淀積工藝過程 的英文怎麼說

中文拼音 [diàngōngguòchéng]
淀積工藝過程 英文
deposition process
  • : Ⅰ動詞(沉澱) form sediment; settle; precipitateⅡ名詞(淺的湖泊, 多用於地名) shallow lake
  • : Ⅰ動詞(積累) amass; store up; accumulate Ⅱ形容詞(長時間積累下來的) long standing; long pending...
  • : Ⅰ名詞1 (工人和工人階級) worker; workman; the working class 2 (工作; 生產勞動) work; labour 3 ...
  • : Ⅰ名詞1 (技能; 技術) skill 2 (藝術) art 3 [書面語] (準則) norm; standard; criterion4 [書面語...
  • : 過Ⅰ動詞[口語] (超越) go beyond the limit; undue; excessiveⅡ名詞(姓氏) a surname
  • : 名詞1 (規章; 法式) rule; regulation 2 (進度; 程序) order; procedure 3 (路途; 一段路) journe...
  • 過程 : process; procedure; transversion; plication; course
  1. In the depositing process, small angle x - ray diffraction method was used to measure thin films repeatedly, form which the optimized parameters of depositing soft x ray thin films were gained. under the parameters, five soft x ray multilayer mirrors were fabricated

    在多層膜的中,使用小角x射線衍射的方法對多層鏡進行了反復的標定,獲得了軟x射線短波段多層膜反射鏡沉的優化參數。
  2. In succession, tini thin film is deposited on single - crystal silicon substrate using optimized parameters utilizing sputtering, and its transformation temperature ( a * ) is 72 ? indicated by dsc curve after being annealed in an ultra - high vacuum ( uhv ) chamber. in addition, the composition of the silicon - based tini film was analyzed by an energy dispersive x - ray spectroscopy ( eds ), and the ti content in the film is approximately 51at %

    按照改進的參數,在單晶硅襯底上濺射-了tini薄膜,並進行了超高真空退火, dsc法測得其馬氏體逆相變峰值溫度為72 ,利用能譜分析( eds )技術測得其ti含量約為51at ,通對非晶tini薄膜與單晶硅襯底之間的界面進行eds及x射線衍射( xrd )分析,發現在用大功率( 2000w )直流磁控濺射法制備tini薄膜中,存在ti 、 ni與si的雙向擴散,發生了界面反應,並有三元化合物ni _ 3ti _ 2si生成。
  3. ( 1 ) two edt monomer synthetic paths have been investigated. ( 2 ) using the method of depositing the pedt film on the glass base, the affect of processing and environmental conditions - - such as the polymerizing temperature, the state of the polymer material, the polymerization correctives, the drying temperature, and the amount of the solution etc. - - to the pedt material ' s electroconductivity has also been examined in this paper

    主要研究內容包括: ( 1 ) edt單體合成路線的兩種方案,以及具體的制備; ( 2 )在玻璃基片上pedt膜層,研究了聚合溫度、聚合物狀態、聚合改良劑、烘乾溫度、溶劑含量等及環境條件對pedt材料電導率和成膜速度的影響。
  4. In this paper, the growth technology is presented for epitaxial silicon carbide films on sapphire with a buffer layer by atmospheric - pressure chemical vapor deposition ( apcvd ) process. the effect of temperature and precursors flow rates on the growth of silicon carbide films by chemical vapor deposition is analyzed. the structural properties of the films grown on sapphire compound substrate are studied by x - ray diffraction ( xrd ), x - ray photospectroscopy ( xps ) and photoluminescence spectroscopy

    本論文提出了在藍寶石上引入一層緩沖層材料形成復合襯底,採用常壓化學氣相( apcvd )方法在其上異質外延生長sic薄膜的技術,分析了cvd法生長sic的物理化學,通實驗提出sic薄膜生長的條件,並通x射線衍射( xrd ) 、 x射線光電子能譜( xps ) 、光致發光譜( pl譜)和掃描電鏡( sem )對外延薄膜的結構性質進行分析。
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