紫外掃描儀 的英文怎麼說
中文拼音 [zǐwàisǎomiáoyí]
紫外掃描儀
英文
uv scanner- 紫 : Ⅰ形容詞（紅和藍合成的顏色） purple; violet Ⅱ名詞（姓氏） a surname
- 外 : Ⅰ名詞1 （外面） outside; external side 2 （外國） foreign country 3 （以外） besides; beyond; in ...
- 掃 : 掃構詞成分。
- 描 : 動詞1. （照底樣畫） copy; depict; trace 2. （在原來顏色淡或需改正之處重復塗抹） retouch; touch up
- 儀 : 名詞1 （人的外表） appearance; bearing 2 （禮節; 儀式） ceremony; rite 3 （禮物）present; gift 4 ...
- 掃描儀 : ct
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The components, microstructure, luminousness, thickness and surface topography of the films were analysised via xrd, uv ? vis, xps, ellipsometric examination and stm. the photocatalytic properties of these fims are characterized by the decomposition rate of methylene blue or rhodamine b. the effect of sputtering power, temperature, o2 mass flow, bias, w - doping and sputtering time on photocatalytic properties are discussed
採用x射線衍射儀、紫外-可見光分光光度計、 x光電子能譜儀、薄膜厚度測試儀及掃描探針顯微鏡等測試手段，研究分析了薄膜的組分、結構、透光率、膜厚和表面形貌等。The defect and interface in sapphire and gan were observed by afm. we found that when the dislocation density in sapphire was lower thanl05 / cm2, the dislocation density in gan was 108 ~ 109 / cm2and not linear with the dislocation in sapphire. the impurity of mo in sapphire and gan was measured by sem xps epma and uvf we found the mo content in sapphire was 10 - 4, and the mo content in gan was lower than ppm. so it was concluded that low - cost mo crucible is viable
用掃描電鏡（ sem ） 、 xps 、電子探針和紫外熒光光譜儀測量了藍寶石襯底和gan外延層中的mo雜質的含量，發現藍寶石襯底中含有mo雜質，含量約為10 ~ （ - 4 ） （質量含量） ；而在外延層gan中沒有檢測到mo雜質，即mo雜質含量小於ppm級。In this thesis we have expatiated on the methods of the c60 thin films preparation, and the process with vacuum evaporation. the effect, which was caused by different gas pressures and other element doped, on surface morphology, structure and optical properties of c60 films have been studied by using scanning electron microscopy ( sem ), ultraviolet visible optical absorption spectroscopy ( uv / vis ) ( type : uv - 240 ), ellipsometer and x - ray diffraction
本論文闡述了用真空蒸鍍法制備c60薄膜的方法和過程，研究了在不同氣氛下生長和摻雜對c60薄膜的表面形貌、結構和光吸收特性的影響；用xl30fge型掃描電鏡對c60薄膜表面形貌進行觀察；用uv - 240型紫外可見光雙光束分光光度計進行紫外、可見光吸收測量；用橢偏儀對薄膜進行厚度和折射率測量；用x射線衍射對薄膜結構進行分析。
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