橢圓分析儀 的英文怎麼說

中文拼音 [tuǒyuánfēnxīyí]
橢圓分析儀 英文
elliptic analyzer
  • 橢 : Ⅰ形容詞（卵形） oval-shapedⅡ名詞[書面語] （長圓形的容器） elliptic vessel
  • 分 : 分Ⅰ名詞1. （成分） component 2. （職責和權利的限度） what is within one's duty or rights Ⅱ同 「份」Ⅲ動詞[書面語] （料想） judge
  • 析 : Ⅰ動詞1. （分開; 散開） divide; separate 2. （分析） analyse; dissect; resolve Ⅱ名詞（姓氏） a surname
  • 儀 : 名詞1 （人的外表） appearance; bearing 2 （禮節; 儀式） ceremony; rite 3 （禮物）present; gift 4 ...
  • 橢圓 : [數學] oval; oval shaped; ellipse; ellipsoid橢圓規 ellipsograph; [圖] elliptic trammel; 橢圓軌道 ...
  1. Secondly, according to the basic theory of the general spectrometer, in this paper we discuss the fundamental, the compositions and the characters of tcecs. we analyze the main influencing factors for resolving power, such as the dispersion of the x - ray on the detection circle, spectra location error and the aperture width etc. and we put out the ways to resolving the problems

    接下來，本文根據經典光譜儀器的基本理論，著重討論了雙通道橢圓彎晶譜儀的基本原理，及其基本組成和基本特性，並從x射線波長在探測圓上的彌散度、光度參數與探測角之間的關系、狹縫寬度等方面對譜儀的精度和解析度的影響作了一定的分析，並提出了解決問題的辦法。
  2. This paper analyzes the non - symmetry of elliptic polarization oftwo linear polarized beams, which are perpendicular to each other, caused by their reflecting from a metal mirror. also, it studies the non - linear error created by polarization and how the errors change. the study is very important for improving the measuring accuracy of polarized heterodyne interferometer

    主要分析兩束相互垂直的線偏振光經過金屬反射鏡反射后引起的橢圓偏振化的不對稱性，並研究由此產生的非線性誤差的變化規律，這對提高偏振光外差干涉儀的測量精度是極為重要的。
  3. Abstract : this paper analyzes the non - symmetry of elliptic polarization oftwo linear polarized beams, which are perpendicular to each other, caused by their reflecting from a metal mirror. also, it studies the non - linear error created by polarization and how the errors change. the study is very important for improving the measuring accuracy of polarized heterodyne interferometer

    文摘:主要分析兩束相互垂直的線偏振光經過金屬反射鏡反射后引起的橢圓偏振化的不對稱性，並研究由此產生的非線性誤差的變化規律，這對提高偏振光外差干涉儀的測量精度是極為重要的。
  4. The chemical composition, micro - structure and optical properties and its application of tio2 thin films deposited on k9 glass by using reactive electron - beam evaporation ( reb ) are studied through sem, tem, xps, xrd, spectroscopic ellipsometry ( se ) and uv - vis spectrophotometer in the dissertation, and the progresses of nucleation and growth of thin film are discussed from the point of view of dynamics and thermodynamics so that a structure model of tio _ ( 2 ) thin film is brought forward

    本文採用sem 、 tem 、 xps 、 xrd 、橢圓偏振儀（ se ） 、 uv - vis分光光度計等分析手段系統地研究了電子束反應蒸發方法在k9玻璃上制備tio _ 2薄膜的成分、結構和光學性能以及tio _ 2薄膜在光學多層膜中應用，並開發了膜系設計軟體。文中還從動力學和熱力學角度分析了tio _ 2超薄膜的形核生長過程，得出了tio _ 2薄膜的組織結構模型。
  5. Analysis th to mechanism ellipse polarized light that in the specimen faced happen at the same time reflection refraction and multiplicity light beam interference, proves the principle that laser instrument of measure thickness of specimen with jones vector

    摘要對橢圓偏振光在樣品表面產生的反射、折射和多光束干涉的機制進行了分析，並用瓊斯矢量論證了激光測厚儀的原理。
  6. Finally, the paper analyses and discusses the collectivity design, the optics system design ( dispersion system, imaging system and the recording system ) and the typical mechanism design. then, it presents the total assemble graph of the spectrometer and the projects for aiming and alignment of tcecs. especially, twin channels are utilized

    最後，論文從雙通道橢圓彎晶譜儀的總體設計、光學系統（包括色散系統、成像系統、接收記錄系統）的設計和典型機械結構的設計等方面對整個譜儀的結構設計都加以了分析和討論，並給出了整個譜儀的總體裝配圖和瞄準對中方案。
  7. In this study, on the base of the present status and future development of semiconductor materials for solar cells, we have carried out the work to compose film structures of si - based materials by theoretical analysis and experimental methods, which have potential application in modules of solar cells. the processing, features of microstructure and optical properties of the designed si - based thin films have been studied in detail by employing methods of xrd, sem, afm, tem, raman, ftir, uv - vis, pl, and ellipsometry spectroscopy ( se )

    本文在全面總結目前太陽電池材料的研究現狀和其未來發展趨勢的基礎上，系統地從理論和實驗兩方面對應用在太陽電池板上的si基薄膜材料的結構進行了設計，用超高真空磁控濺射儀研究了其制備工藝，用了xrd 、 sem 、 afm 、 tem 、 raman 、 ftir 、 uv - vis 、 pl和橢圓偏光儀（ se ）等分析手段研究了薄膜的相結構、微觀組織特徵和其所具有的光性能。
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