電測厚度儀 的英文怎麼說
中文拼音 [diàncèhòudùyí]
電測厚度儀
英文
electric thickness gauge-
My factory craft equipment advanced, technical force abundant, examines well appointed, has the computer laser granularity cryoscope, the luminosity meter, the electric conductance meter, the albedo meter and so on, the product quality is stable, obtains the customer the consistent high praise and the approval, this factory satisfies the customer by the remarkable product and the high quality service the request
我廠工藝裝備先進，技術力量雄厚，檢測設備齊全，擁有電腦激光粒度測定儀、光度儀、電導儀、白度儀等，產品質量穩定，得到客戶的一致好評和認可，本廠以卓越的產品和優質的服務來滿足客戶的要求。Management content : the company product mainly covers the microscope, the tool maker ' s microscope, the projecting apparatus, the sclerometer, the thickness gauge, the magnifying glass, the balance, the measuring instrument quantity meter, the mapping equipment, the metering equipment, to test the instrument, the electrochemistry instrument, the physical instrument, the analytic instrument, the biochemistry instrument, the non - destructive inspection, the medical instrument, the processing machinery and so on altogether 28 broad headings, 170 minor sort large - scale specialized precision instrument measuring appliance sale enterprises
經營內容：公司產品主要涵蓋顯微鏡、工具顯微鏡、投影儀、硬度計、測厚儀、放大鏡、天平、量具量儀、測繪儀器、測量儀器、實驗儀器、電化學儀器、物理儀器、分析儀器、生化儀器、無損檢測、醫療器械、加工機械等共28大類， 170餘個小類的大型專業精密儀器儀表銷售企業。Aberration of electronic lens made by electron gun and aberration of magnetic deflection system made by dy are comprehensively investigated, so is the shadow mask ' s effect on electron beam landing screen error. the conclusion can be get that, because the distribution of electron beam landing screen ( distribution of luminance ) is affected by many kinds of factors, it cannot get the correct function by calculation, and should be get by measurement instead
全面分析了cpt電子槍發射系統形成的電子透鏡像差與磁偏轉系統形成的偏轉像差；分析了蔭罩的自身厚度與位移對電子束著屏的影響，並由此得出結論，著屏電子束分佈（即亮度分佈）受著許多因素的影響，理論分析是半定量的，著屏電子束分佈需要用精確的測量儀器來測量。The company main product includes : the vacuum electron gun, opticsmembrane level thickness measuring instrument, the electron gunscanning control meter, the high efficiency crystal thyratron pressureregulator, the precise optics with the power source, the electricitycontrol the cabinet, the data acquisition module and so on
公司主要產品有：真空電子槍、光學膜層厚度測量儀、電子槍掃描控制儀、大功率晶閘管調壓器、精密光學用電源、電氣控制櫃、數據採集模塊等。The components, microstructure, luminousness, thickness and surface topography of the films were analysised via xrd, uv ? vis, xps, ellipsometric examination and stm. the photocatalytic properties of these fims are characterized by the decomposition rate of methylene blue or rhodamine b. the effect of sputtering power, temperature, o2 mass flow, bias, w - doping and sputtering time on photocatalytic properties are discussed
採用x射線衍射儀、紫外-可見光分光光度計、 x光電子能譜儀、薄膜厚度測試儀及掃描探針顯微鏡等測試手段，研究分析了薄膜的組分、結構、透光率、膜厚和表面形貌等。Nuclear instrumentation - thickness measurement systems utilizing ionizing radiation - definitions and test methods
核儀器裝置.利用電離輻射的厚度測量系統的定義和試驗方法The thickness, microstructure and hardness of the samples were measured using microscope, sem and micro - hardness meter
利用電鏡、光學顯微鏡和顯微硬度計等分析儀器，對試樣的厚度、顯微組織和顯微硬度進行了檢測和分析。Firstly, optical trigonometry measurement principle and wok principle of linear ccd are introduced, which are based on to design optical focusing and imagery system with he - ne laser instrument as illuminant. secondly, peripheral circuit of linear ccd is designed in theory and experiment. finally non - contact thickness measurement instrument is constructed, using ccd as photoelectric transformation element and microprocessor as the controller
本文首先介紹了光學三角法測量原理，並對線陣ccd的工作原理進行了研究，以此為基礎採用氦氖激光器為光源，設計了光學聚焦及成像系統，對線陣ccd外圍電路的設計進行了理論設計和實驗研究，最後設計了以ccd為光電轉換元件，以微處理器為控制核心的非接觸式厚度測量儀及其系統。We also have high precision microscope to make the inspection and the analyzing to the components
利用高精度測量顯微鏡，金屬電鍍層厚度測量儀等可進行零部件檢測分析。Prepared technical parameters were optimized by l9 ( 34 ) experiment analysis. a unique method for cleaning and drying of substrate - cleaning used by scour, drying used by infrared light was fished out by large numbers of experiment. chemical mechnism of zno thin film prepared by sol - gel technique was discussed by dta for the first time. by the measurements of sem, xrd and uvs, the thin film was analysed. the result proved that the thin film with strongly preferred orientation of c - axis perpendicular to the substrate surface which surface was homogenous, dense and crackfree was the crystalline phase of hexagonal wurtzite. the thin film was composed of plentiful asteroidal crystal which crystal dimension approximately 10 30nm. the average transmittance of thin film in visible region was above 90 %. the results of measurements else also proved that the thickness of single dip - coating was 75 240nm, this films resistivity was found to be 3. 105 102 3. 96 105 ? cm. the thickness and resistivity of thin film influenced by dope - content, withdrawal speed, pre - heat - treatment, anealing were reseached respectively
利用xrd 、 sem以及uvs光譜儀等分析方法對薄膜進行了研究，結果顯示，所制備的薄膜為六方纖鋅礦型結構，具有高c軸擇優取向性；表面均勻、緻密，薄膜材料由許多星狀晶粒組成，晶粒尺寸大約為10 - 30nm左右；薄膜可見光透過率平均可達90 % ；對薄膜厚度以及電學性能進行了測定后發現：單次鍍膜厚度約為75 - 240nm ， al ~ （ 3 + ）離子摻雜型氧化鋅薄膜的電阻率在3 . 015 102 - 3 . 96 103 ? cm范圍內；分別研究了摻雜濃度、提拉速度、預燒溫度、退火溫度等工藝參數對薄膜厚度和電阻率的影響。Michelson interferometer has a simple structure, and is applied earliest
Michelson干涉儀結構簡單，最早被用來檢測壓電薄膜厚度的變化。It is a synthesis combined with optical, mechanical and electrical knowledge. under the control of computer this meter not only can realize many noncontact measurements in high definition and efficiency without destroying object surface, but also can be easy to fulfill some automatic demands like dynamic sampling, real time processing, on - line measuring. so it will be well used in the modern industry measurement and has a wide prospect in the future
在計算機控制下，光、機、電相結合的微厚測量儀，不僅能實現高精度、高效率的非接觸測量，不破壞被測物體表面，而且易於實現動態采樣、實時處理、在線測量等自動化要求，因而在現代化的工業測量中將具有廣泛的應用和前景。In this thesis we have expatiated on the methods of the c60 thin films preparation, and the process with vacuum evaporation. the effect, which was caused by different gas pressures and other element doped, on surface morphology, structure and optical properties of c60 films have been studied by using scanning electron microscopy ( sem ), ultraviolet visible optical absorption spectroscopy ( uv / vis ) ( type : uv - 240 ), ellipsometer and x - ray diffraction
本論文闡述了用真空蒸鍍法制備c60薄膜的方法和過程，研究了在不同氣氛下生長和摻雜對c60薄膜的表面形貌、結構和光吸收特性的影響；用xl30fge型掃描電鏡對c60薄膜表面形貌進行觀察；用uv - 240型紫外可見光雙光束分光光度計進行紫外、可見光吸收測量；用橢偏儀對薄膜進行厚度和折射率測量；用x射線衍射對薄膜結構進行分析。The company has a professional quality inspection section and rigid quality standard, internationally advanced testing equipment for pull, thickness and combustible content, and checking analyzing apparatuses automatically controlled by the computer. each step of the glass fiber manufacturing, from adding, mixing, churning, dispersing and drying to finished product, is completed with advanced technology and strictly according to the quality system, forming a diverse composition of the glass fiber products, which apply in a large range
公司擁有專業的質檢部門和嚴格的質檢標準，國際先進的拉力，厚度，可燃物含量等檢測設備和全電腦檢測分析儀，玻纖生產，從加料混合攪拌分散烘乾等到成品，每一步都在長海嚴格的質檢體系和先進的生產工藝保證下完成，也使長海玻纖製品實現了多樣化的產業布局，產品有著廣泛的應用范圍A high - resolution and high - precision instrument, dyamic capacitance measuring instrument of thin - film thick - ness, is introduced in this paper
摘要本文介紹一種高精度高解析度的儀器電容式動態薄膜測厚儀。分享友人