斑紋干涉測量 的英文怎麼說
中文拼音 [bānwéngānshècèliáng]
斑紋干涉測量
英文
speckle interferometry- 斑 : Ⅰ名詞（斑點; 斑紋; 污點; 瑕疵） spot; speck; speckle; stripe; stain Ⅱ形容詞（有斑點或斑紋的） spo...
- 紋 : 名詞（花紋; 紋縷兒） lines; veins; grain
- 干 : 干Ⅰ名詞1 （事物的主體或 重要部分） trunk; main part 2 （幹部的簡稱） short for cadre Ⅱ動詞1 （做...
- 涉 : Ⅰ動詞1 （徒步過水 泛指從水上經過; 渡） wade; ford 2 （經歷） go through ; experience 3 （牽涉） i...
- 測 : 動詞1. （測量） survey; fathom; measure 2. （測度; 推測） conjecture; infer
- 量 : 量動1. （度量） measure 2. （估量） estimate; size up
- 斑紋 : stripe; streak; scaling斑紋病 spot stripe
- 測量 : measure; survey; gauge; meter; measurement; measuring; surveying; mensuration; metering; gauging;...
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This system provides photo elastic, moire, holographic, speckle technology contained in optical measure strain and displacement analysis software interface, and mainly realizes photo elastic image collection, interference image pretreatment, automatic skeleton extract method, automatic main strain trace protraction method and planar photo elastic image strain analysis function. all the work that the author has done has established a good foundation for more realization of an intact optical measure image strain analysis software system. furthermore, engineer and lab assistant can quickly obtain concise, intuitionistic and quantificational information
該系統提供了光測力學所包括的光彈法、雲紋法、全息法以及電子散斑法等技術應力和位移分析軟體實現的介面，主要實現了等差線圖像和等傾線圖像的採集、干涉條紋圖像預處理、全自動提取光彈條紋圖像骨架線、全自動繪制主應力跡線以及二維光彈應力分析功能，為進一步開發完整的光測力學圖像應力分析軟體奠定了基礎，同時使工程技術人員以及實驗人員能夠迅速的獲取簡明、直觀、定量的信息。Math. and physics department, yanshan university, qinhuangdao 066004 ) [ / align ] [ align = left ] [ b ] abstract [ / b ] : through the pictures taken by means of laser speckle on the metal material weldment, we can obtain double - exposed displacement patterns at a temperature range. by point - to - point analysis heat displacement field at the welding points can be measured, and the distribution of thermal strain and thermal stress can be obtained. as a result, the flaws at welding points can be measured through experiments
本文應用激光散斑法，其測量靈敏度介於全息干涉法和雲紋法之間，象所有其它散斑法一樣，它是一種非接觸式的測量技術，對環境及設備條件要求不高，對被測件表面不需進行特殊處理，可在生產現場對實際物體進行測試。
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