衍射峰 的英文怎麼說

中文拼音 [yǎnshèfēng]
衍射峰 英文
diffraction maximum
  • : [書面語]Ⅰ動詞(開展; 發揮) spread out; develop; amplifyⅡ形容詞(多餘) redundant; superfluousⅢ名...
  • : Ⅰ動詞1 (用推力或彈力送出) shoot; fire 2 (液體受到壓力迅速擠出) discharge in a jet 3 (放出) ...
  • : Ⅰ名詞1. (山的突出的尖頂) peak; summit 2. (形狀像山峰的事物) peak-like thing Ⅱ量詞(用於駱駝)
  1. And then, we measured x - ray diffractive spectrum of samples and investigated the crystal lattice structure of samples treated under different annealing temperature and different implantation condition comparing the diffraction peaks

    然後,通過x測量了樣品的譜,通過比較不同樣品衍射峰的形狀,了解了不同退火溫度及注入條件下樣品的晶格結構情況。
  2. After the cu - al mixed powder was milled 96h, the lattice constant of cu ( 111 ) plane became 0. 3653nm, and the diffraction peaks of aluminum have disappeared completely, which showed that aluminum atoms have dissolved in crystal lattice of copper

    當cu - al混合粉末球磨時間大於96h時, cu的( 111 )面的點陣常數變為0 . 3653nm , al的衍射峰已完全消失。通過分析可知,經過96h的球磨, al原子已經完全吲溶於cu的晶格中。
  3. This work was initiated to establish an in - situ xrd measuring system through which the variations of xrd peak intensities on the surfaces of plzt ferroelectrics with fatigue numbers during an electric process can be in - situ observed

    本工作通過建立原位xrd觀測系統,對電疲勞過程中plzt鐵電陶瓷試樣表面x衍射峰隨疲勞次數的變化進行了原位觀測。
  4. Pure cdte films have high electrical resistivity and are slightly p - type, due to the formation of cd vacancies in the cdte lattice acting as acceptor centers. the sheet resistivity of films are about 1010 ? / ?. the sheet hole concentration is 105 - 6 / cm2 and the hall mobility is about hundreds cm2 / v. s. the structural and electrical properties of cdte films doped te are markedly different from pure cdte films

    ,面載流子濃度約105 - 6 / cm2 ,載流子遷移率為幾百cm2 / v . s ;摻雜te元素后,薄膜衍射峰強增大,薄膜結構上出現了第二種相成分?六方結構的te ,由衍射峰強判斷該相比例較小,同時cdte薄膜的衍射峰向低角度偏移,晶格< wp = 5 >常數增大。
  5. Another phase, the high temperature phase, is hexagonal with space group p - 62m, which is stable from 300 to 800. the lattice parameter and the full width of half maximum ( fwhm ) of xrd peaks of u3o8 were also investigated at different temperature, and it were found that they change with the temperature under rules

    在兩種相結構各自穩定的溫度范圍內, u _ 3o _ 8的點陣參數以及衍射峰半高寬( fwhm )出現了有規律的變化,這種變化表明u _ 3o _ 8的晶體結構依賴于環境溫度的變化。
  6. The effect of deposited condition, include substrate temperatures, different substrates and annealing on the structural properties of zno films has been studied in considerable detail. it is found that the optimal conditions to deposit zno are below : the substrate temperature of 450c, the substrate of sapphire. the sample on this condition is 0. 3491

    通過分析襯底溫度、不同襯底和退火對樣品結構的影響,得到了樣品的最佳制備條件:襯底溫度450 、藍寶石襯底,此條件下制備的樣品具有高度( 002 )取向性, ( 002 )衍射峰半高寬僅僅0 . 3491 ,原子力顯微鏡( afm )分析表明zno薄膜具有密集堆積的均勻柱狀晶粒。
  7. The diffraction peak angle does n ' t change obviously as co / fe ratio, it is attributed to the radius of co fe ions are fairly similar, so the influence of substitutions on unit cell is small

    而隨著co fe比的變化,衍射峰角度值變化不明顯,這是由於co 、 fe離子半徑相差不大,它們之間的位置取代對晶胞的整體影響相對較小。
  8. Ft - ir, xrd results showed hexagonal structural character were kept, xrd and tem results showed that the samples have the well ordered degree. it was analysized that all n2 adsorption isotherms of the samples belong to langmuir iv category which is related to mesoporous materials. the samples had uniform mesoporous distribution and high surface areas

    Ft - ir 、 xrd分析顯示,萃取處理方法得到的介孔材料保持了六方周期性排列的結構特徵, xrd衍射峰較窄,說明介孔具有長程有序性,同時tem照片也表明了介孔氧化硅材料具有長程有序的結構特徵。
  9. The formation process of w - type ferrite underwent from oxide of metal, the m - type transition phase to final w - phase. when the heating rate was 5 / min, at 900 for 3 hrs and 1200 for 4 hrs, pure m - type and w - type ferrites were formed in air respectively. with heat treatment temperature increasing, crystal structure was more intact, the saturation magnetization increased and the coercive force decreased

    熱處理過程表明, m型鐵氧體直接由金屬氧化物反應形成,未經歷尖晶石中間相; w型鐵氧體形成由金屬氧化物到m相過渡相最終向w相的轉變;當升溫速率為5 min ,溫度在900 ,保溫3小時和1200保溫4小時,就分別形成單相m相和w相鐵氧體;隨著熱處理溫度的升高和保溫時間的延長,衍射峰變尖銳,結晶更完整,空心微球的飽和磁化強度增大,矯頑力減小。
  10. Moreover, the diffraction peak shifts toward high angle as sr content increases. it is ascribed to the substitution of la3 + by sr2 + in lscf increases the average radius of a ions and causes a charge imbalance

    且隨著sr含量的增加,衍射峰值向高角度方向稍有偏移,這是由於低價sr ~ _ ( 2 + )取代高價la ~ ( 3 + )增加了a位離子的平均半徑,同時引起電荷不平衡。
  11. Experimental results show that the grains were gradually triturated to namometer size with milling time and the grain size might be 30nm or so, but the grain size was not decreasing after the powder has been milled for 25 hours. the nano - sized sic was synthesized by ball milling of si and c mixed powders which rare earths as a additive was added to

    結果表明:隨著時間的延長,粉末逐漸細化至納米級,可以細化到30nm左右,但球磨時間超過25h后粉末顆粒繼續細化的速度明顯放慢,並且在球磨的過程因為晶粒細化和晶粒內部發生了嚴重的晶格畸變,納米粉體x衍射峰產生嚴重寬化。
  12. It showed that better crystal films could formed when sintered between 350 ~ 550 for 3 hours. with the increasing of temperature and the extending of time, the diffraction apices became stronger and the crystal became bigger

    薄膜電極的燒結工藝研究結果表明,當燒結溫度在350 ~ 550燒結時間為3h時得到結晶良好的limn2o4薄膜,隨著溫度的升高,衍射峰越來越明顯,晶粒越來越大。
  13. Xrd test results showed that pp polymer chains have intercalated lays of ommt among the series pp - b. tem observed that ommt was stripped and close to the single layer of slices ; among the series pp - a, the characteristic diffraction peak of ommt still appeared the original position, which prove pp polymer chains were too difficult to intercalate directly lays of ommt, tem observed that ommt have serious reunion phenomenon and the majority exist by form who regiment form a cluster

    Xrd測試結果表明: pp - b系列中的pp高分子鏈已經插層進入到有機蒙脫土的片層間, tem觀察有機蒙脫土大部分被剝離成接近單層片狀; pp - a系列中,有機蒙脫土的特徵衍射峰仍出現在原位置,說明pp大分子鏈很難直接插入蒙脫土片層間, tem觀察有機蒙脫土較嚴重的團聚現象,大部分以團簇的形式存在。
  14. ( 211 ) reflection of the polycrystal a - iron sample is used in the simulation experiments, and both the resulting full - width - at - half - maximum ( fwhm ) of the diffraction peaks and peak shifts under tensive and compressive strain are in accord with that expected from analytical methods. the instrumental resolution curves, under various combination of the first collimator and second collimator and take - off angle of the monochromator, are given

    用- fe多晶樣品的( 211 )晶面進行了模擬實驗,得到的衍射峰半高寬以及拉應變和壓應中國原子能科學研究院博士學位論文變作用下衍射峰移動的模擬結果都與解析方法的預期值符合得很好。
  15. Vanadyl phthalocyanine ( vopc ) films prepared by vacuum deposition were annealed under magnetic field. uv - visible absorption results showed that the films annealed under magnetic field showed a q - band red - shift. x - ray diffraction study ( xpj ) ) indicated enhancement in diffraction intensity and shift of peak position

    分析表明酞菁氧釩分子uv - vis吸收譜q帶值發生較大的紅移; xrd測試中衍射峰強度明顯增強,位變化,但寬變化不大;原子力顯微鏡( afm )分析發現晶粒大小無明顯變化。
  16. It was the first time that the silica nanoparticles was coated with gd2o3 : eu rare - earth oxides, then the core - shell structure compound particles were obtained. the characterizations showed that the thickness of uniform coating is in 10 - 20nm ; the silica core is linked with the gd2o3 : eu shell by chemical bond si - o - gd ; because of the size effects and interface effects of nano - crystal coating, the diffraction and emission peaks become broadened. and at the same time, the transfer temperature of silica from amorphous to crystal is decreased

    首次在納米sio2表面包覆一層gd2o3 : eu稀土復合氧化物,得到了核-殼結構的復合顆粒,表徵結果表明,均勻包覆層的厚度為10 - 20nm ; sio2核和gd2o3 : eu殼層物質之間通過化學鍵si - o - gd鍵的作用結合在一起;由於包覆層納米晶的尺寸效應和界面效應使xrd衍射峰和熒光光譜發出現了寬化現象。
  17. The x - ray diffraction analysis of the compound powder showed that the value of the diffraction peak reduced, the breadth of the diffraction peak broadened. there was incrystallizing to a certainty degree of the compound powder

    粉末的x - ray分析表明,粉末的衍射峰值降低,增寬,粉末體系產生了一定程度的非晶化。
  18. One diffraction peak of the secondary phase was found in the xrd spectrum of sample annealing at 850 for 15s

    在850 + 15s退火處理的樣品中發現了第二相形成的衍射峰
  19. The dependency of tic content versus relative intensity of x - ray diffraction peak was also studied

    K值法研究確定了tic含量與xrd衍射峰相對強度的關系。
  20. It is verified that the oxide have obvious characteristic diffraction peaks and less impurity by x - ray diffraction ( xrd )

    X( xrd )分析表明,制備出的氧化物樣品特徵衍射峰明顯,雜質含量少。
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