和分析。
  11. The mechanical modifying equipment was used to prepare compounded micro - spheres from pmma particles and ps particles with metal particles and tio2 nano - particles. the sem was used to observe the images of particles and x - ray photoelectron spectroscopy ( xps ) is used to obtain surface spectrum. herein the tio2 nano - particles can be dispersed on larger polymer particles and their surface morphology is different by using different polymer particles

    使用掃描電鏡和光電子能譜對制得的復合微粒子進行表徵，發現該方法可以使納米tio _ 2粒子呈很好的分散狀態復合在聚合物微球及金屬粒子上，而且隨著聚合物微球原料的不同，納米tio _ 2粒子能在高聚物的表面的復合狀態也不同。
  12. Effects of oxygen pressure on microstructure of lno conductive thin film has been studied by in situ reflection high energy diffraction ( rheed ) and ex situ x - ray photoelectron spectroscopy ( xps ). in the relatively low oxygen pressure, lno film displays spotty rheed pattern

    首先，通過原位高能電子衍射（ rheed ）及x光電子能譜（ xps ）研究了氧分壓對lno導電薄膜微結構的影響，並進一步提出了氧分壓對lno薄膜微結構的影響的機理。
  13. Secondly, the grafted membranes were prepared by grafting 2 - acrylamido - 2 - methyl propane sulfonic acid ( amps ) on pretreated membranes using cetric ammonium nitrate ( can ) as an initiator in the aqueous medium. the surface compositions of the grafted membranes were determined by fourier transform adsorption spectrum ( ftir ) and x - ray photoelectron spectroscopy ( xps ). and the morphology of the grafted membranes was studied by scanning electron microscopy ( sem ) and atomic force microscopy ( afm )

    然後，選用硝酸鈰銨作為引發劑， 2 -丙烯酰胺- 2 -甲基丙磺酸（ amps ）為接枝單體，在水溶液體系中進行接枝共聚反應制備pvdf ? g ? amps中空纖維膜，並利用傅立葉紅外光譜（ ftir ） 、 x光電子能譜（ xps ） 、掃描電子顯微鏡（ sem ）及原子力顯微鏡（ afm ）等檢測手段證實了接枝共聚物的存在。
  14. Xps depth measurement suggested that the films were compositionally homogeneous along the growth direction ; that the interdiffusion between znsxse1 - x and ito was not serious in this deposition process ; and a sharp interface had developed

    Xps深度剖析顯示所制備的薄膜，其內部成分均勻，無偏析和凝聚，界面清晰而陡峭，擴散不嚴重。
  15. Current researches, applications, preparation and structure of si3n4 are summarized in this paper. a new conclusion is drawn that silicon wafer can react with nitrogen at the temperature higher than 1100 and in super - pure nitrogen by direct - nitridation of silicon at the temperature from 800 to 1200. the prepared silicon nitride samples are tested by xps ( x - ray photoelectron spectroscopy ), sem ( scanning electron microscopy ), optical microscopy, xrd ( x - ray diffraction ) and edx ( energy dispersive x - ray analysis )

    通過矽片在800到1200各個溫度和各種氮氣氣氛下的氮化處理的實驗結果，報道了不同與其他研究者的氮化條件，矽片在氮氣保護的熱處理中的氮化條件為：高於1100的溫度和高純氮的氣氛條件，同時對該氮化硅薄膜進行了金相顯微鏡、掃描電鏡（ sem ） 、 x射線衍射儀（ xrd ） 、 x射線光電子譜（ xps ） 、 x射線能譜儀（ edx ）和抗氧化性等測試和分析。
  16. ( 5 ) cdse nano - wire arrays / aam composite, cdse nano - wire arrays and cdse nano - wire were prepared by template - electro - deposition in seleneous acid ( hasech ) solution and selenosulfite ion ( sesoa2 " ) solution. then the image, composition and structure of those products were investigated by sem, tem, eds, xps and x - ray diffraction ( xrd )

    （ 5 ）分別以hzseo3和seso32一為硒源，用模板一電沉積法在納米孔陣列aam模板中制備出cdse納米線陣列/ aam復合物，然後溶解掉納米孔陣列aam ，寧} ） ij得了cdse納米線陣列和cdse納米線。
  17. X - ray photoelectron spectra ( xps ) and fourier transform infrared ( ftir ) have been used to analyze the deposited ps films

    取上層懸液作電泳液，鋁片分別作正、負極， 200v cm電場下電泳20min 。
  18. The phases structure of the kapton film and protective film were determined by x - ray diffraction ( xrd ) and x - ray photoelectron spectroscopy ( xps )

    用x射線衍射分析（ xrd ） 、光電子能譜（ xps ）對基體薄膜及鍍膜的物相成分、化學結構進行表徵。
  19. The results of attenuated total reflectance - fourier transform infrared ( atr - ftir ), x - ray photoelectron spectroscopy ( xps ) and contact angle measurement showed that the amphiphilic copolymer could self - segregate on the hydrophobic pdl - la surface

    利用衰減全反射傅立葉轉換紅外光譜（ atr - ftir ） 、 x -射線光電子能譜（ xps ）分析以及接觸角測定對改性聚乳酸材料表面進行了表徵。
  20. After these processes, silver doped sca antibacterial stainless steel is prepared. the samples are investigated with sem ( scanning electron microscope xrd ( x - ray diffraction ), xps ( x - ray photoelectron spectroscopy ), contact angle test, erosion test, mechanism performance test and antibacterial test, and the relation between structure and property is discussed

    對制得的抗菌不銹鋼進行掃描電鏡、 x射線衍射譜、 x射線光電子譜、接觸角、耐蝕性測試、膜層機械性能測試、抗菌性能測試等分析，討論了樣品中膜層結構與性能間的關系。
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