電花電阻 的英文怎麼說
中文拼音 [diànhuādiànzǔ]
電花電阻
英文
spark resistance-
Incondition of surface anti - corrision and insulation coat of metal and tiny hole of steel where resistance and crack is very small, when supplying a high voltage, gas crack will be punctured and electric spark discharging will occur, now send a pulse signal to the alarming circuit the alarmer can send out sound and light to alarm. we can do leak hunting on the coating according to this principle
金屬表面絕緣防腐層過薄、漏鐵及漏電微孔處的電阻值和氣隙密度都很小，當有高壓經過時就形成氣隙擊穿而產生火花放電，給報警電路產生一個脈沖信號，報警器發出聲光報警，根據這一原理達到防腐層檢漏目的。Inductive resistance current limiter is comprised of series reactor with lower reactance, damping resistor and sparkle gap
電感電阻型限流器由電抗值較小的串聯電抗器阻尼電阻器和火花間隙等三部分組成。The factory specially produces electronic high frequency ceramic parts, electric ceramic, electro thermal ceramic, optical ceramic, and various fine ceramic parts, main have porcelain lamp holder, porcelain lampstand, chem lamp holder, optical lamp holder, optical resistance, accessories and art ceramic, fine flower plateetc
我廠專業生產電子高頻陶瓷件，主要有電器陶瓷，電熱陶瓷，光源陶瓷，以及各種精陶瓷配件；還生產各種低壓電器陶瓷件，主要有瓷燈頭，瓷燈座，碘鎢燈頭，光源燈頭，瓷電阻，煤氣燃具瓷打火針，感應針和異形陶瓷等多品種配件以及工藝陶瓷精品花盆等。Butt welding method is to weld neon lamp with resistor through butt weld machine without sparks. the welding is reliable with tiny welding point, size is as per customer s requirements
焊接氖燈熒光輝光燈採用無火花電焊接機將氖燈或熒光輝光燈與電阻進行焊接焊接可靠焊點小無虛焊脫焊現象。Test method for ceramic insulators of spark plug. test method for heat insulating resistance
火花塞瓷絕緣體試驗方法.高溫絕緣電阻試驗方法Because the former test results were stable and accurate, it was the nation ' s standard method and arbitration basis. the latter was convenient and fast, and therefore, it was commonly applied when the moisture content of the textile was determined in the department for purchasing the cotton fiber and the cotton - tested laboratory of the textile enterprise
其中，烘箱法因測試結果穩定、準確，是國家標準方法和仲裁依據；直流電阻測濕法方便快捷，在棉纖維收購部門和紡織企業棉檢室採用的棉花水分含量測定中得到了較普及的應用。By means of resistance and capacitance coupled negative feedback method to control the plasma discharge development process and prevent the transition from glow discharge to spark discharge in a pin - to - plate static air plasma generator, a stable alternative current atmospheric glow discharge is produced successfully
在靜態大氣壓空氣針板等離子體發生器中，採用阻容耦合負反饋方法控制等離子體放電發展過程，成功地抑制了輝光放電向火花放電的過渡，產生了穩定的交流輝光放電。In the research and preparation procedure, it probes into electric field dynamic impedance variation rules, summarizing a set of sparks critical point discrimination methods in solving the key to detect electric field less - spark technology and realizing the less - sparks operation controlling function under impending arcover voltage, putting forward and realizing constant spark rate operation mode, in fiashover treatment adopting method of small descending amplitude, speedy picking up speed, and unlocking silicon controlled rectifier
在研製過程中探索了電場動態阻抗變化規律，總結出一套識別火花臨界點的方法，解決了探測電場少火花的技術關鍵，實現了逼近擊穿電壓下少火花運行控制功能，提出和實現了恆定火花率運行方式，在閃絡處理上採取下降幅度小、回升速度快、不封鎖可控硅的方法。Four arrays of apparent resistivity are arranged at this measuring surface of granite sample symmetrically with symmetrical four - electrode method, and at an angle of 45 between any two adjacent arrays. the elastic constraint is exerted on 4 surfaces for parallel to the longest dimension of the sample. the samples are compressed along the direction parallel to the longest dimension of the cubic, and the variation of apparent resistivity during the whole loading process is observed
在花崗巖標本測量面上，布設4條夾角互為45的視電阻率測線，將標本平行長軸方向的4個面加上彈性約束，沿標本長軸方向加壓，測量標本視電阻率隨軸向應力的變化，實驗結果為： 1巖石視電阻率變化形態顯上升-平穩-下降形態，但平穩段不明顯，時間很短2視電阻率開始下降時間，比其他受力方式實驗結果都早，約提前10 %破裂應力。At present, the problem in testing sheet resistance for micro - areas is that probes must be set up at the suitable locations by handwork. in order to know the wafer ' s impurity distributing, we need test many times, so will waste a lot of time. if the wafer ' s diameter would be 300mm, this problem will be more serious. in this paper, image analysis is introduced, through pre - processing and edge picking - up, the probe tips are recognized. then probe tips will be aligned respectively in two perpendicular directions through driving stepper motors. thus the distribution of sheet resistance for whole wafer is got by automatic testing and it offers information for detecting the impurity distribution and the diffusion uniformity
這樣，完成200mm （ 8時）圓片雜質的擴散分佈需要對許多圖形進行測試，需要花費很長的時間，當測試300mm矽片時問題就更為突出。本文將圖象與視覺測量系統引入四探針測試系統中，對採集到的原始探針圖像進行預處理、邊緣提取等操作，以便實現探針針尖的識別，然後由電機控制實現探針的自動定位。這樣測試系統可以自動獲得全片的薄層電阻分佈，為超大規模集成電路檢測雜質分佈和擴散的均勻性提供信息。Resistor type spark plug
電阻型火花塞分享友人