晶圓電測 的英文怎麼說
中文拼音 [jīngyuándiàncè]
晶圓電測
英文
wafer sort-
So in one hand it requires the wafer ' s diameter to be more large in order to enhance the productivity, and on the other hand it puts forward more strict requirement about the crystal perfection and electricity character. especially the electronic character and the equality of micro - area in the crystal wafer has become the key factor to determine whether the device can be made on it or not. so the resistivity measurement of micro - area become one most important procedure in the chip machining. to ensure the produce quality of chip and the perfect performance of final production, the four - probe testing technology need to be deeply studied
圖形日益微細化,電路尺寸不斷縮小,目前ic製造以8英寸、 0 . 13 m為主,預計在2007年左右將以12英寸、 65nm為主,這一方面要求圓片直徑不斷增大以提高生產率,另一方面對晶體的完美性、機械及電特性也提出了更為嚴格的要求。特別是微區的電學特性及其均勻性已經成為決定將來器件性能優劣的關鍵因素。因此,微區電阻率的測試成為晶元加工之中的重要工序。With yulon ' s reputation and financial power, worldwide fab and assembly house ' s support, anachip is devoted to provide total ic solutions to serve our customers, and expect to reach a great operational result together
藉由裕隆集團在企業界的聲望及財務奧援,與世界各地晶圓廠及封裝測試廠的配合,易亨電子將致力於提供客戶完整的集成電路方案,共同創造更亮麗的營運成果。While expensive eda tools are required for ic design, other types of equipment are also needed for other parts of the cycle, such as wafer fabrication, packaging, wafer bumping, testing, etc. currently, most hong kong ic design companies have to rely on overseas companies to perform these tasks
集成電路設計工作須要利用昂貴的電子設計自動化工具,但周期內其他環節如晶圓加工、封裝、晶圓凸塊製造、測試等,卻需要其他類型的儀器。目前香港大部分集成電路設計公司均要依賴海外公司進行有關工作。
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