磁測厚計 的英文怎麼說
中文拼音 [cícèhòujì]
磁測厚計
英文
magnetic thickne gauge-
For the purpose of ensuring the quality of our products, our company has invested 4 million rmb in building multi - purpose lab, and introducing almighty experiment machine, impulsion testing machine, ultrasonic digital thickness - testing device, full - automatic ultrasonic thickness - testing device, sclerometer, ultrasonic flaw detector, x - ray machine, magnetic particle flaw detector and other advanced quality inspecting devices
為了確保產品的質量，公司投資400多萬元建起了多功能實驗室，配備了機械式萬能試驗機沖擊試驗機超聲波數字測厚儀全自動超聲測厚儀里氏硬度計超聲波探傷儀x射線機磁粉探傷儀等先進的質量檢測設備。The phase structure of different cu - fe thin films were studied by using grazing incidence x - ray analysis ( gixa ). the texture and residual stress of different cu - fe thin films were measured by scan of x - ray diffraction ( xrd ) and 2 scan with different. the thicknesses of different thin films were characterized by means of small angle x - ray scattering ( saxs ) technique. by using atomic force microscope ( afm ) measured surface roughness of thin films. the component of different thin film was characterized by energy disperse spectrum ( eds ) and x - ray fluorescence ( xrf ). the magnetic properties of cu - fe thin films were measured by means of vibrating sample magnetometer ( vsm ). in addition, the giant magnetoresistance ( gmr ) effects of different films were also measured. the original resistance of the film fabricated by a direction - current magnetron sputtering system is directly affected by bias voltage
利用掠入射x射線分析（ gixa ）技術對不同cu - fe薄膜的相結構進行了研究;利用xrd掃描及不同角度的2掃描對薄膜進行了結晶織構及殘余應力分析;運用小角x射線散射（ saxs ）技術測量了薄膜的厚度;採用原子力顯微鏡（ afm ）觀察了薄膜的表面形貌;運用能量損失譜（ eds ）及x射線熒光光譜（ xrf ）對薄膜進行了成分標定;使用振動樣品磁強計測量了不同cu - fe過飽和固溶體薄膜的磁性能;最後利用自製的磁阻性能測試設備測量了真空磁場熱處理前後不同薄膜的巨磁阻值。( 4 ) the study of the optical band gap of cnx film by uv - vis spectrophotometer. ( 5 ) by using the microhardness tester, we study the hardness of cnx film on the ceremic substrate by dc magnetron reactive sputtering with the feed ar and n2 flow rate, film thickness, substrate temperature and substrate bias
（ 5 ）用直流磁控反應濺射法，以陶瓷作為襯底，對在ar和n2不同流量、不同膜厚、不同基片溫度和對基片施加不同偏壓下沉積的薄膜，用< wp = 4 >顯微硬度計研究測試了不同工藝參數下的相應硬度。This paper investigates the em properties of carbonyl - iron / epoxy ds, including measuring and calculating the em parameters of the ds, the influence of matrix, particles content and thickness on absorbing properties
本文對羰基鐵粉環氧顆粒分散體系的電磁性能進行研究，包括體系的等效電磁參數的測量和計算，體系基體、顆粒含量、厚度等對吸波性能的影響等。To measure the size of ba - ferrite fine magnetic particles, electromagnetic field was employed to drive the fine magnetic particles displace in order, then scanning electron microscope ( sem ) was used to observe and measure the size of ba - ferrite fine magnetic particles
為了迅速、準確地測定鋇鐵氧體磁粉顆粒的厚度、直徑和厚徑比的統計分佈，採用對磁顆粒施加外加電磁場的方法，使各個磁顆粒的易磁化軸方向趨於一致，並用掃描電子顯微鏡觀察鋇鐵氧體磁粉顆粒。分享友人