混合半導體 的英文怎麼說

中文拼音 [húnbàndǎo]
混合半導體 英文
mixed semi conductor
  • : 混形容詞1. (渾濁) muddy; turbid2. (糊塗; 不明事理) foolish; stupid
  • : 合量詞(容量單位) ge, a unit of dry measure for grain (=1 decilitre)
  • : Ⅰ數詞1 (二分之一) half 2 (在 中間的) in the middle; halfway 3 (比喻很少) very little; the l...
  • : 動詞1. (引導) lead; guide 2. (傳導) transmit; conduct 3. (開導) instruct; teach; give guidance to
  • : 體構詞成分。
  • 混合 : (攙雜在一起) mix; blend; mingle; admix; mixture; mix up; interfusion; commixture; blending; cre...
  1. Testing of materials for semiconductor technology ; determination of etch rates of etching mixtures ; silicium - dioxid coating ; optical method

    工藝材料的檢驗.蝕刻劑浸蝕率的測定.第2部
  2. Testing of materials for semiconductor technology ; determination of etch rates of etching mixtures ; silicium monocrystals ; gravimetric method

    工藝材料的檢驗.蝕刻劑浸蝕率的測定.第1部
  3. Semiconductor devices - integrated circuits - hybrid integrated circuits and film structures - manufacturing line certification - generic specification

    器件.集成電路.集成電路和薄膜結構.生產線認證.總規范
  4. Semiconductor devices - integrated circuits - hybrid integrated circuits and film structures - manufacturing line certification - blank detail specification

    器件.集成電路.集成電路和薄膜結構.生產線認證.空白詳細規范
  5. Semiconductor devices - integrated circuits - hybrid integrated circuits and film structures - manufacturing line certification - procedure for qualification approval

    器件.集成電路.第23 - 5部分:集成電路和薄膜結構.生產線認證.格鑒定規程
  6. Semiconductor devices - integrated circuits - part 23 - 5 : hybrid integrated circuits and film structures ; manufacturing line certification ; procedure for qualification approval

    器件.集成電路.第23 - 5部分:集成電路和薄膜結構.生產線認證.鑒定批準
  7. Semiconductor devices - integrated circuits - hybrid integrated circuits and film structures - manufacturing line certification - manufacturers ' self - audit checklist and report

    器件.集成電路.集成電路和薄膜結構.生產線認證.生產商自審清單和報告
  8. Semiconductor devices - integrated circuits - hybrid integrated circuits and film structures - manufacturing line certification - internal visual inspection and special tests

    器件.集成電路.集成電路和薄膜結構.生產線認證.內部目視檢查和特殊試驗
  9. Semiconductor devices - integrated circuits - part 23 - 2 : hybrid integrated circuits and film structures ; manufacturing line certification ; internal visual inspection and special tests

    器件.集成電路.第23 - 2部分:集成電路和薄膜結構.生產線認證.內部審查和特殊試驗
  10. Hic has been the important technical channel for realizing the small - scale, multi - functional, high - performance, highly reliable military electric equipment, for hic make good use of high - integration, high - speed and other characters of sic, and formed a new - generation advanced microelectronic assembly technique

    集成電路( hic )充分利用集成電路( sic )高集成度、高速等特點,形成新一代高級的微電子組裝技術,並已成為實現軍用電子裝備小型化、多功能化、高性能化、高可靠性的重要技術途徑。
  11. Semiconductor devices integrated circuits part11 : section 1 : internal visual examination for semiconductor integrated circuits excluding hybrid circuits

    器件集成電路第11部分:第1篇:集成電路內部目檢不包括電路
  12. Harmonized system of quality assessment for electronic components - semiconductor devices - integrated circuits - sectional specification for semiconductor integrated circuits excluding hybrid circuits - internal visual examination for semiconductor integrated circuits excluding hybrid circuits

    電子元器件質量評估協調系.器件.集成電路.不包括電路的集成電路分規范.不包括電路的集成電路分規范.不包括電路的集成電路的內目測檢驗
  13. The optical feedback self - mixing model is studied when the external cavity of a semiconductor laser suffers a harmonic vibration

    摘要在外腔簡諧振動條件下,研究激光器的光反饋自干涉系統模型中的測量參數。
  14. Jennic is unique in combining expertise in systems and software with world class rf and digital chip design, so our integrated circuit solutions for these wireless sensor networks lead the market in size, power, and cost

    2004重新定位,成為技術領先的無工廠供應商。核心技術: rf與訊號設計,嵌入式系統及網路協定開發。超過四十人的技術團隊,超過五年的共同開發經驗。
  15. On the mixed boundary value problem for a conductor equations with nonlinear mobility

    一類帶非線性遷移率方程的邊值問題
  16. According to the raman selection rule and the pl measurement, it is reasonable to evaluate the quality of galnp / algalnp mqw by analyzing the relative intensity ratio of a1p - lo / to. ( 4 ) a new modified random element isodisplacement ( mrei ) model is set up to calculate the dependence between the long - wavelength optical phonon frequencies and the composition of iii - v - type ab1 - xcx mixed crystals. the second neighbor force constants are still assumed to be a linear variation with the composition, but the two first neighbor force constants can be evaluated to be a negative exponent variation with the composition, using the overlapped repulsive potential of the ion crystal combination

    通過實驗我們找到了在這些結構參數上生產gainp algainpmqw的較理想的結果; ( 3 )首次用喇曼( raman )散射方法研究了常溫下的gainp algainp多量子阱結構,除了指認出喇曼光譜中各光學聲子模外,還結樣品光致發光譜的測量結果,分析發現喇曼光譜中alp - lo to的相對強度比可以在一定程度上評定晶gainp algainpmqw的生長質量; ( 4 )在修正的隨機元素等位移? mrei模型的基礎上建立了一個新模型,計算了ab _ ( 1 - x ) c _ x型?族晶的長波長光學聲子模頻率的組分變化關系。
  17. The pd packaged in the laser diode can detect the signal of the self - mixing speckle interference and determine the motion state of the target

    封裝在激光器另一側的光電二極,檢測光學反饋生成的自散斑干涉信號,確定物的狀態。
  18. Fortune semiconductor corp. ( fsc ), founded in 1995, positioned as an ic - supplier in the field of mixed signal processing technology, whose products ' main application fields are battery management, power management, electronic scales, digital multimeters, health - care products, and energy utilization measurement

    富晶股份有限公司成立於1995年,定位在信號處理技術領域的ic供應商,產品主要應用領域為電池管理、電源管理、電子秤、耳溫槍、多用途電表、健康保健、能源量測等。
  19. Testing of materials for semiconductor technology - determination of etch rates of etching mixtures - part 3 : aluminium, gravimetric method

    技術試驗.蝕刻劑浸蝕率測定.第3部分:鋁.測
  20. Abstract : a hybrid algorithm for solving carrier transport equations ofsemiconductor device is presented in this paper

    文摘:針對器件模擬中載流子方程兩種基本演算法在高注入條件下的不足,提出了一種演算法。
分享友人