電遷移 的英文怎麼說

中文拼音 [diànqiānyí]
電遷移 英文
electromigration
  • 電 : Ⅰ名詞1 （有電荷存在和電荷變化的現象） electricity 2 （電報） telegram; cable Ⅱ動詞1 （觸電） give...
  • 遷 : Ⅰ動詞1. （遷移） move 2. （轉變） change 3. （古時指調動官職） be appointed to a certain post Ⅱ名詞（姓氏） a surname
  • 移 : Ⅰ動詞1. （移動） move; remove; shift 2. （改變; 變動） change; alter Ⅱ名詞（姓氏） a surname
  • 遷移 : move; remove; migrate; shift; transport; migration; transference; removal
  1. To clear ground, the nuremberg streetcar depot had to be removed.

    要想廓清場地，紐倫堡電車總站必須遷移。
  2. Metals and other substances that allow the motion of electric charge through them are called conductors.

    金屬和其他容許電荷在其中遷移的材料叫做導體。
  3. Pilsenite is a rare mineral and its information is deficient. the first found pilsenite in china is in gaozhuang, henan province. pilsenite, associated with pyrrhotite, pyrite, hessite, gold, produced in pyrrhotite - polymetallic stage. three bismuth - tellurides produced in gaozhuang are well concordant with the standard pilsenite in composition, and other three are different from any of known bismuth - tellurium minerals. single crystal diffraction were made on a larger mineral grain of pilsenite. au growth and decline together with bi and te in ores and wall - rocks, which suggests that bi and te play a important role in migration and enrichment of au

    經電子探針分析，高莊金礦有多種鉍碲化物，有三粒礦物的成分與標準葉碲鉍礦完全一致。對一較大顆粒的葉碲鉍礦做了單晶x射線衍射分析。 au與bi在礦石和圍巖中的含量呈共消長關系， te與bi可能對au ag的遷移富集起了重要作用。
  4. On the basis of optoelectronic dynamics and nucleation and growth model, we simulated photosensitive process by the following steps : the creation of optoelectrons, carriers " transmission and decay, until the formation of latent image. in our simulation code, monte carlo method was adopted in order to simplify the algorithm

    本工作以光電子動力學理論為依據，利用成核生長（ nucleation & growth ）理論模型，並在此基礎上採用montecarlo方法，模擬了光電子的產生、遷移、衰減、直到形成潛影中心為止的感光過程。
  5. Study on characteristic of electric transfer of so2 in corona discharge electric field

    2在放電電場中的電遷移特性研究
  6. Mobility of ions

    離子的電遷移率
  7. Atoms in the solder joints move as a result of both diffusion and electromigration

    另一方面，擴散和電遷移效應，則造成焊點中的原子移動。
  8. As an electric current passes through, the joule heating and electromigration effects occur in the flip chip solder bumps

    當電流通過焊點時，會伴隨產生焦耳熱效應和電遷移效應。
  9. There are many aspects of power grid integrity analysis, for example, analysis of ir drop and analysis of electromigration

    電源網格的完整性分析包含很多方面，如irdrop分析，金屬電遷移等。
  10. Standard test method for estimating electromigration median time - to - failure and sigma of integrated circuit metallizations metric

    集成電路金屬噴鍍總量和電遷移中值失效時間的評定標準試驗方法
  11. Standard guide for design of flat, straight - line test structures for detecting metallization open - circuit or resistance - increase failure due to electromigration metric

    檢測由電遷移造成的噴鍍金屬開路或阻力增加失效率用的平板直線試驗結構設計的標準指南
  12. Based on the theoretical studies, a band - pass filter circuit is optimized in order to decrease current density and increase the electromigration lifetime

    在理論研究基礎之上，藉助于計算機輔助設計，針對一個帶通濾波器電路進行了電路優化，以提高其電遷移壽命。
  13. About the techniques of the reliability design, a common method for 1c reliability design is introduced and the failure principles of electronmigration are studie d

    在可靠性設計方面，介紹了集成電路可靠性設計的一般方法。影響鋁互連的電遷移失效的各種因素中，電流密度是主導因素。
  14. Consequently, the metal interconnects of vlsi have smaller sectional area and carry increasing power density, which made the electromigration become one of the main latent damage modes

    作為vlsi互連線的金屬薄膜的截面積越來越小，其承受的功率密度急劇增加，使得電遷移成為電路的主要失效模式之一。
  15. Based on the model of the interconnect failure, taking the existence of defect into account, the influence of the open soft fault on the interconnect reliability is deeply studied, and a new lifetime model of interconnect is presented

    本文從互連線失效的電遷移模型出發，考慮到缺陷存在時，由局域缺陷導致的開路軟故障對互連線可靠性的作用，給出了缺陷統計分佈情況下新的互連線壽命模型。
  16. After briefly describing the damage mechanism of electromigration, noises theories and signal processing methods, many kinds of experimental assessing methods of electromigration, such as the traditional mtf test, the test of changes of resistance and noise measurement, etc., are reviewed in this paper, and its research on the technology of noises detection has been studied emphatically

    本論文在簡要介紹電遷移失效機理、噪聲理論和1 / f信號表徵方法的基礎上，對各種電遷移可靠性實驗評估方法（傳統的壽命測試法、電阻變化測量法、噪聲測量法）的特點作了分析對比。重點研究了vlsi金屬互連電遷移噪聲檢測技術。
  17. Metal aluminium film em in general ac stress has been researched with fourier decomposition, developing a metal aluminium film em life model under in general ac stress

    藉助于脈沖波形的傅里葉級數分解，研究了一般交流應力條件下金屬化電遷移的影響因素，建立了一般交流應力條件下金屬鋁膜電遷移壽命模型。
  18. Special attention is paid to the consequences of methanol crossover in cathode reaction and cathode over - potential. good agreement is found between simulations and experiments in regard to the v - i character of dmfcs. based on the theory of parallel electrode reaction, it becomes possible to obtain quantitatively the value of over - potential caused by methanol crossover, which is either implicit or not included in the overall cathode over - potential in previous models

    該模型涵蓋了dmfc中的主要物理化學過程，包括：甲醇水溶液在膜電極內的擴散、對流和電遷移；質子在陽極催化劑層和陰極催化劑層內的傳遞；氧氣、水蒸汽在陰極的擴散；陽極催化劑層內的甲醇氧化反應動力學；以及陰極催化劑層內的氧還原和甲醇氧化反應動力學。
  19. Abstract : metal aluminium film em failure mechanism has been studied under pulsed stress, and the metal aluminium em reliability under pure ac stress has been discussed, a detailed spec - ification has been made about relative factor affecting test structures

    摘要：對脈沖應力作用下金屬鋁膜的電遷移失效機理進行了研究，研究了純交流應力對金屬鋁膜電遷移可靠性的影響，對影響測試結構的相關因素作了詳細的描述。
  20. Based on the detailed investigation on the correlative fields of home and abroad, it was considered that the noises could be theoretically used to study the electromigration phenomenon

    基於對國內外相關技術發展動態與現狀的研究與分析，完成了金屬薄膜的電遷移微弱噪聲信號測試系統的設計，並實現了數據的自動採集與處理。
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