電子能譜學 的英文怎麼說

中文拼音 [diànzinéngpǔxué]
電子能譜學 英文
electro spectroscopy
  • 電 : Ⅰ名詞1 （有電荷存在和電荷變化的現象） electricity 2 （電報） telegram; cable Ⅱ動詞1 （觸電） give...
  • 子 : 子Ⅰ名詞1 （兒子） son 2 （人的通稱） person 3 （古代特指有學問的男人） ancient title of respect f...
  • 能 : 能名詞（姓氏） a surname
  • 譜 : Ⅰ名詞[書面語]1 （按類別或系統編成的書或冊子等） table; chart; register 2 （指導練習的格式或圖形）...
  • 學 : Ⅰ動詞1 （學習） study; learn 2 （模仿） imitate; mimic Ⅱ名詞1 （學問） learning; knowledge 2 （學...
  • 電子 : [物理學] [電學] electron
  1. Abstract : the effect of correction of self - consistent potential on electronic structure in simple cubic nanocrystal particles is calculated by means of the green ' s function method in the tight - binding approximation, taking only the nearest neighbor matrix elements into account. the numerical results show that the electronic energy spectrum is shifted, the chemical potential is not equal to the atomic energy level, the electronic density at each lattice point is changed, and the variation of electronic density at surface lattice point is the largest

    文摘:在緊束縛近似下，只計及最近鄰的矩陣元，採用格林函數計算了自洽勢修正對簡立方納米晶體顆粒的電子結構的影響，發現電子能譜發生了移動，化學勢不等於格點原子能級，各格點的電子密度也發生了變化，其中以表面格點的電子密度變化最大。
  2. Surface states and the topmost surface atoms of the batio3 thin films have been analyzed by x - ray photoelectron spectroscopy ( xps ) and angle - resolved x - ray photoelectron spectroscopy ( arxps ). the results show that the as - grown batio3 thin films have an enriched - bao nonstoichiometric surface layer which can be removed by ar + ion sputtering, and the atomic ratio of ba to ti decreases with increasing the depth of ar + ion sputtering

    用x射線光電子能譜技術（ xps ）和角分辨x射線光電子能譜技術（ arxps ）研究了薄膜的表面化學態以及最頂層原子種類和分佈狀況，結果顯示在熱處理過程中薄膜表面形成一層富含bao的非計量鈦氧化物層，並且鋇-鈦原子濃度比隨著探測深度的增大而逐漸減小。
  3. This study was focused on the occurrence characteristics of the cryptomelane - bearing ores and the mineralogical characteristics of natural cryptomelane. the morphology, chemical and structure features of natural cryptomelane were characterized by means of powder x - ray diffraction, scanning electron microscopy, electron probe microanalyzer, energy dispersive spectrometer and x - ray fluorescence

    利用x -射線粉晶衍射掃描電鏡電子探針電子能譜和x熒光光譜對天然錳鉀礦的形貌特徵化學成分結構特徵進行研究，結果表明天然錳鉀礦晶體形態主要為針狀纖維狀，沿
  4. Zno thin films were deposited on silicon ( si ) and glass substrate by reactive radio frequency sputtering ( rf ) technique with zinc target in the mixed gas of ar ando2, and used zno buffer improving the quality of zno thin film. the effects of parameters on the thickness, composition, texture, morphology, optical properties and electrical properties of zno thin films had been systematically investigated by means of xrd, xps, sem, afm, pl and hall test system

    採用x射線衍射（ xrd ） 、 x射線光電子能譜（ xps ） 、掃描電子顯微鏡（ sem ） 、原子力顯微鏡（ afm ） ，光致發光譜（ pl ）和霍爾效應測試技術系統研究了濺射工藝和退火工藝對zno薄膜的厚度、成分、織構、表面形貌、光學性能和電學性能的影響規律。
  5. All my samples with good orientation are prepared by rf sputtering. then we invest surface morphology and crystal structure, optical and electrical properties of zno films by afm, xrd, hall testing, ultraviolet - visible spectrum photometer and xps et al. zno films are fabricated on gaas substrate

    本文用射頻反應磁控濺射制備了高度c軸擇優取向的zno薄膜，採用原子力顯微鏡（ afm ） 、 x射線（ xrd ） 、 hall測試儀、紫外?可見分光光度計和x光電子能譜等分析測試手段，研究了樣品的表面形貌、晶體結構、光學和電學性能等。
  6. 2 studying of the properties of cbn thin films afm showed that cbn thin film delaminated from substrate obviously. basing xps, we calculate the nib ratio to be 0. 90 that is closing to unity, and the thickness of hbn layer on cbn layer that is about 0. 80 nm

    根據x射線光電子能譜，計算得到立方氮化硼薄膜中的n和b的原子數比為0 . 90 ，接近理想化學配比1 ；立方氮化硼薄膜頂層的六角氮化硼的厚度約為0 . 80nm 。
  7. Abstract : in this paper, the adherent properties of pet fabric treated by corona - discharge were studied through esca and wettability, the application of two mechanisms in terms of weak boundary layer and chemical structure on fabric surface was discussed

    文摘:本文通過光電子能譜和表面潤濕實驗來研究經電暈放電處理后的滌綸織物的表面性能，探討了弱界面層和化學結構兩種理論在粘合中的應用。
  8. In order to discuss the friction and wear mechanisms of mos2 nanoparticles, it was analyzed that the chemical status of elements existed on the rubbed surface by x - ray photoelectron spectroscope, and it was observed that the surface topography of wear zone by scanning electron microscope

    通過x射線光電子能譜儀（ xps ）分析磨痕表面元素的化學狀態，掃描電子顯微鏡（ sem ）對磨痕的表面形貌進行分析，從而總結了納米二硫化鉬在n46機械油中的摩擦磨損機理。
  9. In this paper, such three points are studied as : a ) the angular distributions of the hot electrons emission under laser irradiation at different incidence angles and at different polarization direction, the angular distribution of the hot electrons in the different energy range, and the effects of laser prepulse on the angular distributions of the hot electrons emission ; b ) the energy distribution of the hot electrons at different directions, from the metallic targets and the dielectric targets, in the different energy range of the hot electrons, and the effects of the atomic number z on the energy distribution of hot electron generated by the metallic targets ; and c ) the energetic proton emission resulting from the interaction of the us - ui laser pulse with plasma

    本論文進行了三個方面的研究：第一，超熱電子角分佈的研究，包括不同激光入射角下超熱電子的角分佈；激光不同偏振態下超熱電子的角分佈；激光預脈沖對超熱電子角分佈的影響；不同能段的超熱電子的角分佈。第二，超熱電子能量分佈的研究，包括不同方位超熱電子的能量分佈，金屬與非金屬靶材的超熱電子的能量分佈，金屬原子序數z對超熱電子能量分佈的影響以及不同能段超熱電子的能量分佈。第三，研究了超短超強激光與固體靶相互作用所產四川大學博士學位論文生的高能質子發射和能譜。
  10. The phases structure of the kapton film and protective film were determined by x - ray diffraction ( xrd ) and x - ray photoelectron spectroscopy ( xps )

    用x射線衍射分析（ xrd ） 、光電子能譜（ xps ）對基體薄膜及鍍膜的物相成分、化學結構進行表徵。
  11. X ray photoelectron spectroscopy x

    射線光電子能譜學
  12. The tribological characteristics of ultrafine ws2 powders added in engine oil have been investigated by four - ball machine test, and compared with chloroparaffins ( t302 ) and molybdenum disulphide ( mos2 ), and meanwhile we have analyzed the tribochemical species of the worn surface by means of x - ray photoelectron spectroscope ( xps ), to research the lubricating mechanism of ws2

    摘要採用四球摩擦實驗機對二硫化鎢超細粉末在發動機油中的摩擦學性能進行了研究，並與添加劑氯化石蠟和二硫化鉬進行了比較，同時用x射線光電子能譜儀對磨痕表面元素進行分析，以探討二硫化鎢的潤滑機理。
  13. The reason was that pma was linear polymer and that the incompatibility of pdms and pma leaded microphase separation. additional, xps analyzed the three kinds of elements in surface and interior of ipn, the results indicated that the content of the elements c, si and 0 were misdistribution and different in surface as well as in interior of ipn. the reason was the poor compatibility of pdms and pma, and found that amount of initiator and the reaction rate effected the distribution

    另外，本論文還通過xps電子能譜儀對工pn材料的表層和內層的化學元素c 、 51 、 o進行分析，發現表層與內層中的三種元素的含量並不相同，也沒有規律可循，說明在形成ipn結構過程中，由於兩相相容性不一致，它們的微運動趨向于兩相分離，同時發現引發劑用量和反應速度對元素分佈影響較大。
  14. Ftir and xps proved that ptcda and tcpc were attached on the surface of silicon by covalent ; afm and uv - vis showed ptcda and tcpc arranged orderly on surface of silicon ; through raman spectrum, we found that macrocycle molecules stand on surface of silicon, while macrocycle molecules in film by vacuum deposition parallel to silicon surface

    紅外光譜和光電子能譜證明了?和酞菁成功的化學鍵合到單晶硅表面， afm和uv - vis吸收光譜表明了?和酞菁單層膜在硅基上呈有序排列。拉曼光譜的研究發現?酐分子大環以一定的角度立於硅基表面，而不是平行於基體表面，與蒸鍍手段得到的?酐膜的堆積形態完全不同。
  15. The formation of self - assembled interfacial n - dodecanethiol monolayer and its effect on the corrosion protection of epoxy coating were evaluated using the x - ray photoelectronic spectroscopy, electrochemical impedance spectroscopy, impedance - time transition, and phase angle - time transition method

    採用x射線光電子能譜、電化學阻抗譜、阻抗時間譜和相位角時間譜等方法對硫醇自組裝界面層及其對塗層腐蝕防護性能的影響進行了研究。
  16. The x - ray photoelectron spectroscopy ( xps ) spectra data demonstrate that stoichiometric ceo2 is formed

    通過x射線光電子能譜（ 」 s ）證實了化學計量的ceo :己經形成。
  17. In this paper, the growth technology is presented for epitaxial silicon carbide films on sapphire with a buffer layer by atmospheric - pressure chemical vapor deposition ( apcvd ) process. the effect of temperature and precursors flow rates on the growth of silicon carbide films by chemical vapor deposition is analyzed. the structural properties of the films grown on sapphire compound substrate are studied by x - ray diffraction ( xrd ), x - ray photospectroscopy ( xps ) and photoluminescence spectroscopy

    本論文提出了在藍寶石上引入一層緩沖層材料形成復合襯底，採用常壓化學氣相淀積（ apcvd ）方法在其上異質外延生長sic薄膜的技術，分析了cvd法生長sic的物理化學過程，通過實驗提出sic薄膜生長的工藝條件，並通過x射線衍射（ xrd ） 、 x射線光電子能譜（ xps ） 、光致發光譜（ pl譜）和掃描電鏡（ sem ）對外延薄膜的結構性質進行分析。
  18. The surface morphology and root - mean - square surface roughness of the sio _ 2 films are characterized by scanning electron microscopy ( sem ) and atomic force microscopy ( afm ). the compositional properties of the sio _ 2 films are analyzed by x - ray photoelectron spectroscopy ( xps ). the effects of experiment parameters are discussed

    對採用不同實驗參數沉積得到的硅基sio _ 2光波導薄膜材料，用掃描電子顯微鏡（ sem ） 、原子力顯微鏡（ afm ） 、 x射線光電子能譜（ xps ）等方法對材料的表面形貌、粗糙度以及化學組成等特徵進行了研究。
  19. Abstract : the surface chemistry of a high modulus and a low modulus carbon fiber, both before and after nitric acid oxidation, were studied by x - ray photoelectron spectroscopy ( xps ) and chemical derivatization

    文摘:採用x光電子能譜（ xps ）及化學衍生法探討了硝酸氧化前後的碳纖維表面化學的變化。
  20. In the present dissertation, nanocomposite thin films and extended molecular devices were prepared via the electrostatic self - assembly monolayer technique. the structures and the properties of the thin films were studied by uv - vis spectroscopy, x - ray diffraction spectroscopy, x - ray photoelectron spectroscopy, laser raman spectroscopy, atomic force microscopy, fiber optic experimental setups and so on. a novel fiber optic humidity sensor based on the self - assembled polyelectrolyte multilayer thin films was presented, and other thin film devices were also described

    在對納米復合薄膜研究的重要性及自組裝薄膜技術的發展動態進行綜合分析的基礎上，開展了利用靜電吸附自組裝技術制備納米復合薄膜及廣義的分子器件的研究，採用紫外-可見光光譜儀、 x射線衍射儀、 x射線光電子能譜儀、激光拉曼光譜儀、原子力顯微鏡、光纖光學系統等研究了復合薄膜的結構與性能，研製了一種光纖濕度傳感器和其他薄膜器件。
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