氣體試驗 的英文怎麼說
中文拼音 [qìtǐshìyàn]
氣體試驗
英文
gas test-
Semiconductor devices - mechanical and climatic test methods - rapid change of temperature - two - fluid - bath method
半導體裝置.機械和氣候試驗方法.溫度速變.雙流體浸泡法Semiconductor devices - mechanical and climatic test methods - part 11 : rapid change of temperature ; two - fluid - bath method
半導體器件.機械和氣候試驗方法.第11部分:溫度的急速變化.雙液電鍍槽法Semiconductor devices - mechanical and climatic test methods - part 11 : rapid change of temperature - two - fluid - bath method
半導體裝置.機械和氣候試驗方法.第11部分:溫度的急速變化.雙液電鍍槽法Semiconductor devices - mechanical and climatic test methods - part 11 : rapid change of temperature ; two - fluid - bath method iec 60749 - 11 : 2002 ; german version en 60749 - 11 : 2002
半導體器件.機械和氣候試驗方法.第11部分:溫度驟變Inspection methods for basic parameters of environmental testing equipments for electric and electronic products - corrosive gas testing equipments
電工電子產品環境試驗設備基本參數檢定方法腐蝕氣體試驗設備Standard guide for mixed flowing gas tests for electrical contacts
電觸點的混流氣體試驗用標準導則Semiconductor devices - mechanical and climatic test methods - internal moisture content measurement and the analysis of other residual gases
半導體器件.機械和氣候試驗方法.其他殘余氣體的內部濕氣含量的測量和分析Semiconductor devices - mechanical and climatic test methods - part 16 : particle impact noise detection iec 60749 - 16 : 2003 ; german version en 60749 - 16 : 2003
半導體器件.機械和氣候試驗方法.第16部分:粒子碰撞噪Semiconductor devices - mechanical and climatic test methods - high temperature operating life
半導體器件.機械和氣候試驗方法.高溫操作壽命Semiconductor devices - mechanical and climatic test methods - part 23 : high temperature operating life
半導體器件.機械和氣候試驗方法.第23部分:高溫操作壽命Semiconductor devices - mechanical and climatic test methods - part 23 : high temperature operating life iec 60749 - 23 : 2004 ; german version en 60749 - 23 : 2004
半導體器件.機械和氣候試驗方法.第23部分:高溫操作壽Test gases - test pressures - appliance categories
試驗氣體.試驗壓力.儀器種類Test gases - test pressures - appliances categories ; german version en 437 : 2003
試驗氣體.試驗壓力.設備種類Semiconductor devices - mechanical and climatic test methods - part 26 : electrostatic discharge sensitivity testing ; human body model
半導體器件.機械和氣候試驗方法.第26部分:靜電放電敏感性試驗.人體模型Testing of gaseous fuels and other gases - determination of the components - part 5 : capillary gaschromatographic procedure
氣體燃料和其它氣體試驗.成分測定.第5部分:毛細氣體Laboratory glassware ; gas sampling tubes with straight bore stopcock and v - bore stopcock
實驗室玻璃器皿.第3部分:單通旋塞和v形旋塞氣體試樣Semiconductor devices - mechanical and climatic test methods - permanence of marking
半導體器件.機械和氣候試驗方法.永久性標記Semiconductor devices - mechanical and climatic test methods - part 20 : resistance of plastic - encapsulated smds to the combined effect of moisture and soldering heat
半導體裝置.機械和氣候試驗方法.第20部分:塑料密封的smds抗濕氣和釬焊熱綜合影響的性能Semiconductor devices - mechanical and climatic test methods - resistance of plastic - encapsulated smds to the combined effect of moisture and soldering heat
半導體器件.機械和氣候試驗方法.塑料包封的smds的抗濕及釬焊熱度綜合影響Semiconductor devices - mechanical and climatic test methods - part 33 : accelerated moisture resistance - unbiased autoclave
半導體器件.機械和氣候試驗方法.第33部分:加速抗濕.無偏壓熱器分享友人