測膜鏡 的英文怎麼說

中文拼音 [jìng]
測膜鏡 英文
leptoscope
  • : 動詞1. (測量) survey; fathom; measure 2. (測度; 推測) conjecture; infer
  • : 名詞1. [生物學] (像薄皮的組織) membrane 2. (像膜的薄皮) film; thin coating
  • : Ⅰ名詞1 (鏡子) looking glass; mirror 2 (幫助視力或做光學實驗的器具) lens; glass 3 (姓氏) a s...
  1. The membrane structure and surface features were analyzed by ft - ir and scan electron micrography

    用傅立葉紅外光譜和掃描電分別定了的結構和表面形貌。
  2. The structure and the optical functions of porous anodic films were studied by xrd, sem and spectro - photometrical means

    摘要採用x射線衍射、掃描電( sem )和光譜分析等試技術,研究了多孔氧化鋁介質的組成、結構以及光功能特性。
  3. Therefore, in principle the scattering may be predicted from measurements of the surface profile. in this paper the author also discussed nonspecular scattering for mo / si multlayer coated primary and secondary mirrors of the measured schwarzschlid optics based on power spectral density of these mirrors measured by both optical profilometer ( wyko ) and atomic force microscopy ( afm )

    因此,我們可以通過檢多層反射基底的粗糙度來表徵多層反射面散射對光學系統性能的影響,亦即通過檢多層反射基底的粗糙度調整拋光工藝參數,獲得低散射的多層反射
  4. The chemical composition and microstructures of the insulating thin films prepared by different methods were analyzed by x - ray diffraction ( xrd ) and scanning electron micrograph ( sem ) ; other properties such as electric resistance, the breakdown field strength and dielectric properties were evaluated using high resistance meter, voltage resistance meter and precision impedance analyzer respectively

    採用x射線衍射儀( xrd )對表面絕緣薄的物相組成進行了分析,掃描電子顯微( sem )對表面絕緣薄的微觀結構進行了研究,並用絕緣電阻試儀、耐壓試儀和精密阻抗分析儀分別對絕緣進行絕緣電阻率、擊穿場強和介電性能的試。
  5. Components, structure and surface morphology of the resulted films were identified by fourier transform infrared ( ftir ) spectroscopy, x - ray diffraction ( xrd ) and scanning electronic microscopy ( sem ). the analyses showed the content of cubic boron nitride in the resultant films on substrates was rather high and crystal particles of c - bn with uniform size, smooth crystal plane and regular shapes ( quadrangle and hexagon ) densely arrayed on the substrate

    傅里葉轉換紅外吸收( ftir )光譜儀、 x射線衍射( xrd )儀和掃描電( stm )的量結果顯示,基底上的bn中立方相含量很高,且晶粒大小均勻、排列緻密,晶形呈規則的四角和六角形。
  6. Methods : to divide the anatomic area into several parts : sigmoid sinus, jugular bulb, semicircular canal, internal acoustic meats, cerebellopontine angle area, duramater. simulated the partial labyrinthectomy and endoscopic surgery on 20 adult cadaveric specimens, measured correlative data, observed correlative anatomic structure. all data analysied by sas

    方法:在20例40側成人屍頭上模擬迷路后徑路橋小腦角區內手術和部分迷路切除術,將相關解剖結構分為乙狀竇、頸靜脈球、半規管、內聽道、橋小腦角區、硬腦等幾個區域,分別觀察相關解剖結構及量相關數據,量結果用sas軟體進行統計學分析。
  7. Besides, the growth of gasb expitaxy film was monitored by reflection high energy electron diffraction ( rheed ). the rheed images and intesity oscillation are collected by computer system. it showed that the gasb film prepared in 400 was amorphous and it became monocrystalline when the temperature rose to 500. atomic force microscope ( afm ) was applied to analyse the surface morphology of the films which were grown in diffrent growth rates or substrate temperature. the analysis were compared to simulation results. the experiment results indicated it was easy to form clusters when the rate of growth is high or

    此外,本文通過反射式高能電子衍射( rheed )監了gasb外延薄的生長,利用rheed強度振蕩的計算機採集系統實現了rheed圖像和rheed強度振蕩的實時監。實驗發現在400生長的gasb薄為非晶態,溫度升高到500薄轉變為單晶。利用原子力顯微對不同生長速率和襯底溫度生長的gasb薄的表面形貌進行觀察分析,並與模擬結果進行比較。
  8. We introduce the fabrication of all samples and anneal of fexcu ( 1 - x ) granular film in detail. the configuration of granule film is investigated by scanning tunneling microscope ( stm ). the matter phase is analyzed by x - ray diffraction ( xrd ). the hysteresis loop of co / al2o3 / feni magnetic tunnel junction is studied by vibrating sample magnetometer ( vsm ). we use microresistance test system ( mts ) to investigate the character of resistance, conductance, voltage and current

    用掃描電子顯微( stm )觀察顆粒樣品的表面形貌;用x ?射線衍射儀( xrd )對顆粒樣品進行物相分析;用振動樣品磁強計( vsm )對co al _ 2o _ 3 feni隧道結的磁滯回線作了研究;用微電阻試系統對樣品電阻、電導、電流、電壓相關特性進行詳細的研究。
  9. The components, microstructure, luminousness, thickness and surface topography of the films were analysised via xrd, uv ? vis, xps, ellipsometric examination and stm. the photocatalytic properties of these fims are characterized by the decomposition rate of methylene blue or rhodamine b. the effect of sputtering power, temperature, o2 mass flow, bias, w - doping and sputtering time on photocatalytic properties are discussed

    採用x射線衍射儀、紫外-可見光分光光度計、 x光電子能譜儀、薄厚度試儀及掃描探針顯微試手段,研究分析了薄的組分、結構、透光率、厚和表面形貌等。
  10. Elastic recoil detection technique with high depth resolution has been developed at the hi - 13 tandem accelerator of ciae. with high quality beam which was used for bombarding target, the recoils were detected with q3d magnetic spectrometer following a focal plane detector and a ae - e telescope detector with longitudinal double - room ionization chamber

    該系統用高質量的重離子束轟擊薄或塊材靶樣品,利用q3d磁譜儀及其焦面探器和縱向型雙電離室e ? e望遠器兩套探系統,在前角區量了靶中各種元素的反沖能譜。
  11. For xrd, ellipsometry examinations, single - side - polished si ( lll ) wafers were used as substrates and for resistance measurement, glass was used and for infrared examination, double - side - polished si ( lll ) wafers were used and for ultraviolet - visible spectrophotometry, double - side - polished quartz wafers were used and for tem micrograph and electron diffraction pattern observation, cu nets deposited by formvar film were used. the cu - mgf2 cermet films were from 50 to 600nm thick

    用於xrd分析、橢偏量的單拋si ( 111 )晶片和電阻試的載玻片上淀積厚約為600nm ;用於ir試的雙拋si ( 111 )晶片和uv試的石英玻璃片上淀積厚約為250nm ;用於透射電分析的樣品則淀積在400目銅網上的支撐formvar上,厚約為50 100nm 。
  12. The course covers non - sequential ray tracing, sources, detectors, objects, ray splitting, scattering, ghost analysis, stray light analysis, prisms, fresnel lenses, multi - element lenses, gradient index, polarization and thin film modeling

    本課程涵蓋了非連續光線的追跡、光源、探器、物體、分光、散射、鬼像分析、雜散光分析、棱、菲涅耳透、多元件透、梯度折射率、偏振和薄的建立。
  13. The degrees of crystallinity of pure ptfe under the different conditions of water cooling, air cooling and furnace - varying cooling were made comparison by xrd. the thermal stability of pure ptfe and solid lubricant was analyzed by dsc - tg ; the composition and valence state of elements in the surface of carbon fiber, solid lubricant before and after friction test and lubricant transfer film were characterized by xps ; the frictional property of solid lubricant was tested by pin and disk test rig. the frictional wear property of solid lubricant between embedded bearing sleeve and steel axle friction pair ring was tested by special simulate test machine, the hardness of solid lubricant was tested by pm ; the compression strength of solid lubricant was tested by material test machine

    用sem表徵原料微觀結構、摩擦表面及潤滑轉移表面形貌:用xrd進行原料物相分析,及比較水冷卻、空氣冷卻、隨爐冷卻三種工藝條件下的純聚四氟乙烯樹脂的結晶度;用dsc - tg分析純聚四氟乙烯樹脂及固體潤滑劑的熱穩定性;用xps表徵碳纖維表面、固體潤滑劑摩擦前後表面、潤滑轉移表面的元素組成、價態變化;用銷盤式摩擦磨損試驗機對固體潤滑劑進行摩擦性能試;採用專用的臺架模擬試驗機對固體潤滑劑鑲嵌軸承套與鋼軸摩擦副間的摩擦磨損性能進行定;用萊次偏光顯微( pm )試固體潤滑劑的硬度;用材料試驗機試固體潤滑劑的抗壓強度等。
  14. Design and test of good performance and broad - hand antireflection thin films based on glan - thompson prism

    高性能寬帶減反射的研製及性能
  15. Zno thin films were deposited on silicon ( si ) and glass substrate by reactive radio frequency sputtering ( rf ) technique with zinc target in the mixed gas of ar ando2, and used zno buffer improving the quality of zno thin film. the effects of parameters on the thickness, composition, texture, morphology, optical properties and electrical properties of zno thin films had been systematically investigated by means of xrd, xps, sem, afm, pl and hall test system

    採用x射線衍射( xrd ) 、 x射線光電子能譜( xps ) 、掃描電子顯微( sem ) 、原子力顯微( afm ) ,光致發光譜( pl )和霍爾效應試技術系統研究了濺射工藝和退火工藝對zno薄的厚度、成分、織構、表面形貌、光學性能和電學性能的影響規律。
  16. All my samples with good orientation are prepared by rf sputtering. then we invest surface morphology and crystal structure, optical and electrical properties of zno films by afm, xrd, hall testing, ultraviolet - visible spectrum photometer and xps et al. zno films are fabricated on gaas substrate

    本文用射頻反應磁控濺射制備了高度c軸擇優取向的zno薄,採用原子力顯微( afm ) 、 x射線( xrd ) 、 hall試儀、紫外?可見分光光度計和x光電子能譜等分析試手段,研究了樣品的表面形貌、晶體結構、光學和電學性能等。
  17. Fourth, the advanced surface analysis technique - x ray photoelectron spectrum is employed to study the adsorption of soluble - starch on the pvdf membrane. then we test by using xps combined with sem the original sample, the fouled sample and the washed sample with rubber sponge balls

    第四,採用x射線光電子能譜( xps )技術分析了可溶性澱粉在聚偏氟乙烯表面的吸附,並將xps技術與電子顯微技術相結合,對原始樣品、污染樣品和海綿橡膠球清洗樣品進行了試和分析。
  18. From the third chapter to the sixth chapter we mainly discuss a novel moisture permeation ratio measurement method, and model was developed qualitatively and quantitatively with the ‘ calcium degradation test ’ method

    第四章,主要介紹了鈣腐蝕法量滲透率所用的系統組成,這個系統由ccd攝像頭、顯微和計算機組成,並介紹了用於本系統的程序。
  19. The morphology of single cell and the ultrastructure of cell membrane were observed. by means of afm, the ultra - thin sections of murine es cells were investigated in order to make afm capable of gaining the information of the inner structure of cells. in addition, the morphological changes and damaging effect of trichosanthin ( tcs ) on red blood cell ( rbc ) membrane were observed by afm

    對原子力顯微( atomicforcemicroscope , afm )的成像技術進行了多方面探索;用afm研究膠原蛋白分子在雲母表面的吸附和自組裝行為;對小鼠胚胎幹細胞和人血紅細胞進行afm成像,觀單個細胞的形態以及細胞的微觀結構;利用afm得到了小鼠胚胎幹細胞超薄切片的高解析度圖像,探索用afm研究細胞內部結構,拓展其應用領域;天花粉蛋白( tcs )和紅細胞的相互作用,利用afm觀察到天花粉蛋白( tcs )和紅細胞相互作用前後紅細胞超微結構的變化,據此討論了二者的作用機理。
  20. In this paper, the stl technique with cw modulated top - hat beam excitation is investigated theoretically and experimentally. 1. the theoretical model based on the fresnel diffraction integral is developed to describe the stl signal excited with the cw modulated top - hat beam for the first time to the best of our knowledge

    本論文提出採用連續調制的平頂光束作為激勵光的表面熱透技術量薄吸收的方法,主要開展了如下工作: 1 .建立了連續調制的平頂光束作用下樣品的表面熱透信號模型。
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